Article
Inorganic Chemistry, Vol. 48, No. 22, 2009 10637
2. Experimental Details
Table 1. Products Observed after Heating UN2 at Different Temperatures and
Time Intervals under Argon
2.1. Uranium Nitride Synthesis. Ammonolysis of UF4 was
used to synthesize UN2. A 1015.76 (5) mg sample of UF4
(International Bio-Analytical Industries, Inc.) was loaded in
a quartz-glass boat wrapped with platinum foil and placed
inside a 25.4 mm diameter quartz-glass tube, capped on either
end with 25 mm quartz-glass Solv-Seal fittings (Andrews Glass
Co., Inc.). Pyrex Solv-Seal caps fitted with 15 mm high vacuum
Teflon stopcocks sealed the tube and allowed a controlled
atmosphere to blanket the sample. The sample was held at
800 °C for 1 h under ammonia gas (research grade, Praxair)
after which 858.53 (5) mg of UN2 was obtained. The mass loss
for the transformation of UF4 into UN2 was 157.23(5) mg. This
indicates an extra 2 mg mass loss compared to the expected value
of 155.2 mg. This extra additional mass loss is attributed to
errors associated with the experimental measurements. A
218.74 (5) mg sample of R-U2N3 was synthesized by decompos-
ing 225.35 (5) mg of the synthesized UN2 under an inert atmo-
sphere (ultrahigh purity argon, 99.9999%, Praxair) at 700 °C for
1 h. The mass loss was 6.6 mg which is relatively close to the
expected value of 5.9 mg. Batches of different UN2 and R-U2N3
masses were used to synthesize UN to determine the reaction
kinetics and temperature effects. A detailed description of these
nitrides syntheses can be found in previous publications.12,19
2.2. Characterization Methods. X-ray powder diffraction
(XRD) patterns were obtained using a Philips PANalytical
X’Pert Pro instrument with a Ni-filtered Cu KR radiation.
The patterns were collected using 40 mA current and 40 kV
tension at room temperature. Chemical phases in the samples
were initially determined matching the XRD powder patterns
with the International Center for Diffraction Data (ICDD)
database patterns. Following are the reference patterns used
for separate compounds: UN2 (01-073-1713), U2N3 (01-073-
1712), UN (00-032-1397), and UO2 (00-041-1422). An internal
LaB6 standard from NIST (SRM 660a) was admixed with the
uranium nitride samples to allow for precise lattice parameter
refinement and to optimize the quality of Rietveld analysis as
performed.
temperature (°C)
time of heating (min.)
products observed
500
600
30
30
240
30
60
30
30
30
30
30
240
30
60
30
30
30
30
UN2
UN2
UN2
UN2
UN2
U2N3
U2N3
U2N3
U2N3
U2N3
U2N3
U2N3
U2N3
U2N3, UN
U2N3, UN
U2N3, UN
UN
650
675
700
750
800
900
950
975
1000
1050
1100
three UN2 samples of approximately 50 mg each at 500,
700, and 1100 °C under flowing high-purity argon
(99.9999%) for 30 min. Heating the first sample at
500 °C resulted in no measurable decomposition of the
UN2. At 700 °C, UN2 was completely converted to
R-U2N3. After heating at 1100 °C for 30 min, the only
uranium nitride phase identified in the samples was UN.
The latter sample also contained a 5.3 (1) wt % secondary
UO2 phase, most likely due to trace oxygen contamina-
tion in the experimental system. Subsequent experiments
were conducted in two different temperature ranges of
500-700 °C and 700-1100 °C (Table 1) to refine the
temperatures in which the decomposition reactions in eqs
1 and 2 occur. At each of these temperatures, the reactants
were heated for 30 min initially to determine where the
decomposition reactions occur. These experiments
showed that the UN2 decomposition to R-U2N3 starts
at about 675 °C, and the second decomposition to UN
begins near 975 °C. Therefore, the decompositions at 650
and 950 °C were studied further with up to 60 min of
heating. These two experiments showed neither forma-
tion of R-U2N3 at 650 °C nor formation of UN at 950 °C.
Heating of UN2 at 600 and 900 °C was also conducted for
up to 240 min to determine how duration would affect
UN2 decomposition. At 600 °C (a = 0.53050(6) nm), no
R-U2N3 formation occurred. No UN formation was
perceived at 900 °C as well (a = 1.068890(7) nm). Even
though no phase transformations were observed, increase
in the lattice parameters of UN2 and R-U2N3 was detected
as described in Figure 2. Also, over the temperature range
from 975 to 1100 °C, both R-U2N3 and UN were observed
in the product.
Electron density maps of uranium nitrides were calculated
using the XRD powder patterns of the samples. Le Bail decom-
position24 was used to extract the individual observed structure
factor amplitudes (Fobs) of the XRD powder pattern using
Jana2000.25 These observed structure factors were then used
to calculate the electron density maps of the compounds by the
charge-flipping algorithm through the Superflip program.26 The
calculated electron density maps were visualized using UCSF
Chimera.27 A Tecnai-G2-F30 supertwin transmission electron
microscope system with a 300 keV Schottky field emission gun
was used in TEM imaging. Bright field (BF) and the high
resolution (HRTEM) modes of TEM were utilized in sample
characterization. All TEM images were recorded using a slow
scan CCD camera attached to a Gatan GIF 2000 energy filter.
3. Results
3.1. UN2 Decomposition. The thermal behavior of
UN2 in an inert atmosphere was determined by heating
The refined lattice parameters of UN2 and U2N3 were
shown to vary with respect to the temperature (Figure 2).
Lattice parameters of both these nitrides change linearly
as a function of temperature. A 0.0004 nm change was
determined in the lattice parameter of UN2 over a 150 °C
temperature range. The lattice parameter change deter-
mined for the R-U2N3 samples over a 275 °C temperature
range was about 0.004 nm, a 6-fold increase compared to
the change of the UN2 lattice parameter relative to the
final lattice parameter of each compound. Possible rea-
sons for this observation are discussed in the following
paragraph using electron microscopic characterizations.
(23) Yeamans, C. B. Synthesis of Uranium Fluorides from Uranium
Dioxide with Ammonium Bifluoride and Ammonolysis of Uranium Fluor-
ides to Uranium Nitrides. Ph.D. dissertation. University of California,
Berkeley, Berkeley, California, 2008,; pp 12-18.
(24) Bail, A. Le.; Duroy, H.; Fourquet, J. L. Mater. Res. Bull. 1998, 23,
447-452.
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(25) DusIek, M.; PetrIoAcIek, V.; Wunschel, M.; Dinnebier, R. E.; van
Smaalen, S. J. Appl. Crystallogr. 2001, 34, 398-404.
(26) Palatinus, L.; Chapuis, G. J. Appl. Crystallogr. 2007, 40, 786-790.
(27) Pettersen, E. F.; Goddard, T. D.; Huang, C. C.; Couch, G. S.;
Greenblatt, D. M.; Meng, E. C.; Ferrin, T. E. J. Comput. Chem. 2004, 25 (13),
1605-1612.