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displacement parameters at the peaks >1 e A in Fourier
difference maps were introduced into final refinement. No
attempt was made to attach hydrogen atoms to the methyl
groups in this ligand. All the reminding hydrogen atoms
were placed in calculated positions and refined using a rid-
ing model. Three methyl groups C(12a), C(16a) and C(10b)
appeared to be disordered in two positions due to the crys-
tallographic mirror plane. Final R = 0.046 (0.071 for all
reflections), wR = 0.117 (0.126 for all reflections).
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4.4. Crystal structure determination of 2
The crystal was sealed in a glass capillary under nitrogen
stream. Unit cell from 10,777 reflections 2.91ꢁ < h < 27.48ꢁ.
X-ray data were collected on a Nonius KappaCCD diffrac-
tometer. Data collected with u scans (121 frames, rotation
per frame 1.5ꢁ, exposure per frame 45 s) 36,054 reflections
collected, 13,442 unique, 7242 above threshold [I > 2r(I)].
Diffractometer control program COLLECT [14], unit cell
parameters and data reduction with Denzo and Scalepak
[15], structure solved by direct methods SHELXS-97 [16] and
refined on F2 by full-matrix least-squares with SHELXL-97
[17]. All the hydrogen atoms were placed in calculated posi-
tions and refined using a riding model. Final R = 0.053,
wR = 0.094.
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Acknowledgement
(b) H. Wadepohl, T. Borchert, K. Buchner, M. Herrmann, F.-J.
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The authors thank the Ministry of Education and Science
for financial support of this work (GrantNo. 4 T09A 012 25).
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Appendix A. Supplementary data
Crystallographic data for the structural analysis of 1 and
2 have been deposited with the Cambridge Crystallo-
graphic Data Centre Nos. CCDC 600976 and 600977. Cop-
ies of this information may be obtained free of charge from
The Director, CCDC, 12, Union Road, Cambridge, CB2
1EZ, (fax +44 1223 336033 or e-mail: deposit@ccdc.cam.
associated with this article can be found, in the online ver-
(b) T.H. Crawford, J. Swanson, J. Chem. Educ. 48 (1971) 382;
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Experiments, Wiley-VCH, New York, 1998.
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[14] B.V. Nonius, ‘‘COLLECT’’ data collection software, 1998.
[15] Z. Otwinowski, W. Minor, Processing of X-ray diffraction data
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