3
2
M.N. Abdusalyamova et al. / Journal of Alloys and Compounds 601 (2014) 31–37
Table 1
Synthesis conditions for the powdered samples of holmium oxide under study.
All the four powdered samples had yellowish-white appearance in daylight.
They were additionally examined for purity by X-ray fluorescent analysis on a
COMITA X-Art M energy dispersive spectrometer. The spectrometer was equipped
with a silver anode X-ray tube as the source of exciting radiation and with a lithium
drifted silicon, Si(Li), detector. To attribute the observed peaks to the corresponding
characteristic X-ray transitions we referred to X-ray spectroscopy handbooks
Sample number Precursor
Tsynthesis (°C)
1
2
3
4
Holmium acetate
Holmium acetate
Carbamide-containing complex of Holmium 700
Holmium chloride 600
600
700
[
23,24]. The X-ray fluorescence spectrum of holmium oxide synthesized via the ace-
tate route (Fig. 1) indicates that, except for holmium, the mass content of metals
with atomic number more or equal than that of magnesium is no more than 0.1%
for every element. The precedently described synthesis procedures for the samples
of holmium oxide suggest that the X-ray fluorescence data obtained for the sample
2
are applicable to the three others.
Elemental C, H, N (by combustion method) and O (by pyrolysis method) analy-
paper we also report some observations relating to a crystallite size
effect in the samples of holmium oxide.
sis was conducted with the use of an Elementar CHNS/O Vario Micro cube analyzer.
Thermal gravimetry and differential scanning calorimetry were carried out on a
Netzsch STA 409 LUXX thermal analyzer at a heating rate of 10 °C/min in argon
or air flow.
X-ray diffraction patterns were obtained at room temperature using a powder
h–h Bragg–Brentano diffractometer ARL X’TRA with Cu radiation. The diffractometer
was equipped with a solid-state X-ray Peltier detector enabling substantially in-
creased peak to background ratio and optimized angular and energy resolution
without using b-filters and monochromators.
The average crystallite size of holmium oxides was assumed to be equal to the
mean coherent scattering domain size along the crystallographic axis [111] in hol-
mium oxide, which, in turn, was estimated by employing the Scherrer equation,
using the (222) peak in the X-ray diffraction patterns of holmium oxides:
There is an interesting effect of the crystallite size in nanocrys-
talline solids, namely these materials exhibit a significant change
in the lattice parameter with a reduction of the crystallite size from
the micro- to the nanometer scale. There have been a number of
studies addressing this effect [16–21]. Regarding to binary metal
oxides, earlier, for instance, we reported the dependence of the lat-
tice parameter on the crystallite size of titanium dioxide [22]. In
this respect, rare earth oxides and, in particular, holmium oxide,
have been given the lack of attention from researchers. Thus, an-
other aim of this paper is to attempt a correlation between the
crystallite size and the lattice parameter of holmium oxide.
d ¼ kk=b cos
H
2
. Experimental
where d – the average crystallite size, k – wavelength k (Cu Ka) = 1.54051 Å, (b – the
Nanocrystalline powders of holmium oxide were synthesized by two methods.
full width at half maximum (FWHM) of the peak (222), – diffraction angle, k = 1.
H
Method 1 (acetate route): 2 g of commercially obtained 99.99% purity holmium
oxide were added to 15 ml of nitric acid, 63.2% and 15 ml of acetic acid, 70%, stirred
until completely dissolved, and evaporated dry in air. The obtained precipitate was
air-calcined for 1 h at 600 and 700 °C (samples denoted as 1 and 2, respectively, in
Table 1). Method 2 (carbamide route) differs from the Method 1 by that the starting
holmium oxide was dissolved in 30 ml of concentrated nitric acid added with 4 g of
carbamide. The calcination was carried out in air at 700 °C (sample 3 in Table 1).
For reference purposes an additional sample (4) was prepared by using hol-
mium chloride as precursor. The starting hydrolysis mixture was obtained accord-
The value of b was calculated taking into account instrumental diffraction line
broadening which was determined using Si standard powder. It is noteworthy that
for the purposes of the estimation we considered the microstrain contribution to
the broadening to be small as compared with the crystallite size effect.
ꢀ
1
IR spectra were registered in the range of wavelengths 4000–675 cm on a Per-
kin-Elmer Spectrum 100 spectrometer with UATR accessory. Raman spectra were
recorded using a NXT FT-Raman 9650 spectrometer with an excitation laser wave-
ꢀ
1
length of 976 nm. The spectral resolution was 4 cm for the both techniques.
The microstructure of the samples was studied with the use of high resolution
transmission electron microscope Jeol JEM-2100 operating at an accelerating volt-
age of 200 keV. All the specimens for TEM/HRTEM observations were prepared as
follows. The powders of holmium oxide were thoroughly ground by hand in an
agate mortar with a pestle, then the powder particles were dispersed in ethanol
by ultrasonic treatment, drops of the suspension were deposited onto a holey car-
bon film supported on a copper TEM grid and allowed to dry in air.
ing to the reaction 2HoCl
by NaOH to bring pH to 3.6–3.8, in a cooled flask at a temperature no higher than
0 °C. The obtained slurry was placed in a glassy carbon crucible and evaporated
3 2 2 3
+ H O = Ho O + 6HCl with the following neutralization
6
dry on a stove with constant stirring. The resulting mass after being air-calcined
at 600 °C for 1 h was washed on a Büchner funnel until NaCl had been completely
removed.
Fig. 1. X-ray fluorescence spectrum of holmium oxide (sample 2, Table 1). The observed characteristic X-ray dipole transitions of holmium are also schematically represented
in the inset (as a part of the Grotrian diagram). Peaks in the spectra and the transitions are labeled according to the IUPAC and Siegbahn’s notations. The correspondence
between them can be found elsewhere [44]. Ag(La) peak occurs due to the partial elastic scattering of the incident X-ray beam from the sample.