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4-Nitrophenyl(phenyl)iodonium tosylate is a chemical compound with the formula C12H8IN2O4S. It is a type of iodonium salt, which is a class of compounds containing a positively charged iodine atom. This particular compound is characterized by the presence of a 4-nitrophenyl group and a phenyl group attached to the iodine, with a tosylate (tosyl) group as the counterion. It is often used as a reagent in organic synthesis, particularly in the formation of carbon-carbon bonds through a process known as the iodine(III)-mediated coupling reaction. The tosylate group plays a role in stabilizing the iodonium ion and facilitating the reaction. Due to its reactivity and the potential hazards associated with handling, it is important to use 4-nitrophenyl(phenyl)iodonium tosylate with appropriate safety measures in place.

747-25-1

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747-25-1 Usage

Check Digit Verification of cas no

The CAS Registry Mumber 747-25-1 includes 6 digits separated into 3 groups by hyphens. The first part of the number,starting from the left, has 3 digits, 7,4 and 7 respectively; the second part has 2 digits, 2 and 5 respectively.
Calculate Digit Verification of CAS Registry Number 747-25:
(5*7)+(4*4)+(3*7)+(2*2)+(1*5)=81
81 % 10 = 1
So 747-25-1 is a valid CAS Registry Number.

747-25-1Upstream product

747-25-1Relevant academic research and scientific papers

Novel anthracene derivative and radiation-sensitive resin composition

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, (2008/06/13)

A novel anthracene derivative useful as an additive to a radiation-sensitive resin composition is disclosed. The anthracene derivative has the following formula (1), wherein R1 groups individually represent a hydroxyl group or a monovalent organic group having 1-20 carbon atoms, n is an integer of 0-9, X is a single bond or a divalent organic group having 1-12 carbon atoms, and R2 represents a monovalent acid-dissociable group. The radiation-sensitive resin composition comprises the anthracene derivative of the formula (1), a resin insoluble or scarcely soluble in alkali, but becomes alkali soluble in the presence of an acid, and a photoacid generator. The composition is useful as a chemically-amplified resist for microfabrication utilizing deep ultraviolet rays, typified by a KrF excimer laser and ArF excimer laser.

Novel carbazole derivative and chemically amplified radiation-sensitive resin composition

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, (2008/06/13)

A carbazole derivative of the following formula (1), wherein R1 and R2 individually represent a hydrogen atom or a monovalent organic group, or R1 and R2 form, together with the carbon atom to which R1 and R2 bond, a divalent organic group having a 3-8 member carbocyclic structure or a 3-8 member heterocyclic structure, and R3 represents a hydrogen atom or a monovalent organic group. The carbazole derivative is suitable as an additive for increasing sensitivity of a chemically amplified resist. A chemically amplified radiation-sensitive resin composition, useful as a chemically amplified resist, comprising the carbazole derivative is also disclosed.

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