Crystal structure of C60•Ph4E complexes
Russ.Chem.Bull., Int.Ed., Vol. 58, No. 5, May, 2009
1087
I
diffraction patterns (see Fig. 3), the lines of the starting
compounds were absent, and the products were indexed as a
tetragonal phase with the criterion M20 > 100. The refinement
of the peak profiles and the lattice parameters by the fullꢀprofile
analysis (see Fig. 3, a) for the space group P4/n gave the following
unit cell parameters: a = 12.682 Å, c = 14.355 Å for complex 1,
a = 12.699 Å, c = 14.411 Å for complex 2, and a = 12.722 Å,
c = 14.413 Å for complex 3. Some discrepancy between the unit
cell parameters determined based on the powder and singleꢀ
crystal Xꢀray diffraction data is attributed to the difference in
the temperature of the Xꢀray data collection.
1
10 15 20 25 30 35 40 45
2θ/deg
I
2
This study was financially supported by the Russian
Foundation for Basic Research (Project Nos 06ꢀ03ꢀ32728a
and 08ꢀ0397054) and the Council on Grants of the President
of the Russian Federation (Program for State Support of
Leading Scientific Schools of the Russian Federation, Grant
NShꢀ1396.2008.3 and State Contract No. 02.513.11.0002).
10 15 20 25 30 35 40 45
2θ/deg
I
3
References
10 15 20 25 30 35 40 45
2θ/deg
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Fig. 3. Results of the refinement for C60•Ph4Si (1) and the
experimental Xꢀray diffraction patterns for C60•Ph4Ge (2) and
C60•Ph4Sn (3).
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Ph4E (E = Si, Ge, Sn) at room temperature. In all cases, the
volumes of the saturated solutions were taken in a ratio of 1 : 1.
The crystals precipitated after 24 h. Large single crystals of the
complexes C60•Ph4E were grown by the slow evaporation of
benzene for 2—3 weeks. Single crystals of the complexes are
black sparkling wellꢀfaceted parallelepipeds; in the case of the
complex with germanium, the edge sizes are up to 3—4 mm.
Xꢀray diffraction study. The Xꢀray diffraction data sets for
complexes 1 and 2 were collected at 100 K on a Bruker AXS
SMART APEX diffractometer (ϕ—ωꢀscanning technique,
MoꢀKα radiation, λ = 0.71073 Å, graphite monochromator).
Absorption corrections were applied using the SADABS proꢀ
gram.11 The structures of 1 and 2 were solved by direct methods
using the SHELXS97 program package12 and refined by the
fullꢀmatrix leastꢀsquares method based on F2 with the use of the
SHELXL97 program package.13 All nonhydrogen atoms were
refined anisotropically. All H atoms in compound 1 were posiꢀ
tioned geometrically and refined using a riding model. The
hydrogen atoms in compound 2 were located in difference elecꢀ
tron density maps and refined isotropically. The disordered
fragments of the fullerene molecules were refined with 50% site
occupancies. Principal crystallographic characteristics and the
Xꢀray diffraction data collection and refinement statistics for
complexes 1 and 2 are given in Table 1. The Xꢀray powder
diffraction study was carried out on a DRONꢀ3M diffractometer
at T = 293 K using graphiteꢀmonochromatized CuꢀKα radiation
in the angle range of 5—60° with a step size of 0.02°. In the Xꢀray
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Göttingen University, Göttingen, 1996.
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13. G. M. Sheldrick, Program for Crystal Structure Refinement,
Göttingen University, Göttingen, 1997.
Received October 22, 2008;
in revised form January 14, 2009