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aldehyde groups and nitrogen atoms of the azomethine and
triphenylamine chromophores may act as the nucleophilic and
7b,12a
electrophilic trapping site, respectively.
When a positive voltage
with sufficient amplitude is applied, the traps will become fully filled
with holes. The subsequently injected holes from the electrode can
migrate more freely in the polymer thin film and switch the device
from HRS to LRS. With the enhanced isotropic architecture in the
hyperbranched PAM thin films, charge carrier transport becomes
more efficient and stable, which accounts for the superior switching
11e
performance in the Ta/PAM/Pt devices. When the negative reset
voltage is applied to the devices, the filled traps are detrapped to
regenerate the potential well for charge carrier hopping and switch
12a
the device back to HRS.
In summary, linear and hyperbranched PAMs with identical
chemical structure but different molecular geometries and crystal-
line qualities have been successfully synthesized via condensation
polymerization and explored for resistive switching performance.
Both polymer exhibit smaller switching voltages of À0.41 V/1.4 V
Fig. 3 Weibull exponent (k) versus standard deviation to mean ratio (D/m)
for the HRS and LRS resistances of the PAM and other reported devices.
uniform distribution of the HRS and LRS resistances are and À0.53 V/1.73 V, ON/OFF ratios over 100, endurance capability
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observed. We also count the resistance values of HRS and LRS for more than 5000 cycles and retention time exceeding 10 s. In
in all the switching cycles. As expected, a narrow distribution of comparison, the hyperbranched PAM thin film with isotropic
R
HRS (7.5 Æ 0.2 kO) and RLRS (270 Æ 15 O) are obtained in the architecture demonstrates uniform distribution of the HRS and
Ta/hyperbranched PAM/Pt memory, while the resistance values LRS resistances, which is beneficial for practical memory device
of Ta/linear PAM/Pt exhibit relatively fluctuated distribution applications.
range of 21 Æ 7 kO (RHRS) and 250 Æ 80 O (RLRS). We have also
The authors acknowledge the financial supports from the
used Weibull analysis to further quantify the uniformity of the State Key Project of Fundamental Research of China (973 Program,
PAM devices (details can be found in ESI†). Generally, the larger 2012CB933004), National Natural Science Foundation of China
Weibull exponent (k) and smaller standard deviation (D) to mean (51303194, 11274321, 61328402, 21074034), Ningbo Science and
(
m) ratio (D/m) correspond to superior uniformity of the para- Technology Innovation Team (2011B82004), Ningbo Natural
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meters under evaluation. For the Pt/linear PAM/Ta stack, the Science Foundations (2013A610031).
D/m values of the HRS and LRS resistances are 0.3200 and 0.3333,
respectively. In contrast, the HRS and LRS resistances of the Notes and references
hyperbranched PAM device feature smaller D/m values of 0.0267
and 0.0556, respectively. Fig. 3 summarizes the Weibull compo-
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2
(a) Emerging research devices. In: International Technology Road-
map for Semiconductors (ITRS) 2005 edn 1–70 (Semiconductor
Industry Association, International Sematech, Austin, TX, 2005);
(b) Q. D. Ling, D. J. Liaw, C. X. Zhu, D. S. H. Chan, E. T. Kang and
K. G. Neoh, Prog. Polym. Sci., 2008, 33, 917.
(a) T. C. Chang, F. Y. Jian, S. C. Chen and Y. T. Tsai, Mater. Today, 2011,
14, 608; (b) S. B. Long, C. Cagli, D. Ielmini, M. Liu and J. Sune, J. Appl.
Phys., 2012, 111, 074508; (c) X. J. Zhu, W. J. Su, Y. W. Liu, B. L. Hu,
L. Pan, W. Lu, J. D. Zhang and R.-W. Li, Adv. Mater., 2012, 24, 3941;
nent k of the HRS and LRS resistances of the PAM and other
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reported devices, as a function of the standard deviation D/m.
