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Ê
mator) was used to collect the intensity data in the x-scan
(1, 4, 5) or in the x/h-scan mode (3). Cell constants were
refined from setting angles of 62 reflections in the 2h range
8±23° (1, 4, 5) or from ± x values of 52 reflections in the 2h
range 20±23° (3). Absorption corrections based on w-scans
were applied. The crystallographic program system used was
SHELXL-93 [20]. All structures were solved by direct meth-
ods and refined by full-matrix least-squares procedures on
F2. All non-H atoms were refined anisotropically; hydrogen
atoms were included using a riding model or as rigid
methyls. The final difference Fourier maps were featureless.
Additional crystallographic data are presented in Table 1.
Selected bond lengths and angles are listed in the Figure
captions.
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Acknowledgements. This work was supported by the Fonds
der Chemischen Industrie. Diffractometer maintenance by
A. Weinkauf is gratefully acknowledged.
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