12233-73-7Relevant articles and documents
Positron-annihilation monitoring of reduction processes in conducting glasses
Pliszka, Damian,Kusz, Bogus?aw,Gazda, Maria,Trzebiatowski, Konrad,Karwasz, Grzegorz P.,Brusa, Roberto S.,Zecca, Antonio
, p. 257 - 263 (2004)
Depth-resolved, Doppler-broadening positron spectroscopy has been used to study structural properties of semiconducting glasses. Bismuth- and lead-doped, silica and germanium glasses with five different compositions were studied. Conducting surface layers in these glasses were obtained by reduction in hydrogen atmosphere. Depth scanning with a slow-positron beam allows to follow the temperature and time evolution of layers modified during reduction processes. However, while reduction processes in inner layers (below a few tens of nm) are clearly seen in changes of the Doppler-broadened positron- annihilation line, the near-to-surface changes are more complex and not fully understood. We prove that the positron spectroscopy can help in optimising technological questions of reduction processes.