Structure, Properties, and Bonding of ZrTe
J. Am. Chem. Soc., Vol. 123, No. 18, 2001 4169
transition and the factors governing the relative stability of each
phase, as well as on a study of the structure-property relations.
Experimental Section
Preparation. Due to the air-sensitivity of the tellurides, they were
stored and handled under argon. The starting material ZrTe2 was
prepared from the elements (Te 99.999%, Fluka; Zr 99.8%, ChemPur,
nZr:nTe ) 1:2) in previously outgassed, sealed quartz glass tubes (1150
K, 1 d). Single crystals of ZrTe (MnP) were obtained through the
reduction of ZrTe2 with Zr (nZr:nTe ) 1:1; 1570 K, 3 d, I2) in a sealed,
argon-filled tantalum tube, which in turn was contained in an evacuated
corundum tube (P < 10-3 Pa). The temperature of the reaction mixture
was uniformly raised at 100 K h-1 to 1570 K, and lowered again at
150 K h-1 to room temperature. By means of energy dispersive analysis
of emitted X-rays (CamScan CS 4DV, EDX system, Noran Instruments;
30 kV, Zr-L, Te-L; detection limit: Be) no other elements than Zr and
Te were found.
DSC Investigations. Differential scanning calorimetry (DSC)
investigations were performed with the help of a SETARAM Setsys
16/18 with PtRh 6%/PtRh 30% thermocouples. The samples, 20-80
mg, were pressed into pellets (L 3.5 mm, 6.5 kN), and put in a
molybdenum crucible, which subsequently was sealed under an argon
atmosphere. The sample crucible, together with an empty reference
crucible, was placed on the DSC transducer. The furnace compartment
was evacuated (P < 1 Pa) and flooded with purified argon. This
procedure was repeated three times before a measurement was
conducted under a stream of purified argon. The heating rate used was
10 K min-1; cooling rates were 10-40 K min-1. No significant weight
changes of the molybdenum crucibles were detected. Reactions between
molybdenum and the specimens were not observed.
Figure 1. X-ray powder diffractogram (Cu KR, relative intensities vs
2θ) and a Rietveld profile fit for ZrTe (MnP). Measured (dots) and
calculated (line) intensities with a difference plot (bottom, 50%
expanded). In the middle are shown the positions of the Bragg angles
of ZrTe (MnP).
Table 1. Selected Crystallographic Data for ZrTe (MnP)
chemical formula
fw (g mol-1
space group
Z
ZrTe
218.824
orthorhombic, Pnma (No. 62)
4
)
a (pm)
b (pm)
739.15(15)
377.23(8)
694.34(14)
193.60(7)
7.507
19.90
0.0212; 0.0215
0.0519
The calibration of the DSC transducer was achieved with the
measurement of the temperature and heat of fusion of Au (ca. 10 mg;
99.99%, SETARAM) in open Mo crucibles. Au melts at 1337 K,
c (pm)
V (106 pm3)
F
calcd (g cm-3
)
∆
fusH01337 ) 12.55 kJ mol-1 19
. Only the heating peaks of the DSC
µ (mm-1
)
experiments were used for evaluation, both in calibration measurements
and in sample measurements.
R(Fo)a (Io > 2σ(Io)); R(Fo)
2
Rw(Fo )b
Powder X-ray Diffraction. Guinier X-ray powder diffraction was
used as a characterization method for phase identification. Guinier
photographs were obtained with a Huber Guinier System 600 employing
Cu KR1 radiation. Silicon20 was added to the samples as an internal
standard. Lattice parameters were determined from Guinier diffraction
data by least-squares refinement with use of the local program
DIFFRAKT.21 X-ray powder diffractograms were recorded in reflection
at ambient temperature on a Philips X’Pert MPD diffractometer with
Bragg-Brentano geometry, equipped with a diffracted-beam curved
graphite monochromator, using Cu KR radiation (40 kV, 40 mA).
