D412
Journal of The Electrochemical Society, 155 ͑5͒ D408-D413 ͑2008͒
cludes the ⌬V/V of −0.056, then the volume contraction due to
and Ole Kongstein. We are particularly grateful to Tetsuya Tsuda
−
1
surface alloying produces a stress change of +3.7 N m for each
nm of intermetallic formed. Lattice contractions of this magnitude
can certainly explain the tensile-stress changes observed experimen-
tally.
and Charles Hussey for providing the AlCl -EMImCl.
3
National Institute of Standards and Technology assisted in meeting the
publication costs of this article.
We now examine the kinetics of surface alloy formation. The
stress transients in Fig. 4a indicate that both the time constant and
the magnitude of the alloy-induced tensile stress are potential-
dependent. Similar potential dependence for alloy formation in the
References
1
. A. Hamelin, J. Electroanal. Chem. Interfacial Electrochem., 165, 167 ͑1984͒.
2. A. Hamelin and J. Lipkowski, J. Electroanal. Chem. Interfacial Electrochem., 171,
317 ͑1984͒.
58
3. E. Kirowa-Eisner, Y. Bonfil, D. Tzur, and E. Gileadi, J. Electroanal. Chem., 552,
upd region has been observed for Cd on Ag. Specifically, the loga-
rithm of the rate constant was found to increase linearly as the
potential was made more negative, approaching the bulk deposition
of Cd. This was attributed to a Nernst-type dependence of the Cd
activity at the surface on electrode potential. Garcia et al. have fur-
1
71 ͑2003͒.
4
. B. K. Niece and A. A. Gewirth, Langmuir, 12, 4909 ͑1996͒.
5. S. Sayed and K. Juttner, Electrochim. Acta, 28, 1635 ͑1983͒.
6. T. Solomun and W. Kautek, Electrochim. Acta, 47, 679 ͑2001͒.
. R. Adzic, V. Jovancicevic, and M. Podlavicky, Electrochim. Acta, 25, 1143 ͑1980͒.
8. R. Adzic, E. Yeager, and B. D. Cahan, J. Electrochem. Soc., 121, 474 ͑1974͒.
. M. Futamata, Chem. Phys. Lett., 333, 337 ͑2001͒.
10. C.-H. Chen and A. Gewirth, J. Am. Chem. Soc., 114, 5439 ͑1992͒.
11. C.-H. Chen, K. D. Kepler, A. A. Gewirth, B. M. Ocko, and J. Wang, J. Phys.
Chem., 97, 7290 ͑1993͒.
7
59
ther characterized the Cd–Ag system by STM. A thin surface alloy
film forms as the result of structural changes in the full monolayer
that are initiated by place-exchange processes between the Cd ad-
layer and surface Ag atoms. An effective diffusion coefficient of
9
−
16
2
−1
12. C.-H. Chen, N. Washburn, and A. A. Gewirth, J. Phys. Chem., 97, 9754 ͑1993͒.
3. M. Hara, Y. Nagahara, J. Inukai, S. Yoshimoto, and K. Itaya, Electrochim. Acta,
1
.5 ϫ 10 cm s was obtained from charge-time transients using
1
an alloying potential of +10 mV with respect to bulk Cd. Based on
these kinetics, one can expect a Cd–Ag surface alloy measuring
approximately 0.5 nm in thickness to form after 20 s at room tem-
perature.
51, 2327 ͑2006͒.
14. C. A. Jeffrey, D. A. Harrington, and S. Morin, Surf. Sci., 512, L367 ͑2002͒.
5. N. J. Tao, J. Pan, Y. Li, P. I. Oden, J. A. DeRose, and S. M. Lindsay, Surf. Sci. Lett.,
1
2
71, L338 ͑1992͒.
1
1
6. K. Tamura, J. Wang, R. Adzic, and B. Ocko, J. Phys. Chem. B, 108, 1992 ͑2004͒.
7. M. F. Toney, J. N. Howard, J. Richer, G. L. Borges, J. G. Gordon, O. R. Melroy, D.
Yee, and L. B. Sorenson, Phys. Rev. Lett., 75, 4472 ͑1995͒.
