Atomic Force Microscopy

Name:
Atomic Force Microscopy
Detailed information:
A technique similar to scanning tunneling microscopy employing an instrument that uses a sharply tipped electrode in close proximity to a surface. As the electrode is moved, the change in electrode signal relates to the shape of the surface being scanned.

Use:

Study of atomic-scale structure of surfaces, transport of atoms and molecules.

See: Scanning Tunneling Microscope; Chemical Force Microscopy.