High-Pressure Bridgman Grown
CdZnTe for Electro-Optic Applications
747
where G is the photoexcitation rate, tc is the effective
carrier lifetime, a is the absorption coefficient, and P
is the optical power.12 Experimental results of Figs. 2
and 3 can be explained by using the expression for the
relaxation frequency, n = (s/e), together with Eqs. 4
and 5. In general, the higher the photo-conductivity
fromintragaplevelsthestrongertheshieldingeffect.9
From Eq. 5, this corresponds to increasing the beam
power and optical absorption. In principle, then, one
could expect the auto-inhibition in Cd0.9Zn0.9Te at
l = 1.5 mm to be stronger than in CdTe:In, due to
higher absorption coefficient. Actually, the opposite
occurs. This can be explained, by taking into account
the role of the carrier recombination time, tc. This, in
turn, is affected by the concentration and nature of
the intragap defect centers. In particular, the differ-
ent shielding effects in the two materials can be
explained by admittingtc in Cd0.9Zn0.9Te to be reduced
by the presence of a fast recombination center.4,13
Nevertheless, at quasi-cw regimes the penalty in
Pockelsfigureofmeritbecomesconsiderable,asshown
in Fig. 2a, and worsen with beam power. However, as
shown in Fig. 2b, by increasing the modulating peak
voltage, the effect of the counter-field is progressively
reduced, until M eventually saturates at the nominal
inhibition effect, due to the photo-generation of carri-
ers consequent to near-infrared absorption, is re-
duced with respect to the binary CdTe:In resulting in
lower actual half-wave voltage at low modulating
frequencies. For these reasons, the ternary alloy is
particularly suitable for implementing EO devices to
be used as basic building blocks of spatial switching
matrices in optical communication network architec-
tures.
ACKNOWLEDGEMENT
The authors thank Dr. A. Baraldi and Prof. R.
Capelletti, both of Istituto Nazionale Fisica della
Materia (INFM) and Physics Dept. of University of
Parma (Italy), for IR absorption spectrum measure-
ments.
REFERENCES
1. J.E. Kiefer, T.H. Nussmeier, and F.E. Goodwin, IEEE J.
Quant. Electron. QE-8, 173 (1972).
2. W.H.Steier,J.Kumar,andM.Ziari,Opt.Lett.14,224(1989).
3. S.M. Pietralunga, P. Boffi, and M. Martinelli, J. Nonlin. Opt.
Phys. Mater. 5, 587 (1996).
4. A. Zappettini, L. Cerati, A. Milani, S.M. Pietralunga, and M.
Martinelli, J. Cryst. Growth 214/215, 866 (2000).
5. E. Raiskin and J.F. Butler, IEEE Trans. Nucl. Sci. 35, 81
(1988); F.P. Doty and J. F. Butler, J. Vac. Sci. Technol. B 10,
1418 (1992); I. Kikuma, A. Kikuchi, M. Yageta, M. Sekine,
and M. Furukoshi, J. Cryst. Growth 98, 302 (1989).
6. S.M. Johnson, S. Sen, W. Konkel, and M.H. Kalisher, J. Vac.
Sci. Technol. B 9, 1897 (1991).
7. S. AdachiandT. Kimura, Jpn. J. Appl. Phys. 32, 3866(1993).
8. W. Stadler, D.M. Hoffmann, H.C. Alt, T. Muschik, B.K.
Meyer, E. Weigel, G. Mueller-Vogt, M. Salk, E. Rupp, and
K.W. Benz, Phys. Rev. B 51, 10619 (1995); A. Castaldini, A.
Cavallini, B. Fraboni, L. Polenta, P. Fernandez, and J.
Piqueras, Phys. Rev. B 54, 7622 (1996); C. Szeles, Y.Y. Shan,
K.G. Lynn, and E.E. Eissler, Nucl. Instr. Meth. Phys. Res. A
380, 148, (1996).
3
n0r41
unclamped value
. The saturating voltage is
lowerthanVp,sothatfullPockelsyieldcanbereached
when operating the modulator as a half-waveplate,
even at low frequency regimes and high
photoexcitation values. The phenomenon can be ex-
plained by admitting that, as the applied electric field
is increased, the carrier drift time is reduced and
charge collection at the electrodes becomes more
effective, resulting in depleting of space charge re-
gions and lowering of the shielding effect.9
9. A. Milani, E. Bocchi, A. Zappettii, S.M. Pietralunga, and M.
Martinelli,, J. Cryst. Growth 214/215, 913 (2000).
10. A.M. Bogomolov, L.N. Magdich, and V.N. Shmyglya, Sov. J.
Quant. Electron. 3, 125 (1973); Landolt-Bornstein, NS vol.
III/17; J.F. Stephany, J. Opt. Soc. Amer. 55, 136 (1965); H.
Ekstein, Phys. Rev. 66, 108 (1944).
11. I.P. Kaminow, IEEE J. Quant. Electron. QE-4, 23 ( 1968).
12. R.H. Bube, Photoelectronic Properties of Semiconductors
(Cambridge, U.K.: Cambridge University Press, 1992).
13. M. Hage-Ali, J.M. Koebel, P. Siffert, S. Hassan, A. Lusson, R.
Triboulet,G.Marracki,A.Zerrai,K.Cherkaoui,R.Adhiri,G.
Bremond,O.Kaitasov,andM.O.Ruault,J.Crestou,J.Cryst.
Growth 184/185, 1313 (1998).
CONCLUSION
Semi-insulating high-pressure Bridgman growth
Cd0.9Zn0.1Te bulk crystals have proven to be a reliable
basic materials to perform EO processing of signal
beams in the near-infrared range typical of optical
communications. In particular, Cd0.9Zn0.1Te-based
switches show constant performance on the whole
thirdcommunicationwindowaroundl = 1.5 mm,both
at high and low modulating frequencies. The auto-