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Computational Science, Okazaki, Japan. HAADF-STEM measure-
ments were supported by ‘‘Advanced Characterization Nano-
technology Platform, Nanotechnology Platform Program of the
Ministry of Education, Culture, Sports, Science and Technology
(MEXT), Japan’’ at the Research Center for Ultra-High Voltage
Electron Microscopy (Nanotechnology Open Facilities) in Osaka
University. This work is partly supported by JSPS KAKENHI of
Grants-in-Aid for Scientific Research (A) Grant No. 15H02002
and 19H00890, of Challenging Research (Pioneering) Grant
No. 17H06226, and of Grant-in-Aid for Young Scientists (A) Grant
No. 15H05475.
Conflicts of interest
The authors declare the following competing financial interest(s):
H. T. and A. N. are inventors on JAPAN patent JP 5493139,
submitted by JST agency and Ayabo Corp., which covers the
nanocluster generator.
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