[PhB(CH₂PPh₂)3Ag(triethylphosphine)]

Base Information

Chemical Name:[PhB(CH₂PPh₂)3Ag(triethylphosphine)]
CAS No.:1016231-28-9
Molecular Formula:C₅₁H₅₆AgBP₄
Molecular Weight:911.58
Hs Code.:

[PhB(CH<sub>2</sub>PPh<sub>2</sub>)3Ag(triethylphosphine)]

Synonyms:[PhB(CH₂PPh₂)3Ag(triethylphosphine)]

Suppliers and Price of [PhB(CH₂PPh₂)3Ag(triethylphosphine)]

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Business phase:: The product has achieved commercial mass production^*data from LookChem market partment

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Chemical Property of [PhB(CH₂PPh₂)3Ag(triethylphosphine)]

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Technology Process of [PhB(CH₂PPh₂)3Ag(triethylphosphine)]

There total 1 articles about [PhB(CH₂PPh₂)3Ag(triethylphosphine)] which guide to synthetic route it. The literature collected by LookChem mainly comes from the sharing of users and the free literature resources found by Internet computing technology. We keep the original model of the professional version of literature to make it easier and faster for users to retrieve and use. At the same time, we analyze and calculate the most feasible synthesis route with the highest yield for your reference as below:

synthetic route:

Reference yield: 83.0%

: silver(I) chloride

: 251460-45-4
Tris(diphenylphosphinomethyl)phenylborate

: 554-70-1
triethylphosphine

: 1016231-28-9
[PhB(CH₂PPh₂)3Ag(triethylphosphine)]

Guidance literature:: In tetrahydrofuran; byproducts: TMEDA; under N2; AgCl ground to fine powder; added to B compd.; covered with Alfoil; cooled to -78°C (acetone-dry ice bath); THF added; PEt3 ad ded; stirred for 30 min; warmed to room temp. with stirring; filtered; solvent removed from filtrate in vac.; washed with pentane with stirring; dissolved in toluene; filtered; solvent removed from filtrate in vac.; elem. anal.;
DOI:10.1021/ic701852x

Reference yield:

: 1016231-28-9
[PhB(CH₂PPh₂)3Ag(triethylphosphine)]

: 7440-22-4
silver

Guidance literature:: In neat (no solvent); under Ar; soln. of Ag complex in THF nebulized; deposited on substrate (glass, or Mg, or 52100 steel) at 300°C; Ag film grown on the substrate; detd. by X-ray powder diffraction and X-ray photoelectron spectroscopy;
DOI:10.1021/ic701852x