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1,1-difluoro-2-oxo-2-(4-vinylphenylamino)-1-ethanesulfonyl fluoride is a chemical with a specific purpose. Lookchem provides you with multiple data and supplier information of this chemical.

1402074-25-2

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1402074-25-2 Usage

Check Digit Verification of cas no

The CAS Registry Mumber 1402074-25-2 includes 10 digits separated into 3 groups by hyphens. The first part of the number,starting from the left, has 7 digits, 1,4,0,2,0,7 and 4 respectively; the second part has 2 digits, 2 and 5 respectively.
Calculate Digit Verification of CAS Registry Number 1402074-25:
(9*1)+(8*4)+(7*0)+(6*2)+(5*0)+(4*7)+(3*4)+(2*2)+(1*5)=102
102 % 10 = 2
So 1402074-25-2 is a valid CAS Registry Number.

1402074-25-2Downstream Products

1402074-25-2Relevant academic research and scientific papers

NON-IONIC ARYL KETONE BASED POLYMERIC PHOTO-ACID GENERATORS

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Paragraph 0362-0363, (2018/03/25)

Non-ionic photo-acid generating (PAG) polymerizable monomers were prepared that contain a side chain sulfonate ester of an alpha-hydroxy aryl ketone. The aryl ketone group has a perfluorinated substituent alpha to the ketone carbonyl. The sulfur of the sulfonate ester is also directly linked to a fluorinated group. PAG polymers prepared from the PAG monomers release a strong sulfonic acid when exposed to high energy radiation such as deep UV or extreme UV light. The photo-generated sulfonic acid has a low diffusion rate in an exposed resist layer subjected to a post-exposure bake (PEB) at 100° C. to 150° C., resulting in formation of good line patterns after development.

Non-ionic photo-acid generating polymers for resist applications

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, (2016/02/15)

Photo-acid generating vinyl polymerizable monomers (PAG monomers) were prepared comprising sulfonate ester groups of N-hydroxide imides. The photo-acid generating portion of the PAG monomer is linked to a polymerizable portion of the monomer by an amide linking group. Photo-acid generating polymers (PAG polymers) of the PAG monomers show high sensitivity to extreme ultraviolet radiation (13.5 nm) and much less sensitivity to far ultraviolet wavelengths (193 nm, 248 nm). The PAG polymers also exhibit thermal and chemical amplification properties useful for forming high resolution positive tone or negative tone lithographic resist patterns.

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