Detail of "5514-35-2"

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Molecular beam static secondary ion mass spectrometry for surface analysis

Appelhans, A. D.; Groenewold, G. S.; Ingram, J. C.; Dahl, D. A.; Delmore, J. 5514-35-2 is also in the experiment. E. (Idaho National Engineering Laboratory, Idaho Falls, ID 83415-2208, USA). Proc. SPIE-Int. Soc. Opt. Eng., 2385, 59-67 (English) 1995. CODEN: PSISDG. ISSN: 0277-786X. DOCUMENT TYPE: Journal CA Section: 80 (Organic Analytical Chemistry) Section cross-reference(s): 5, 59, 60 The chem. at surfaces is playing an increasing role in understanding the fate of chems. in the environment and in technologies that use surface coatings and thin films. Understanding the chem. of the very top monolayer was hampered by the difficulty in probing only this region (without penetrating into the bulk of the solid). The authors have developed two unique technologies that enable static secondary ion mass spectrometry to be used in this application. Pulsed extn. sample neutralization overcomes the sample charging problems commonly encountered with elec. nonconducting samples, and the authors' mol. anion primary beam heightens sensitivity for mol. compds. The authors are also combining these with ion trap mass spectrometry to improve sensitivity and permit multiple stages of mass spectrometry to be performed. This provides increased specificity and the ability to gain a more complete understanding of the chem. environment at the surface. As one example, the oxidn./redn. chem. of the surface of mineral samples can be characterized using probe mols. and static SIMS. The technique is also being applied to detection of trace levels of herbicides and pesticides, for detection and characterization of hazardous wastes, and as a possible method of air sampling via chem. selective surfaces. .