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807261-54-7

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807261-54-7 Usage

Check Digit Verification of cas no

The CAS Registry Mumber 807261-54-7 includes 9 digits separated into 3 groups by hyphens. The first part of the number,starting from the left, has 6 digits, 8,0,7,2,6 and 1 respectively; the second part has 2 digits, 5 and 4 respectively.
Calculate Digit Verification of CAS Registry Number 807261-54:
(8*8)+(7*0)+(6*7)+(5*2)+(4*6)+(3*1)+(2*5)+(1*4)=157
157 % 10 = 7
So 807261-54-7 is a valid CAS Registry Number.

807261-54-7Downstream Products

807261-54-7Relevant academic research and scientific papers

Experimental and theoretical investigation of electron attachment to S F5 Cl

Doren, Jane M. Van,Miller, Thomas M.,Viggiano, Albert A.,Spanel, Patrik,Smith, David,et al.

, p. 1 - 8 (2009/02/07)

Thermal electron attachment to S F5 Cl has been studied with the flowingafterglow Langmuir probe technique. The rate coefficient is moderate, 4 .8 (±1.2) × 10-8 cm3 s-1, and invariant with temperature over the temperature range of 300-550 K. The reaction is dissociative, forming mainly S F5- +Cl. Minor yields of Cl- and F Cl- were also found. The yields of the minor channels increase slightly with temperature. Statistical unimolecular rate modeling is employed to elucidate the characterof the dissociation pathways and to support the assumption that the dis sociations involve the formation of metastable anionic S F5 Cl-.

Associative and dissociative electron attachment by SF6 and SF5Cl

Fenzlaff, Marita,Gerhard, Rolf,Illenberger, Eugen

, p. 149 - 155 (2007/10/02)

Electron attachment by SF6 and SF5Cl in the energy range 0-20 eV has been studied in a beam experiment at room temperature.At low energies ( ca. 0 eV) electron attachment to SF6 yields the well known parent anion SF6-* (associative attachment) and SF5- (dissociative attachment), while other negative ion fragments (F-, F2-, SF2-, SF3-, and SF4-) are generated with comparably low cross sections from various resonances at higher energies.In contrast to that, negative ion formation in SF5Cl is dominated by dissociative channels (F-, Cl-, FCl-, and SF5-) and only a weak SF5Cl- signal is observed.A time-of-flight analysis of the ionic fragments reveals that the decomposition of all resonances is characterized by a low translational excess energy relase indicating effective energy randomization in the parent ion prior to dissociation.The present results are compared with negative ion formation in halogenated hydrocarbons.

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