The Cd–Ag data cited above suggests that the kinetics of alloy
formation in the upd region is sufficient to cause the stress transients
shown in Fig. 4. Although similar room-temperature data is not
available for the formation of Al–Au alloys in the upd region, this
system has been examined in some detail at higher temperatures in
1
8. M. R. Deakin and O. R. Melroy, J. Electroanal. Chem. Interfacial Electrochem.,
2
39, 321 ͑1988͒.
1
2
9. M. Hepel, K. Kanige, and S. Bruckenstein, Langmuir, 6, 1063 ͑1990͒.
0. O. Melroy, K. Kanazawa, J. G. G. Gordon II, and D. Buttry, Langmuir, 2, 697
͑1986͒.
1. G. R. Stafford and U. Bertocci, J. Phys. Chem. B, 110, 15493 ͑2006͒.
2. G. R. Stafford and U. Bertocci, J. Phys. Chem. C, 111, 17580 ͑2007͒.
3. W. Haiss and J. K. Sass, J. Electroanal. Chem., 386, 267 ͑1995͒.
4. W. Haiss, R. J. Nichols, and J. K. Sass, Surf. Sci., 388, 141 ͑1997͒.
47
AlCl –NaCl electrolyte. The presence of both AlAu and Al Au
3
2
2
5
2
2
2
2
has been confirmed after 2 h at 250°C. An Arrhenius plot of the
high-temperature data suggests that at 25°C, an Al–Au diffusion
zone of 0.27 nm forms after 60 s. This is in reasonable agreement
with the ambient-temperature surface alloy kinetics described above
for Cd–Ag. Phase-formation studies on Al–Au thin films have
25. O. E. Kongstein, U. Bertocci, and G. R. Stafford, J. Electrochem. Soc., 152, C116
2005͒.
͑
6
0
26. T. Trimble, L. Tang, N. Vasiljevic, N. Dimitrov, M. van Schilfgaarde, C. Friesen, C.
shown that both Al Au and AlAu also form at room temperature.
2
5
2
V. Thompson, S. C. Seel, J. A. Floro, and K. Sieradzki, Phys. Rev. Lett., 95,
Based on the molar volume-induced stress change described by Eq.
1
66106 ͑2005͒.
4
, the 0.27 nm of AlAu formed in 60 s, estimated from the high-
27. M. Seo and M. Yamazaki, J. Solid State Electrochem., 11, 1365 ͑2007͒.
2
2
2
8. H. L. Meyerheim, D. Sander, R. Popescu, and J. Kirschner, Phys. Rev. B, 64,
045414 ͑2001͒.
9. T. A. Brunt, E. D. Chabala, T. Rayment, S. J. O’shea, and M. E. Welland, J. Chem.
Soc., Faraday Trans., 92, 3807 ͑1996͒.
temperature kinetic data, would result in a surface stress of
−
1
+
1.0 N m , which is in the same range as that observed experimen-
tally. Although these kinetic studies suggest that surface alloying
may be responsible for the tensile stress observed in the latter stages
of Al upd on Au, the kinetics of Al–Au alloy formation at room
temperature, as well as the stress changes associated with this pro-
cess, will have to be evaluated more thoroughly.
30. A. Grossmann, W. Erley, J. B. Hannon, and H. Ibach, Phys. Rev. Lett., 77, 127
1996͒.
͑
3
3
3
1. R. C. Cammarata and K. Sieradzki, Annu. Rev. Mater. Sci., 24, 215 ͑1994͒.
2. R. C. Cammarata, K. Sieradzki, and F. Spaepen, J. Appl. Phys., 87, 1227 ͑2000͒.
3. C. Friesen, N. Dimitrov, R. C. Cammarata, and K. Sieradzki, Langmuir, 17, 807
͑
2001͒.
4. E. P. M. Leiva, M. G. Del Popolo, and W. Schmickler, Chem. Phys. Lett., 320, 393
2000͒.
