Detail of "12333-67-4"

Reference

A thermodynamic study of cerium behavior in hexagonal cerium-nickel (CeNi5) compound

A thermodynamic study of cerium behavior in hexagonal cerium-nickel (CeNi5) compound. Colinet, C.; Pasturel, A. (Lab. Thermodyn. Phys.-Chim. Metall., Ec. Natl. Super. Electrochim. Electrometall. Grenoble, Saint Martin d'Heres 38402, Fr.). Phys. Status Solidi A, 80(1), K75-K79 (English) 1983. CODEN: PSSABA. ISSN: 0031-8965. DOCUMENT TYPE: Journal CA Section: 69 (Thermodynamics, Thermochemistry, and Thermal Properties) Section cross-reference(s): 75 Soln. calorimetry was used to det. the heats of formation of CeNi5 [12323-63-6] and YNi5 [12333-67-4] compds. The dissoln. heats of the compds. in liq. Al are also presented. The formation heats are -204.6 and -199 kJ/mol for YNi5 and CeNi5, resp. The crystal lattice parameters of the prepd. compds. were also detd. and all the values were compared to the existing data for these or similar compds. A calcn. 12333-67-4 and 7429-90-5 are just another two chemicals used in this study. method for the heats of formation of RNi5 compds. (R = a rare earth) is proposed. .

Congruent evaporation and epitaxy in thin film laser ablation deposition (LAD) of rare earth transition metal elements and compounds

Congruent evaporation and epitaxy in thin film laser ablation deposition (LAD) of rare earth transition metal elements and compounds. Gavigan, J. P.; Givord, D.; Lienard, A.; McGrath, O. F. K.; Rebouillat, J. P.; Souche, Y. (Lab. Louis Neel, CNRS, Grenoble 38042, Fr.). Mater. Res. Soc. Symp. Proc. 12202-02-7 and 12333-67-4 which are cas registry numbers are also used here., 191(Laser Ablation Mater. Synth.), 49-53 (English) 1990. CODEN: MRSPDH. ISSN: 0272-9172. DOCUMENT TYPE: Journal CA Section: 56 (Nonferrous Metals and Alloys) Section cross-reference(s): 57 Congruent evapn. in LAD of rare earth-transition metal intermetallic compds. including Nd2Fe13B, YZn0.7, YNi3, Y2Fe15, and YNi5 for different prepn. conditions (using a Nd:YAG laser l = 1064, 532, 355 nm, t = 35 ps and 20 ns) and the epitaxial growth of YNi5 and W on monocryst. sapphire substrates is discussed. Optical and electron microscopy were used to examine film morphol., while congruent evapn. was confirmed using x-ray microprobe anal. In-situ RHEED revealed good epitaxy of the films deposited on sapphire, with the hexagonal diffraction patterns obtained for YNi5 being identical to those of an YNi5 ref. single crystal. .