organic compounds
Data collection
packing is also stabilized by additional IÁ Á ÁO interactions
1
2
1
2
Ê
[I1Á Á ÁO10( x + 1, y + , z + ) = 3.082 (3) A].
Siemens SMART CCD area-
detector diffractometer
! scans
Absorption correction: empirical
(SADABS; Sheldrick, 1996)
Tmin = 0.674, Tmax = 0.897
19 536 measured re¯ections
6131 independent re¯ections
2831 re¯ections with I > 2ꢄ(I)
Rint = 0.093
ꢂmax = 28.53ꢀ
Experimental
h = 10 ! 14
k = 15 ! 14
For the preparation of (I) the following procedure was employed. To
a solution of o-iodoaniline (0.2 mol) and pyridine (0.2 mol) in dry
benzene (50 ml), cinnamoyl bromide (0.2 mol in hexane) was added
dropwise. The mixture was heated in a water bath at 333±343 K for
5 h and then poured into 80±100 ml of water. The benzene layer was
separated and washed repeatedly with water (3±4 times). The
benzene was dried with magnesium sulfate and then evaporated to
obtain the anilide. For the benzylation of the anilide, NaH (0.2 mol)
was taken in a round-bottomed ¯ask. A solution of anilide (0.2 mol)
in dry dimethylformamide (DMF; 50 ml) was added to the NaH. The
reaction mixture was stirred for 15 min, and then benzyl bromide was
added and stirred for 3 h. The reaction mixture was poured into
water, extracted with ethyl acetate and washed with water repeatedly
to remove the DMF, and the compound was recrystallized from di-
chloromethane. For the preparation of (II), the synthesis procedure
was the same as for (I), with ꢀ-phenylcinnamoyl bromide as the
starting material.
l = 26 ! 21
Intensity decay: none
Re®nement
Re®nement on F2
R[F2 > 2ꢄ(F2)] = 0.057
wR(F2) = 0.102
S = 0.958
6131 re¯ections
289 parameters
H-atom parameters constrained
w = 1/[ꢄ2(Fo2) + (0.028P)2]
where P = (Fo2 + 2Fc2)/3
(Á/ꢄ)max = 0.001
3
Ê
Áꢅmax = 0.45 e A
3
Ê
0.79 e A
Áꢅmin
=
Table 1
Selected geometric parameters (A) for (I).
Ê
I1ÐC24
C9ÐN11
2.094 (4)
1.360 (5)
N11ÐC19
N11ÐC12
1.434 (4)
1.479 (5)
Table 2
Selected geometric parameters (A, ) for (II).
ꢀ
Ê
Compound (I)
I1ÐC24
C9ÐN11
2.101 (4)
1.370 (5)
N11ÐC19
N11ÐC12
1.426 (5)
1.478 (5)
Crystal data
C22H18INO
Mr = 439.27
Mo Kꢀ radiation
Cell parameters from 8192
re¯ections
C8ÐC7ÐC1
130.8 (4)
C7ÐC8ÐC26
125.8 (4)
Orthorhombic, Pbca
Ê
a = 17.7759 (3) A
ꢂ = 1.73±28.37ꢀ
1
Ê
b = 9.0661 (2) A
ꢃ = 1.693 mm
T = 293 (2) K
For both compounds, data collection: SMART (Siemens, 1996);
cell re®nement: SAINT (Siemens, 1996); data reduction: SAINT;
program(s) used to solve structure: SHELXTL (Sheldrick, 1997);
program(s) used to re®ne structure: SHELXTL; molecular graphics:
SHELXTL; software used to prepare material for publication:
SHELXTL and PLATON (Spek, 1990).
Ê
c = 23.5939 (3) A
3
Ê
V = 3802.35 (12) A
Plate, colourless
0.28 Â 0.14 Â 0.06 mm
Z = 8
Dx = 1.535 Mg m
3
Data collection
Siemens SMART CCD area-
detector diffractometer
! scans
Absorption correction: empirical
(SADABS; Sheldrick, 1996)
Tmin = 0.721, Tmax = 0.901
27 608 measured re¯ections
4666 independent re¯ections
2674 re¯ections with I > 2ꢄ(I)
Rint = 0.06
The authors thank M. Raja, Scientist, SPIC Science Foun-
dation, Chennai India, and Professor K. K. Balasubramanian,
Indian Institute of Technology, Madras, for the synthesis and
supply of the compounds. HKF thanks the Malaysian
Government and Universiti Sains Malaysia for research grant
R&D No. 305/p®zik/622004. SSSR thanks the Universiti Sains
Malaysia for a Visiting Postdoctoral Fellowship.
ꢂ
max = 28.31ꢀ
h = 23 ! 13
k = 11 ! 12
l = 31 ! 30
Intensity decay: none
Re®nement
Re®nement on F2
R[F2 > 2ꢄ(F2)] = 0.059
wR(F2) = 0.095
S = 1.091
4666 re¯ections
226 parameters
H-atom parameters constrained
w = 1/[ꢄ2(Fo2) + (0.023P)2 +
Supplementary data for this paper are available from the IUCr electronic
archives (Reference: SK1348). Services for accessing these data are
described at the back of the journal.
2
2.0205P] where P = (Fo2 + 2Fc )/3
(Á/ꢄ)max = 0.001
3
Ê
Áꢅmax = 0.51 e A
3
Ê
1.21 e A
Áꢅmin
=
References
Augustin, M., Richter, M. & Sala, S. (1980). J. Prakt. Chem. 332, 55±68.
Banerjee, R., Das, K., Ganesh, V., Banerjee, P., Surolia, A. & Vijayan, M.
(1994). Acta Cryst. C50, 1726±1728.
Elmali, A. & Elerman, Y. (1997). Acta Cryst. C53, 791±793.
Iwamoto, T. & Kashino, S. (1990). Acta Cryst. C46, 686±688.
Iwamoto, T., Kashino, S. & Haisa, M. (1989). Acta Cryst. C45, 1110±1112.
Renganayaki, S., Subramanian, E., Shanmuga Sundara Raj, S. & Fun, H.-K.
(1999). Acta Cryst. C55, 1672±1673.
Sheldrick, G. M. (1996). SADABS. University of GoÈttingen, Germany.
Sheldrick, G. M. (1997). SHELXTL. Version 5.1. Bruker AXS Inc., Madison,
Wisconsin, USA.
Siemens (1996). SMART and SAINT. Siemens Analytical X-ray Instruments,
Inc., Madison, Wisconsin, USA.
Spek, A. L. (1990). Acta Cryst. A46, C-34.
Subramanian, E., Renganayaki, S., Shanmuga Sundara Raj, S. & Fun, H.-K.
(1999). Acta Cryst. C55, 764±766.
Compound (II)
Crystal data
3
C29H24INO
Mr = 529.39
Dx = 1.414 Mg m
Mo Kꢀ radiation
Monoclinic, P21=c
Cell parameters from 6014
re¯ections
Ê
Ê
a = 10.8150 (2) A
b = 11.3607 (2) A
ꢂ = 1.88±28.32ꢀ
1
Ê
c = 20.2477 (5) A
ꢃ = 1.308 mm
T = 293 (2) K
ꢁ = 91.271 (1)ꢀ
V = 2487.14 (9) A
Z = 4
3
Ê
Block, colourless
0.32 Â 0.18 Â 0.10 mm
ꢁ
350 S. Renganayaki et al. C22H18INO and C29H24INO
Acta Cryst. (2000). C56, 349±350