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12233-73-7

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12233-73-7 Usage

Check Digit Verification of cas no

The CAS Registry Mumber 12233-73-7 includes 8 digits separated into 3 groups by hyphens. The first part of the number,starting from the left, has 5 digits, 1,2,2,3 and 3 respectively; the second part has 2 digits, 7 and 3 respectively.
Calculate Digit Verification of CAS Registry Number 12233-73:
(7*1)+(6*2)+(5*2)+(4*3)+(3*3)+(2*7)+(1*3)=67
67 % 10 = 7
So 12233-73-7 is a valid CAS Registry Number.
InChI:InChI=1/2Bi.2Ge.7O/q2*+3;2*+4;7*-2

12233-73-7SDS

SAFETY DATA SHEETS

According to Globally Harmonized System of Classification and Labelling of Chemicals (GHS) - Sixth revised edition

Version: 1.0

Creation Date: Aug 20, 2017

Revision Date: Aug 20, 2017

1.Identification

1.1 GHS Product identifier

Product name dibismuth,germanium,oxygen(2-)

1.2 Other means of identification

Product number -
Other names Bismuth germanate

1.3 Recommended use of the chemical and restrictions on use

Identified uses For industry use only.
Uses advised against no data available

1.4 Supplier's details

1.5 Emergency phone number

Emergency phone number -
Service hours Monday to Friday, 9am-5pm (Standard time zone: UTC/GMT +8 hours).

More Details:12233-73-7 SDS

12233-73-7Upstream product

12233-73-7Downstream Products

12233-73-7Relevant articles and documents

Positron-annihilation monitoring of reduction processes in conducting glasses

Pliszka, Damian,Kusz, Bogus?aw,Gazda, Maria,Trzebiatowski, Konrad,Karwasz, Grzegorz P.,Brusa, Roberto S.,Zecca, Antonio

, p. 257 - 263 (2004)

Depth-resolved, Doppler-broadening positron spectroscopy has been used to study structural properties of semiconducting glasses. Bismuth- and lead-doped, silica and germanium glasses with five different compositions were studied. Conducting surface layers in these glasses were obtained by reduction in hydrogen atmosphere. Depth scanning with a slow-positron beam allows to follow the temperature and time evolution of layers modified during reduction processes. However, while reduction processes in inner layers (below a few tens of nm) are clearly seen in changes of the Doppler-broadened positron- annihilation line, the near-to-surface changes are more complex and not fully understood. We prove that the positron spectroscopy can help in optimising technological questions of reduction processes.

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