C O M M U N I C A T I O N S
Figure 2. (a) Atomic force microscopy image of a patterned poly(4-
methoxystyrene) brush and (b) line profile across the image in (a).
surfaces to perform cationic polymerizations leading to new types
of nanoscale materials and controlled formation of precision
thickness brushes in nanoscale geometries such as gaps, pores, and
channels for a range of applications, and such work is underway
in our laboratories at this time.
Figure 1. Infrared reflection spectroscopy of (a) polymer brush and (b)
monomer 4-methoxystyrene.
Acknowledgment. We thank the National Science Foundation
for the financial support of this research (NIRT contract no. DMI02-
10229) and DARPA.
The last step was to grow polymer brushes using the anchored
initiator on the substrate by placing it in a reaction flask and
subjecting it to flowing argon saturated with monomer at room
temperature for 24 h. Ellipsometry (632.8 nm laser) of the sample
showed a change in the ellipsometric parameters consistent with
growth of a 24 ( 1 nm film with a refractive index of 1.6 (bulk
poly(4-methoxystyrene) film). Infrared reflection spectroscopy
showed the signature of poly(4-methoxystyrene) characterized by
the presence of peaks at 1600-1500 cm-1 (benzene ring), 1200-
1100 cm-1 (methoxy group), and 3000-2800 cm-1 (methylene
stretches in the polymer backbone). The polymerization was further
confirmed by the absence of peaks at 988 and 900 cm-1, which
correspond to the out-of-plane bending mode of the R-C atom in
the vinyl group, which is present in the monomer (see Figure 1)
but not in the polymer. Atomic force microscopy images (see
Supporting Information) demonstrated that the polymer film was
very smooth, with a root-mean-square roughness of about 0.3 nm.
These results were completely reproducible.
In-place growth of polymer brushes was illustrated by synthesiz-
ing patterned polymer brushes (Scheme 1). A polydimethylsiloxane
stamp was coated with the MHN molecule and stamped on a bare
gold surface. The stamped substrate was then backfilled by
hexadecanethiol solution in ethanol to obtain a patterned nitrile-
terminated alkanethiol substrate. The procedure of anchoring the
Pd catalyst and conducting the polymerization reaction was the same
as that used for the initial experiments. The resulting patterned
polymer brushes were characterized by atomic force microscopy
(AFM; Figure 2). The profile in the AFM image indicates that ridges
of polymer brush developed having a width of just less than 1 µm
and a thickness of approximately 29 nm, consistent, within
experimental error, with the ellipsometric thickness.
Supporting Information Available: MHN synthesis, reflection
absorption infrared spectroscopy of MHN SAM on gold surface,
calculation of Pd coverage on the surface, and AFM of polymer brush.
This material is available free of charge via the Internet at http://
pubs.acs.org.
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