5. L. A. Kibler, M. Kleinert, R. Randler, and D. M. Kolb, Surf. Sci., 443, 19 ͑1999͒.
36. G. R. Stafford, O. E. Kongstein, and G. M. Haarberg, J. Electrochem. Soc., 153,
C207 ͑2006͒.
Conclusion
3
͑
In situ stress measurements were made during Al upd onto ͑111͒-
3
textured Au from Lewis acidic AlCl -EMImCl using the wafer-
3
curvature method. The surface stress response consists of three dis-
tinct features. In the potential range of 1.2–0.6 V the surface stress
3
7. J. S. Wilkes, J. A. Levisky, R. A. Wilson, and C. L. Hussey, Inorg. Chem., 21,
263 ͑1982͒.
8. R. T. Carlin, W. Crawford, and M. Bersch, J. Electrochem. Soc., 139, 2720 ͑1992͒.
1
moves in the tensile ͑positive͒ direction from a value arbitrarily
3
−
4
chosen as zero. This likely involves the desorption of AlCl from the
39. Q. Liao, W. R. Pitner, G. Stewart, C. L. Hussey, and G. R. Stafford, J. Electrochem.
Au surface and is consistent with adsorbate-induced stress models
that appear in the literature. At the start of Al upd, the surface stress
moves in the compressive direction, in contrast to the tensile stress
expected based on the positive lattice misfit. We attribute this com-
pressive stress to the formation of Al–Au bonds which partially
satisfy the bonding requirements of the Au surface atoms, thereby
reducing the tensile surface stress inherent to the clean Au surface.
In the latter stages of Al upd, the surface stress once again moves in
the tensile direction, which we attribute to Al–Au alloying. The
magnitude of the tensile-stress change is close to that estimated from
the elastic strain associated with the change in molar volume, using
reaction kinetics reported for surface alloy formation in the upd
region.
Soc., 144, 936 ͑1997͒.
4
4
0. J. Robinson and R. A. Osteryoung, J. Electrochem. Soc., 127, 122 ͑1980͒.
1. G. R. Stafford and C. L. Hussey, Advances in Electrochemical Science and Engi-
neering, Vol. 7, R. C. Alkire and D. M. Kolb, Editors, Wiley-VCH, Weinheim,
Germany ͑2002͒.
42. S. Z. El Abedin, E. M. Moustafa, R. Hempelmann, H. Natter, and F. Endres,
ChemPhysChem, 7, 1535 ͑2006͒.
3. E. M. Moustafa, S. Z. El Abedin, A. Shkurankov, E. Zschippang, A. Y. Saad, A.
Bund, and F. Endres, J. Phys. Chem. B, 111, 4693 ͑2007͒.
4. G. G. Stoney, Proc. R. Soc. London, Ser. A, 82, 172 ͑1909͒.
45. J.-J. Lee, I. T. Bae, D. A. Scherson, B. Miller, and K. A. Wheeler, J. Electrochem.
Soc., 147, 562 ͑2000͒.
6. J.-J. Lee, Y. Mo, D. A. Scherson, B. Miller, and K. A. Wheeler, J. Electrochem.
Soc., 148, C799 ͑2001͒.
7. B. S. Radovic, R. A. H. Edwards, and J. N. Jovicevic, J. Electroanal. Chem., 428,
113 ͑1997͒.
8. C. A. Zell, F. Endres, and W. Freyland, Phys. Chem. Chem. Phys., 1, 697 ͑1999͒.
4
4
4
4
4
Acknowledgments
49. B. Fischer, J. V. Barth, A. Fricke, L. Nedelmann, and K. Kern, Surf. Sci., 389, 366
1997͒.
͑
The authors gratefully acknowledge the technical contributions
of Charles Hussey, Ugo Bertocci, Thomas Moffat, Jonathon Guyer,
5
0. A. J. Bard and L. R. Faulkner, Electrochemical Methods: Fundamentals and Ap-
plications, John Wiley and Sons, New York ͑1980͒.