Paper
RSC Advances
methoxyethanol). The substrate was annealed on a hot plate at
200 C for 30 min. An active layer was cast on top of the ZnO
9 L. Lu, M. A. Kelly, W. You and L. Yu, Nat. Photonics, 2015, 9,
491.
ꢂ
layer in a nitrogen glove box by spin-coating. An anode con- 10 T. Kumari, S. M. Lee, S.-H. Kang, S. Chen and C. Yang, Energy
sisting of 10 nm MoOx and 100 nm Ag layers was sequentially Environ. Sci., 2017, 10, 258.
deposited on top of the active layers, through a shadow mask, by 11 N. E. Jackson, K. L. Kohlstedt, B. M. Savoie, M. O. de la Cruz,
thermal evaporation in a vacuum chamber. The resulting device
conguration was an ITO (120–160 nm)/ZnO (30 nm)/active
G. C. Schatz, L. X. Chen and M. A. Ratner, J. Am. Chem. Soc.,
2015, 137, 6254.
layer/MoOx (10 nm)/Ag (100 nm) with an active area of 7.1 12 S. Yoshikawa, A. Saeki, M. Saito, I. Osaka and S. Seki, Phys.
mm2. Current density–voltage curves were measured using
Chem. Chem. Phys., 2015, 17, 17778.
a source-measure unit (ADCMT Corp., 6241A) under AM 1.5 G 13 C. J. Mueller, E. Gann, C. R. Singh, M. Thelakkat and
solar illumination at 100 mW cmꢁ2 (1 sun, monitored by
C. R. McNeill, Chem. Mater., 2016, 28, 7088.
a calibrated standard cell, Bunko Keiki SM-250KD) from 14 I. Osaka and K. Takimiya, Adv. Mater., 2017, 29, 1605218.
a 300 W solar simulator (SAN-EI Corp., XES-301S). The EQE 15 J. C. Bijleveld, A. P. Zoombelt, S. G. J. Mathijssen,
spectra were measured by a Bunko Keiki model BS-520BK
equipped with a Keithley model 2401 source meter. The mon-
M. M. Wienk, M. Turbiez, D. M. de Leeuw and
R. A. J. Janssen, J. Am. Chem. Soc., 2009, 131, 16616.
ochromated light power was calibrated by a silicon photovoltaic 16 A. T. Yiu, P. M. Beaujuge, O. P. Lee, C. H. Woo, M. F. Toney
´
cell, Bunko Keiki model S1337-1010BQ.
and J. M. J. Frechet, J. Am. Chem. Soc., 2012, 134, 2180.
17 J. W. Jung, F. Liu, T. P. Russell and W. H. Jo, Energy Environ.
Sci., 2012, 5, 6857.
Space-charge-limited current (SCLC)
18 C. B. Nielsen, M. Turbiez and I. McCulloch, Adv. Mater.,
2013, 25, 1859.
19 W. Li, K. H. Hendriks, A. Furlan, W. S. C. Roelofs,
M. M. Wienk and R. A. J. Janssen, J. Am. Chem. Soc., 2013,
135, 18942.
20 J.-H. Kim, M. Lee, H. Yang and D.-H. Hwang, J. Mater. Chem.
A, 2014, 2, 6348.
21 Y. Ji, C. Xiao, Q. Wang, J. Zhang, C. Li, Y. Wu, Z. Wei, X. Zhan,
W. Hu, Z. Wang, R. A. J. Janssen and W. Li, Adv. Mater., 2016,
28, 943.
The SCLC device structures consisted of an ITO/PEDOT:PSS/
active layer (100–200 nm)/Au for the hole, and Al/active layer
(ꢀ200 nm)/LiF/Al for the electron. The other procedures are
similar to those of the OPV device. The mobility was determined
by tting a current density–voltage curve into the Mott–Gurney
law, J ¼ 9303rmV2(8L3)ꢁ1, where 30 is the permittivity of free
space, 3r is the dielectric constant of the material, m is the
mobility, V is the voltage drop across the device, and L is the
thickness of the active layer.
22 W. Li, K. H. Hendriks, M. M. Wienk and R. A. J. Janssen, Acc.
Chem. Res., 2016, 49, 78.
23 G. B. Yoon, H.-Y. Kwon, S.-H. Jung, J.-K. Lee and J. Lee, ACS
Appl. Mater. Interfaces, 2017, 9, 39502.
Conflicts of interest
There are no conicts to declare.
24 P. Sonar, H.-S. Tan, S. Sun, Y. M. Lam and A. Dodabalapur,
Polym. Chem., 2013, 4, 1983.
Acknowledgements
25 T. Lei, J.-Y. Wang and J. Pei, Acc. Chem. Res., 2014, 47, 1117.
26 R. Stalder, J. Mei, K. R. Graham, L. A. Estrada and
J. R. Reynolds, Chem. Mater., 2014, 26, 664.
27 C.-C. Ho, C.-A. Chen, C.-Y. Chang, S. B. Darling and W.-F. Su,
J. Mater. Chem. A, 2014, 2, 8026.
This work was supported by the Japan Society for the Promotion
of Science (JSPS) KAKENHI Grant-in-Aid for Scientic Research
(A) (Grant No. JP16H02285) and the PRESTO program (Grant
No. JPMJPR15N6) from the JST of Japan.
28 Z. Ma, D. Dang, Z. Tang, D. Gedefaw, J. Bergqvist, W. Zhu,
¨
W. Mammo, M. R. Andersson, O. Inganas, F. Zhang and
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RSC Adv., 2018, 8, 30201–30206 | 30205