Paper
Journal of Materials Chemistry C
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drop of acetic acid was added. After the mixture was stirred for
1 day, the resulting mixture was evaporated. The crude product
was chromatographed on silica gel (n-hexane : ethyl acetate =
2 : 1 as eluent) to afford N3-DMBI-H as a yellow solid (182.9 mg,
1
21.6%); m.p. 168–169 1C; H NMR (400 MHz, CDCl3) d 7.35 (d,
J = 8.5 Hz, 2H), 7.04 (d, J = 8.8 Hz, 8H), 7.04 (d, J = 9.0 Hz, 2H),
6.96 (d, J = 9.0 Hz, 4H), 6.86 (d, J = 9.0 Hz, 4H), 6.81 (d,
J = 8.8 Hz, 8H), 6.70 (m, 2H), 6.41 (m, 2H) 4.78 (s, 1H), 3.78 (s,
12H), 2.57 (s, 6H); 13C NMR (100 MHz, CD2Cl2): d 156.0, 149.7,
145.0, 142.6, 141.5 141.1, 131.0, 129.6, 126.3, 126.2, 122.5,
120.8, 119.3, 114.9, 105.8, 94.0, 55.9, 33.4; ESI HRMS: m/z calcd
for C55H51N5O4: 844.3857 [M ꢀ H]+; found 844.3845; elemental
analysis (%) calcd for C55H51N5O4: C, 78.08; H, 6.08; N, 8.28;
found: C, 77.87; H, 6.13; N, 8.13.
¨
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Fabrication and characterization of OFET devices
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Bottom-gate/top-contact (BG/TC) OFETs were constructed on
heavily doped n-type silicon wafers (o0.02 O cm; size 1.5 cm ꢂ
1.5 cm) covered with thermally grown SiO2 (200 nm), which
were cleaned by ultrasonication in EtOH, vapor degreasing, and
then treatment in an UV-ozone cleaner (Filgen UV253E) for
30 min. The undoped and doped PCBM solutions (0, 0.5, 2.0,
and 5.0 wt%) were drop-cast onto the substrates as active layers,
and then annealed at 100 1C for 10 h in order to activate
N3-DMBI-H molecules as precursors of n-type dopants. BG/TC
OFETs were completed by forming top-contact source-drain
electrodes (25 nm) by Au evaporation under vacuum (1 ꢂ 10ꢀ4 Pa)
using a shadow mask with L/W = 50/1000 mm. All the processes were
performed in an N2-filled glovebox. The electrical measurements of
the fabricated devices were conducted under vacuum (1 ꢂ 10ꢀ2 Pa)
using a Hewlett Packard HP4155 semiconductor parameter analyzer.
The surface morphology of the undoped and doped PCBM
thin films was observed by tapping mode AFM with an Innova
AFM (Bruker).
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Conflicts of interest
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B. Kippelen and A. Kahn, Appl. Phys. Lett., 2012, 101, 253303.
22 P. Wei, J. H. Oh, G. Dong and Z. Bao, J. Am. Chem. Soc., 2010,
132, 8852–8853.
23 N. Shintaku, M. Hiramoto and S. Izawa, J. Phys. Chem. C,
2018, 122, 5248–5253.
24 P. Wei, T. Menke, B. D. Naab, K. Leo, M. Riede and Z. Bao,
J. Am. Chem. Soc., 2012, 134, 3999–4002.
25 M. P. Hein, A. A. Zakhidov, B. Lu¨ssem, J. Janlowski, M. L.
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There are no conflicts to declare.
Acknowledgements
This work was supported by the Project of International Standards
Development on Energy Conservation of Ministry of Economy,
Trade, and Industry of Japan (METI). Numerical calculations were
partly performed at the Supercomputer System of Kyoto University
(Japan) and the Research Center for Computational Science in
Okazaki (Japan). M. U. thanks the JSPS Research Fellowship for
Young Scientists.
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Notes and references
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7, 6444–6450.
J. Mater. Chem. C
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