M.T. Gamer et al. / Inorganica Chimica Acta 358 (2005) 4172–4176
4175
NMR spectra were recorded on JNM-LA 400 FT-NMR
spectrometer. Chemical shifts are referenced to internal
solvent resonances and are reported relative to tetra-
methylsilane and 85% phosphoric acid (31P NMR),
respectively. IR spectra were obtained on a Shimadzu
FTIR-8400s. LnCl3 [10], [Ln{N(SiMe3)2}3] [7] and
[K(THF)nN(PPh2)2] (n = 1.25, 1.5) [4] were prepared
according to literature procedures.
2a Æ toluene: Stoe IPDS diffractometer (Ag Ka radia-
tion); T = 200(2) K; data collection and refinement:
ꢀ
SHELXS-97 [11], SHELXL-97 [12]; triclinic, space group P1
(No. 2); lattice constants a = 1380.02(10), b = 1383.
92(9), c = 2086.69(13) pm, a = 91.085(8)ꢁ, b = 97.
883(8)ꢁ, c = 118.235(7)ꢁ, V = 3461.8(4) · 106 pm3, Z =
2; l (Ag Ka) = 0.554 mmÀ1; hmax = 24.08; 20744 (Rint
=
0.0511) unique reflections measured, of which 16612
were considered observed with I > 2r(I); maximum
residual electron density 1.825 and À1.076 e/AÀ3; 791
parameters (all nonhydrogen atoms except C33–C35
and C79 were calculated anisotropically; the positions
of the H atoms were calculated for idealized positions)
R1 = 0.0425; wR2 = 0.1040.
4.2. [Sm{N(PPh2)2}3] (2a)
20 ml of toluene was condensed at À196 ꢁC onto a mix-
ture of 270 mg (0.5 mmol) of [Sm{N(SiMe3)2}3] and
650 mg (1.5 mmol) of (Ph2P)2NH. The mixture was re-
fluxed for 6 h, filtered and the solvent taken off in vacuo.
The product was recrystallized from toluene. Yield
564 mg (81%), yellow crystals. 1H NMR (d8-THF,
2b Æ toluene: Stoe IPDS 2T diffractometer (Mo Ka
radiation); T = 200(2) K; data collection and refinement:
ꢀ
SHELXS-97 [11], SHELXL-97 [12]; triclinic, space group P1
(No. 2); lattice constants a = 1365.59(5), b = 1372.38(5),
3
250 MHz, 25 ꢁC): d 6.87 (dd, 24H, m-Ph, J(H,H) = 7.3
and 7.5 Hz), 7.07 (t, 12H, p-Ph, J(H,H) = 7.3 Hz), 7.45
3
c = 2078.37(7) pm,
a = 90.982(3)ꢁ,
b = 98.051(3)ꢁ,
3
(d, 24H, o-Ph, J(H,H) = 7.5 Hz). 31P{1H} NMR (d8-
c = 118.236(2)ꢁ, V = 3382.2(2) · 106 pm3, Z = 2; l (Mo
Ka) = 1.169 mmÀ1; hmax = 29.26; 18199 (Rint = 0.0697)
unique reflections measured, of which 14998 were consid-
ered observed with I > 2r(I); maximum residual electron
density 1.825 and À1.654 e/AÀ3; À1.386 parameters (all
nonhydrogen atoms except C33–C35 and C79 were calcu-
lated anisotropically; the positions of the H atoms were
calculated for idealized positions) R1 = 0.0391;
wR2 = 0.0833.
THF, 101.3 MHz, 25 ꢁC): d À62.7 (br). Anal. Calc. for
C79H68N3P6Sm (2a Æ toluene, 1395.63): C, 67.99; H,
4.91; N, 3.01. Found: C, 67.63; H, 4.92; N, 3.04%.
4.3. [Ln{N(PPh2)2}3] (Ln = Gd (2b), Dy (2c))
4.3.1. General procedure
20 ml of THF was condensed at À196 ꢁC onto a mix-
ture of 750 mg (1.5 mmol) of 1 and 0.5 mmol of LnCl3
and the mixture was stirred for 24 h at room tempera-
ture. The solvent was then evaporated in vacuo and tol-
uene condensed onto the mixture. The mixture was
filtered, and the solvent taken off in vacuo. The product
was recrystallized from toluene.
2b: Yield: 370 mg (79%). IR (KBr [cmÀ1]): 3063 (m,
mC@C–H), 2999 (w, mC–H), 1552 (w, mC@C), 1477
(m), 1431 (s), 1093 (m), 1025 (w, mPC), 997 (w), 950
(s), 919 (s), 907 (s), 738 (s), 710 (s), 693 (s). Anal. Calc.
for C79H68GdN3P6 (2b Æ toluene) (1402.52): C, 67.65;
H, 4.89; N 3.00. Found: C, 67.61; H, 4.92; N, 2.88%.
2c: Yield: 350 mg (75%). IR (KBr [cmÀ1]): 3051 (m,
mC@C–H), 2999 (w, mC–H), 1583 (w, mC@C), 1477
(m), 1431 (s), 1094 (m), 1025 (w, mPC), 996 (w), 944(s),
918 (s), 905 (s), 738 (s), 711 (s), 693 (s). Anal. Calc. for
C79H68DyN3P6 (2c Æ toluene) (1407.77): C, 67.40; H,
4.87; N, 2.98. Found: C, 67.31; H, 4.78; N, 2.96%.
2c Æ toluene: Stoe IPDS 2T diffractometer (Mo Ka
radiation); T = 200(2) K; data collection and refinement:
ꢀ
SHELXS-97 [11], SHELXL-97 [12]; triclinic, space group P1
(No. 2); lattice constants a = 1365.45(6), b = 1371.44(7),
c = 2081.49(10) pm, a = 90.932(4)ꢁ, b = 98.021(4)ꢁ,
c = 118.229(3)ꢁ, V = 3385.5(3) · 106 pm3, Z = 2; l (Mo
Ka) = 1.292 mmÀ1; hmax = 29.22; 17962 (Rint = 0.0381)
unique reflections measured, of which 14802 were con-
sidered observed with I > 2r(I); maximum residual elec-
tron density 1.825 and 1.585 e/AÀ3; À0.926 parameters
(all nonhydrogen atoms except C33–C35 and C79 were
calculated anisotropically; the positions of the H atoms
were calculated for idealized positions) R1 = 0.0309;
wR2 = 0.0681.
5. Supplementary material
4.4. X-ray crystallographic studies of 2a–2c
Crystallographic data (excluding structure factors)
for the structures reported in this paper have been
deposited with the Cambridge Crystallographic Data
Centre as a supplementary publication no. CCDC-
259352 (2a), 259286 (2b), and 259287 (2c). Copies of
the data can be obtained free of charge on application
to CCDC, 12 Union Road, Cambridge CB21EZ, UK
(fax: +(44)1223-336-033; email: deposit@ccdc.cam.
ac.uk).
Crystals of 2a–2c were grown from a toluene solu-
tion. A suitable crystal was covered in mineral oil
(Aldrich) and mounted on a glass fiber. The crystal
was transferred directly to the À73 ꢁC cold stream of a
STOE IPDS or a STOE IPDS 2T diffractometer. Subse-
quent computations were carried out on an Intel Pen-
tium III or IV Personal Computer.