A R T I C L E S
Chu et al.
solution was degassed by three cycles of freeze-pump-thaw) was
added dropwise. After refluxing for 2 days, the solvent was removed
under reduced pressure. The crude product was dry-loaded onto a
silica column and washed with toluene to remove C60 prior to
elution with a mixture of 5% ethyl acetate in toluene to afford the
desired product. The solvent was dried under vacuum to afford a
brown powder product (0.32 g, yield ) 37%). MALDI-MS m/z
(%) 1063.95 ([M + H]+, 83), 1085.98 ([M + Na]+, 100), 1101.93
([M + K]+, 30), 1314.08 ([M + DCTB]+, 44), 1337.10 ([M +
DCTB + Na]+, 20).
Since initial reports of fullerene adducts containing H-B
moieties,5 the number of H-B substituted-fullerene derivatives
has increased steadily6,7 Our initial efforts led to a fullerene-
barbituric acid adduct that opened up access to a variety of well-
defined supramolecular C60 architectures,8 based on the melamine-
cyanuric acid motif, that display enhanced electronic properties
of interest in organic photovoltaics9 and for the study of through-
space electronic interactions.10 Despite the strong interest in
developing H-B supramolecular fullerene-based materials, there
is still no direct evidence as to whether the self-assembly
properties of such materials are indeed controlled by the H-B
interactions rather than by the strong aggregation properties of
fullerene, dominated by entropy loss due to solvation.11
Furthermore, it is not yet clear whether the presence of H-B
units can indeed direct interfullerene electronic interactions, nor
to what degree they are compatible with charge transport in
n-type fullerene-based semiconductors. Herein, we provide
experimental evidence for the self-assembly of a H-B fullerene
derivative into a one-dimensional tape and its effect on
determining the directionality of through-space interfullerene
electronic interactions probed using the polarization of the
fluorescence emission from fullerene excimer-like emitting states
in single crystals. Compared to fullerene nanowires obtained
by Langmuir-Blodgett deposition of organogellators,12 the
crystalline materials show very high molecular ordering.
Furthermore, we establish that the presence of H-B motifs is
compatible with n-type charge transport in OFET devices.
2.2. Confocal Fluorescence Microscopy. Measurements were
performed on a Picoquant Microtime 200 inverted confocal
microscope, using a PicoHarp 300 multichannel single photon
counter and two MPD SPADs. The excitation originated from a
frequency doubled Ti-Sa laser (Coherent) tuned at 385 nm with
picosecond pulses (4-6 ps) at 4.76 MHz repetition rate. The laser
beam was injected by 90° reflection on a 80%T/20%R spectrally
flat beam splitter into the microscope objective (100× UPLSAPO,
N.A. 1.4). Linearly polarized excitation light was obtained with a
Babinet Soleil compensator. The emission was collected by
transmission through the same beam splitter and a suitable
interferential filter before being focused on a 50 µm pinhole. Parallel
and perpendicular components of the emitted light were split using
a polarizing beam splitter and two Glan-Thompson polarizers. The
instrumental G-factor is measured on the pertinent spectral range
(650-900 nm) using emission from the crystals and the relation G
) (IVVIHV/IVHIHH)
1/2, where the indexes H and V refer to the
horizontal and vertical position of the excitation (first index) or
emission (second index) polarizers, rotating the crystal by 90°
around the optical axis when the excitation polarization is changed
from V to H. After the pinhole, light can be diverted into an Andor
SR300i spectrometer equipped with a Newton EM-CCD for
spectroscopy measurements.
2. Experimental Section
2.1. Synthesis of 1. A chlorobenzene solution (200 mL) contain-
ing C60 (1.223 g, 1.62 mmol) was degassed by three freeze-pump-
thaw cycles. The solution was brought to reflux, and azido di-tert-
butylbenzyl barbiturate (276 mg, 0.81 mmol) in chlorobenzene (this
2.3. Crystal Structure Determination. Single crystals of 1 were
grown by the slow diffusion of chloroform into an o-dichloroben-
zene solution of 1 and belong to the triclinic space group with cell
parameters C79H25N3O3 ·CHCl3; MW )1183.4, a ) 9.952(2) Å, b
) 15.876(3) Å, c ) 15.877(3) Å, R ) 77.41(3)°, ꢀ ) 83.69(3)°, γ
) 88.42(3)°, V ) 2433(8) Å3, Z ) 2 and Fcalc ) 1.615 g Å cm-3
.
(5) (a) Gonzalez, J. J.; Gonzalez, S.; Priego, E. M.; Luo, C. P.; Guldi,
D. M.; de Mendoza, J.; Martin, N. Chem. Commun. 2001, 163. (b)
Rispens, M. T.; Sanchez, L.; Knol, J.; Hummelen, J. C. Chem.
