Inorganic Chemistry
Article
137.85 (1C), 139.82 (1C), 149.00 (1C), 152.84 (1C), 154.54 (1C),
155.07 (1C), 159.55 (1C).
XRD measurements. Financial support was provided by NSF
(CHE-0748867).
PtOO3. The complex was prepared in a synthetic procedure similar
to PtOO1 with a 70% yield. Anal. Calcd. for C22H14N2O2Pt: C,
49.53%; H, 2.65%; N, 5.25%. Found: C, 49.57%; H, 2.78%; N, 5.19%.
1H NMR (400 MHz, CDCl3): δ 6.95 (dd, 1H, J 7.2, 1.8 Hz), 7.12−
7.27 (m, 6H), 7.33 (d, 1H, J 8.3 Hz), 7.50 (dd, 1H, J 7.2, 1.4 Hz), 7.82
(ddd, 1H, J 8.6, 7.2, 1.6 Hz), 7.88 (ddd, 1H, J 8.7, 7.1, 1.9 Hz), 7.92 (d,
1H, J 8.1 Hz), 8.30 (d, 1H, J 5.5 Hz), 8.48 (dd, 1H, J 5.7, 1.9 Hz). 13C
NMR (d6-DMSO): 106.24 (1C), 110.25 (1C), 112.69 (1C), 116.11
(1C), 117.38 (1C), 119.31 (1C), 120.46 (1C), 122.00 (1C), 124.23
(1C), 124.82 (1C), 124.89, (1C), 125.72 (1C), 139.44 (1C), 142.20
(1C), 147.66 (1C), 148.69 (1C), 149.46 (1C), 152.06 (1C), 154.01
(1C), 155.99 (1C), 159.82 (1C), 164.44 (1C).
OLED Fabrication and Testing. Devices employing PtOO3 and
fac-Ir(ppy)3 as emitters were fabricated on glass substrates precoated
with a patterned transparent indium tin oxide (ITO) anode using a
device architecture of ITO/PEDOT:PSS/20 nm TAPC/25 nm 8%
emitter:26mCPy/10 nm PO15/30 nm BmPyPB/LiF/Al, where
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PEDOT:PSS
= poly(3,4-ethylenedioxythiophene) poly-
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ASSOCIATED CONTENT
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S
* Supporting Information
X-ray crystallographic data for PtOO1 in CIF format. Synthesis
and 1H NMR characterization of the ligands. Cyclic
voltammetry scans of PtOO1, PtOO2, and PtOO3. Current−
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1
voltage plot of PtOO3 and fac-Ir(ppy)3 OLED devices. H
NMR spectra and assignment of complexes. This material is
AUTHOR INFORMATION
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Corresponding Author
(24) Williams, J. A. G.; Beeby, A.; Davies, E. S.; Weinstein, J. A.;
Wilson, C. Inorg. Chem. 2003, 42, 8609−8611.
(25) Wang, Z.; Turner, E.; Mahoney, V.; Madakuni, S.; Groy, T.; Li,
J. Inorg. Chem. 2010, 49, 11276−11286.
Author Contributions
The manuscript was written through contributions of all
authors. All authors have given approval to the final version of
the manuscript.
(26) Rausch, A. F.; Murphy, L.; Williams, J. A. G.; Yersin, H. Inorg.
Chem. 2009, 48, 11407−11414.
(27) Ravindranathan, D.; Vezzu, D. A. K.; Bartolotti, L.; Boyle, P. D.;
Huo, S. Inorg. Chem. 2010, 49, 8922−8928.
Notes
The authors declare no competing financial interest.
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47, 1258−1260.
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1435.
ACKNOWLEDGMENTS
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The authors thank Jason Brooks from Universal Display
Corporation for thin film quantum efficiency measurements,
Professor Jinbo Hu of the Shanghai Institute of Organic
Chemistry for EA and discussion, and Thomas Groy of ASU for
(30) Rausch, A.; Murphy, L.; Williams, J. A. G.; Yersin, H. Inorg.
Chem. 2012, 51, 312−319.
(31) Kui, S.; Chow, P. K.; Tong, G. S. M.; Lai, S.; Cheng, G.; Kwok,
C.; Low, K.; Ko, M. Y.; Che, C. Chem.Eur. J. 2013, 19, 69−73.
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dx.doi.org/10.1021/ic302490c | Inorg. Chem. XXXX, XXX, XXX−XXX