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3-Pentanone, 2,4-dimethyl-2-[(4-methylphenyl)sulfonyl]- is a chemical with a specific purpose. Lookchem provides you with multiple data and supplier information of this chemical.

56817-85-7

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56817-85-7 Usage

Check Digit Verification of cas no

The CAS Registry Mumber 56817-85-7 includes 8 digits separated into 3 groups by hyphens. The first part of the number,starting from the left, has 5 digits, 5,6,8,1 and 7 respectively; the second part has 2 digits, 8 and 5 respectively.
Calculate Digit Verification of CAS Registry Number 56817-85:
(7*5)+(6*6)+(5*8)+(4*1)+(3*7)+(2*8)+(1*5)=157
157 % 10 = 7
So 56817-85-7 is a valid CAS Registry Number.

56817-85-7SDS

SAFETY DATA SHEETS

According to Globally Harmonized System of Classification and Labelling of Chemicals (GHS) - Sixth revised edition

Version: 1.0

Creation Date: Aug 19, 2017

Revision Date: Aug 19, 2017

1.Identification

1.1 GHS Product identifier

Product name 2,4-dimethyl-2-(4-methylphenyl)sulfonylpentan-3-one

1.2 Other means of identification

Product number -
Other names -

1.3 Recommended use of the chemical and restrictions on use

Identified uses For industry use only.
Uses advised against no data available

1.4 Supplier's details

1.5 Emergency phone number

Emergency phone number -
Service hours Monday to Friday, 9am-5pm (Standard time zone: UTC/GMT +8 hours).

More Details:56817-85-7 SDS

56817-85-7Downstream Products

56817-85-7Relevant academic research and scientific papers

POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS

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, (2010/04/23)

A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid and (B) an acid generator. The resin (A) is a polymer comprising recurring units containing a non-leaving hydroxyl group represented by formula (1) wherein R1 is H, methyl or trifluoromethyl, X is a single bond or methylene, m is 1 or 2, and the hydroxyl group attaches to a secondary carbon atom. The composition is improved in resolution when processed by lithography.

Nitrogen-containing organic compound, resist composition and patterning process

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, (2008/06/13)

Resist compositions comprising nitrogen-containing organic compounds having a benzimidazole structure and a specific ether chain moiety have an excellent resolution, form precisely configured patterns with minimized roughness of sidewalls and are useful in microfabrication using electron beams or deep-UV light.

Sulfonates, polymers, resist compositions and patterning process

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, (2008/06/13)

A sulfonate compound having formula (1) is novel wherein R1 to R3 are H, F or C1-20 alkyl or fluoroalkyl, at least one of R1 to R3 contains F. A polymer comprising units derived from the sulfonate compound is used as a base resin to formulate a resist composition which is sensitive to high-energy radiation, maintains high transparency at a wavelength of up to 200 nm, and has improved alkali dissolution contrast and plasma etching resistance

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