The Ta/hyperbranched PAM/Pt device exhibits the highest k and
lowest D/m, which even exceeds the performance of inorganic
counterparts. Pulse switching operations were conducted with
a write–read–erase–rewrite (WRER) sequence to further study
the endurance performance of the PAM devices. The set/reset
voltages of the linear and hyperbranched PAMs are 4.0 V/À2.0 V
and 3.0 V/À2 V, respectively, while the duration of the voltage
pulse applied to the Ta/PAM/Pt memory devices is 2 ms. The read
voltages for both devices are 0.1 V. The memory performance
based on these two PAMs is found to be stable for over 5000
WRER cycles (Fig. S7 of ESI†). Fig. S8 (ESI†) shows the retention
capability of the Ta/PAM/Pt memory devices in their LRS and
HRS, respectively. The maintenance of the HRS and LRS in the
hyperbranched PAM device under 0.1 V constant voltage stress
(d) J. Shang, G. Liu, H. L. Yang, X. J. Zhu, X. X. Chen, H. W. Tan, B. L. Hu,
L. Pan, W. H. Xue and R.-W. Li, Adv. Funct. Mater., 2014, 24, 2171.
(a) G. Liu, B. Zhang, Y. Chen, C. X. Zhu, L. J. Zeng, D. S. H. Chan,
K. G. Neoh, J. N. Chen and E. T. Kang, J. Mater. Chem., 2011,
3
21, 6027; (b) K. L. Wang, Y. L. Liu, J. W. Lee, K. G. Neoh and
E. T. Kang, Macromolecules, 2010, 43, 7159; (c) H. C. Wu, A. D. Yu,
W. Y. Lee, C. L. Liu and W. C. Chen, Chem. Commun., 2012, 48, 9135;
(
d) D. J. Liaw, K. L. Wang, Y. C. Huang, K. R. Lee, J. Y. Lai and
C. S. Ha, Prog. Polym. Sci., 2012, 37, 907; (e) J. H. Wu, H. J. Yen,
Y. C. Hu and G. S. Liou, Chem. Commun., 2014, 50, 4915.
(a) J. M. J. Fr ´e chet, Science, 1994, 263, 1710; (b) X. T. Tao, Y. D. Zhang,
T. Wada, H. Sasabe, H. Suzuki, T. Watanabe and S. Miyata, Adv.
Mater., 1998, 10, 226; (c) X. M. Liu, C. B. He, X. T. Hao, L. W. Tan,
Y. Q. Li and K. S. Ong, Macromolecules, 2004, 37, 5965.
4
4
5 (a) H. Sirringhaus, P. J. Brown, R. H. Friend, M. M. Nielsen,
K. Bechgaard, B. M. W. Langeveld-Voss, A. J. H. Spiering,
R. A. J. Janssen, E. W. Meijer and P. Herwig, et al., Nature, 1999,
401, 685; (b) H. Yang, T. J. Shin, L. Yang, K. Cho, C. Y. Ryu and
Z. Bao, Adv. Funct. Mater., 2005, 15, 671; (c) J. Roncali, P. Leriche and
A. Cravino, Adv. Mater., 2007, 19, 2045.
for 1 Â 10 s, suggests that the superior device performance may
be obtained by utilizing polymers with hyperbranched structure
in thin film devices.
The resistive switching mechanism of the Ta/PAM/Pt memory
devices can be attributed to the charge trapping and detrapping
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(a) L. Pan, B. L. Hu, X. J. Zhu, X. X. Chen, J. Shang, H. W. Tan, W. H. Xue,
Y. J. Zhu, G. Liu and R.-W. Li, J. Mater. Chem. C, 2013, 1, 4556; (b) B. L. Hu,
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in the PAM backbones. As shown in Scheme 1, the terminal
11498 | Chem. Commun., 2014, 50, 11496--11499
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