Intensities were detected by means of a scintillation counter. An X-ray
powder diffraction pattern and a Rietveld profile fit for a ZrTe (MnP)
sample are shown in Figure 1.
goodness of fit
1.208
a R(Fo) ) ∑||Fo| - |Fc||/∑|Fo|. b w ) 1/[σ2(Fo ) + (0.0294P)2 +
2
0.5079P]; P ) (Fo + 2Fc2)/3.
2
The lattice parameters determined for the single crystal on the basis of
the positions of 3024 reflections and those from Guinier powder
diffraction data (38 reflections, a ) 738.09(8) pm, b ) 376.92(3) pm,
c ) 694.09(8) pm) are in fair agreement. No signs of a partial
occupation of the atomic sites were found.
Electrical Resistivity Measurements. The temperature dependence
of the electrical resistivity of ZrTe (MnP) was determined between 10
and 300 K on a cold-pressed powder sample (13.0 × 2.0 × 1.25; length
× width × thickness, mm) applying a four-probe dc method.24 The
sample was fixed on a mica plate which in turn was brought onto a
copper plate to ensure good thermal contact with the coldfinger of the
apparature. Contact wires of gold were attached to the sample with a
silver paste. To compensate for errors due to thermal stress, the
resistivity was measured by using both current directions (I ) 8 mA).
To check for hysteresis effects, the resistivity was measured upon
cooling as well as upon heating.
Magnetic Susceptibility Measurements. Magnetic susceptibility
measurements were carried out with the aid of a Quantum Design
MPMS SQUID magnetometer with a He cryostat. The data were
corrected for diamagnetism of sample holders and atom cores.25
Powdered samples of 100-200 mg of ZrTe (MnP) were loaded into
polytetrafluorethylene (KLF) sample holders in an Ar-filled glovebox.
Magnetization measurements were carried out between 1.8 and 330 K
in fields of 10 and 30 kG. The field dependence of the magnetization
was measured at 5 K.
Single-Crystal X-ray Diffraction. The selected, rectangularly
shaped crystals with a silver luster were mounted in argon-filled glass
capillaries. A data set of a suitable crystal was collected on an IPDS
diffractometer (Stoe) at room temperature. Data reduction was per-
formed with the IPDS-software, X-RED and X-SHAPE.22 The structure
was refined by using the program SHELXL-97.23 Selected data for the
single-crystal X-ray structure investigation of ZrTe (MnP) are given
in Table 1. Positional parameters and isotropic, equivalent temperature
factors, as well as anisotropic temperature factors, are given in Table
2. Selected interatomic distances may be found in Table 3. A numerical
absorption correction resulted in a significant improvement of the final
2
residual factors (before correction: R(Fo) ) 0.0248; Rw(Fo ) ) 0.0629).
(19) Lide, D. R., Ed. CRC Handbook of Chemistry and Physics, 76th
ed.; CRC Press: Boca Raton, FL, 1996.
(20) Deslattes, R. D.; Henins, A. Phys. ReV. Lett. 1976, 36, 898.
(21) Wagner, V.; Degen, T. DIFFRAKT (V1.0), a program for processing
X-ray powder data; Universita¨t Bonn, 1995.
(22) STOE & Cie: X-RED 1.07, Data reduction for STADI4 and IPDS;
X-SHAPE 1.01, Crystal optimisation for numerical absorption correction;
Darmstadt, 1996.
(23) Sheldrick, G. M. SHELXL-97, Program for the refinement of crystal
structures; Universita¨t Go¨ttingen, 1997.
(24) Crawford Dunlap, W., Jr. In Methods of experimental physics, Vol.
6, Part B: Solid-state physics; Horovitz, K. L., Johnson, V. A., Eds.;
Academic Press: New York, 1959; p 33.
(25) Weiss, A.; Witte, H. Magnetochemie; VCH: Weinheim, 1973; p
95.