146
U. Englich et al. / Journal of Organometallic Chemistry 613 (2000) 139–147
niometer and CCD detector operating at −54°C. Each
data set was collected at −123°C using a Cryojet low
temperature device from Oxford Instruments and by
employing graphite monochromated Mo-Ka radiation
grateful to the Deutsche Forschungsgemeinschaft
(UH74/3), the Degussa-Huels AG (Germany) and Pro-
fessor Dr K. Jurkschat (Universita¨t Dortmund) for
support of this work.
,
(u=0.71073 A). The data collections nominally cov-
ered a hemisphere of reciprocal space utilizing a combi-
nation of three groups of exposures, each with a
different angle and each exposure covering 0.3° in ꢀ.
Crystal decay was monitored by repeating a set of
initial frames at the end of the data collection and
comparing the duplicate reflections, whereby no decay
was observed for all compounds reported. An absorp-
tion correction was applied utilizing the program SAD-
ABS [24]. The crystal structures of all compounds were
solved by Direct Methods, as included in the SHELXTL
program package [25]. Missing atoms were located in
subsequent difference Fourier maps and included in the
refinement. The structures were refined by full-matrix
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4. Supplementary material
Crystallographic data for the structural analysis have
been deposited with the Cambridge Crystallographic
Data Centre, CCDC No. 137 003 for compound 4, No.
137 004 for compound 5, No. 137 005 for compound 6,
No. 137 006 for compound 7, and No. 137 007 for
compound 8. Copies of this information may be ob-
tained free of charge from: The Director, CCDC, 12
Union Road, Cambridge CB2 1EZ, UK (Fax: +44-
1223-336-033; e-mail: deposit@ccdc.cam.ac.uk or www:
http://www.ccdc.cam.ac.uk).
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This work was supported by Syracuse University
(KRS), the National Science Foundation (KRS; CHE-
9702246), and the Deutsche Forschungsgemeinschaft
(Postdoctoral stipend for U.E.). Purchase of the X-ray
diffractometer at Syracuse University was made possi-
ble with grants from NSF (CHE-95-27898), the W.M.
Keck Foundation and Syracuse University. F.U. is
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