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13709-61-0

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13709-61-0 Usage

General Description

Xenon tetrafluoride is a chemical compound composed of one xenon atom and four fluorine atoms, with the chemical formula XeF4. It is a colorless, crystalline solid that is highly reactive and can undergo violent reactions when in contact with water, organic materials, or reducing agents. Xenon tetrafluoride is primarily used as a powerful fluorinating agent in organic synthesis and in the production of other fluorine compounds. It also has applications in the semiconductor industry and as an etchant for silicon and silicon dioxide. Due to its reactivity and potential health hazards, xenon tetrafluoride should be handled with caution and appropriate safety measures.

Check Digit Verification of cas no

The CAS Registry Mumber 13709-61-0 includes 8 digits separated into 3 groups by hyphens. The first part of the number,starting from the left, has 5 digits, 1,3,7,0 and 9 respectively; the second part has 2 digits, 6 and 1 respectively.
Calculate Digit Verification of CAS Registry Number 13709-61:
(7*1)+(6*3)+(5*7)+(4*0)+(3*9)+(2*6)+(1*1)=100
100 % 10 = 0
So 13709-61-0 is a valid CAS Registry Number.

13709-61-0SDS

SAFETY DATA SHEETS

According to Globally Harmonized System of Classification and Labelling of Chemicals (GHS) - Sixth revised edition

Version: 1.0

Creation Date: Aug 19, 2017

Revision Date: Aug 19, 2017

1.Identification

1.1 GHS Product identifier

Product name tetrafluoroxenon

1.2 Other means of identification

Product number -
Other names Xenon tetrafluoride

1.3 Recommended use of the chemical and restrictions on use

Identified uses For industry use only.
Uses advised against no data available

1.4 Supplier's details

1.5 Emergency phone number

Emergency phone number -
Service hours Monday to Friday, 9am-5pm (Standard time zone: UTC/GMT +8 hours).

More Details:13709-61-0 SDS

13709-61-0Relevant articles and documents

Crystal Structures of Photochemically Prepared (Xe2F11)2(MF6) (M = Sn, Pb) and (XeF5)4(Sn5F24) Containing Six- and Seven-Coordinated Tin(IV)

Mazej, Zoran,Goreshnik, Evgeny

, p. 1265 - 1272 (2019)

Single crystals of [Xe2F11]2[SnF6], [Xe2F11]2[PbF6], and [XeF5]4[Sn5F24] were grown from saturated aHF solutions upon crystallizations. The crystal structures of isotypic [Xe2F11]2[SnF6] and [Xe2F11]2[PbF6] consist of [Xe2F11]+ cations and [MF6]2– anions (M = Sn, Pb) that interact by means of fluorine bridge contacts. The single crystal structure determination of [XeF5]4[Sn5F24] reveals that it is built of two-dimensional ([Sn5F24]4–)∞ grids and [XeF5]+ cations located between them. The 2D grids have a wave-like conformation. The ([Sn5F24]4–)∞ layer contains, both, six- and seven-coordinated Sn(IV) interconnected by bridging fluorine atoms. The coordination of Sn(IV) by seven fluorine atoms is unprecedented. Attempts to synthesize and grow single crystals of the [XeF5][MF5] (M = Zr, Hf, Ni, Pd) compounds failed.

Templeton, D. H.,Zalkin, A.,Forrester, J. D.,Williamson, S. M.

, p. 242 - 242 (1963)

Largest perfluorometallate [Ti10F45]5- oligomer and polymeric ([Ti3F13]-)∞ and ([TiF5]-)∞ anions prepared as [XeF5]+ salts

Mazej, Zoran,Goreshnik, Evgeny A.

, p. 7320 - 7325 (2016/09/12)

Reactions between XeF2, TiF4 and UV-irradiated elemental F2 in anhydrous HF yielded XeF5TiF5 (XeF6·TiF4), [XeF5]5[Ti10F45] (XeF6·2TiF4), and [XeF5][Ti3F13] (XeF6·3TiF4) upon crystallization. [XeF5]5[Ti10F45] crystallizes in two crystal modifications at low (α-phase, 150 K) and ambient (β-phase, 296 K) temperatures. The crystal structure determination of [XeF5]5[Ti10F45] reveals the largest known discrete decameric [Ti10F45]5- anion built from ten TiF6 octahedra, sharing vertices, in the shape of a double-star. [XeF5]+ cations are completely ordered in the α-phase, while one of three crystallographically unique [XeF5]+ cations is two-fold disordered in the β-phase. The anionic part of [XeF5][Ti3F13] is built from tetrameric Ti4F20 and octameric Ti8F36 units sharing vertices and alternatively linked into ([Ti3F13]-)∞ columns. The charge balance is maintained by [XeF5]+ cations which form secondary Xe?F contacts with fluorine atoms of ([Ti3F13]-)∞ groups. The main structural feature of XeF5TiF5 is an infinite chain of distorted TiF6 octahedra joined by cis vertices.

Infrared spectroscopic observation of the radical XeF3 generated in solid argon

Misochko, Eugenii Ya,Akimov, Alexander V.,Belov, Vasilii A.,Tyurin, Daniil A.

, p. 8723 - 8728 (2009/12/08)

Xenon trifluoride radicals were generated by the solid-state chemical reaction of mobile fluorine atoms with XeF2 molecules isolated in a solid argon matrix. On the basis of spectroscopic and kinetic FTIR measurements and performed quantum chem

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