Commun. 2001, 161. (c) Diederich, F.; Echegoyen, L.; Gomez-Lopez,
M.; Kessinger, R.; Stoddart, J. F. J. Chem. Soc., Perkin Trans. 2 1999,
1577.
Data were collected at 100(2) K on Proxima1 beamline at a
wavelength λ ) 0.8550 Å, with 2θmax ) 26.74° using ꢁ scans.
21128 reflections, 5465 independent, R(int) ) 0.0416. Data were
processed using the XDS package.13 The positions of non-H atoms
were determined by the program SHELXD, and the position of
the H atoms were deduced from coordinates of the non-H atoms
and confirmed by Fourier synthesis. H atoms were included for
structure factor calculations but not refined. The structure was
refined using SHELXL.14 Refinement statistics: goodness-of-fit on
F2 ) 1.657, final R indices [I > 2σ(I)], R1 ) 0.1122, wR2 ) 0.3345;
R indices (all data): R1 ) 0.1250, wR2 ) 0.3490. CCDC 742195
contains the supplementary crystallographic data for this paper.
These data can be obtained free of charge from The Cambridge
cif.
(6) (a) Shi, Z. Q.; Li, Y. L.; Gong, H. F.; Liu, M. H.; Xiao, S. X.; Liu,
H. B.; Li, H. M.; Xiao, S. Q.; Zhu, D. B. Org. Lett. 2002, 4, 1179. (b)
Zhuang, J. P.; Zhou, W. D.; Li, X. F.; Li, Y. J.; Wang, N.; He, X. R.;
Liu, H. B.; Li, Y. L.; Jiang, L.; Huang, C. S.; Cui, S.; Wang, S.; Zhu,
D. B. Tetrahedron 2005, 61, 8686. (c) Wessendorf, F.; Gnichwitz,
J. F.; Sarova, G. H.; Hager, K.; Hartnagel, U.; Guldi, D. M.; Hirsch,
A. J. Am. Chem. Soc. 2007, 129, 16057. (d) Figueira-Duarte, T. M.;
Gegout, A.; Nierengarten, J. F. Chem. Commun. 2007, 109. (e)
D’Souza, F.; Gadde, S.; Islam, D. M. S.; Pang, S. C.; Schumacher,
A. L.; Zandler, M. E.; Horie, R.; Araki, Y.; Ito, O. Chem. Commun.
2007, 480. (f) Sanchez, L.; Rispens, M. T.; Hummelen, J. C. Angew.
Chem., Int. Ed. 2002, 41, 838. (g) Eckert, J. F.; Nicoud, J. F.;
Nierengarten, J. F.; Liu, S. G.; Echegoyen, L.; Barigelletti, F.;
Armaroli, N.; Ouali, L.; Krasnikov, V.; Hadziioannou, G. J. Am. Chem.
Soc. 2000, 122, 7467. (h) Sary, N.; Richard, F.; Brochon, C.; Leclerc,
N.; Leveque, P.; Audinot, J. N.; Berson, S.; Heiser, T.; Hadziioannou,
G.; Mezzenga, R. AdV. Mater. 2010, 22, 763.
2.4. Preparation of OFET Devices. The SiO2/Si substrates were
cleaned in acetone and isopropyl alcohol for 30 min each and
transferred to a Jelight Company Inc. UVO Cleaner 42-220 for
surface cleaning for 5 min. C60 or 1 was thermally evaporated under
vacuum (ca. 1 × 10-6 mbar) onto the cleaned SiO2/Si substrates
heated at 44 °C for C60 and 57 °C for 1 during evaporation on an
Edwards Auto 306 evaporator. Film thicknesses were controlled
with a Temcor Alpha Step IQ tactile profilometer. The coated SiO2/
Si substrates were then transferred to an evaporator in a glovebox,
and calcium electrodes were deposited by thermal evaporation under
vacuum (1 × 10-6 mbar) through a shadow mask to define a round
device of 3 mm in diameter possessing a central gap of 25 µm in
width. The characterization was carried out using a Keithley 4200
(7) For a review of supramolecular fullerene chemistry, see: Sanchez, L.;
Martin, N.; Guldi, D. M. Angew. Chem., Int. Ed. 2005, 44, 5374.
(8) McClenaghan, N. D.; Absalon, C.; Bassani, D. M. J. Am. Chem. Soc.
2003, 125, 13004.
(9) (a) Huang, C. H.; McClenaghan, N. D.; Kuhn, A.; Hofstraat, J. W.;
Bassani, D. M. Org. Lett. 2005, 7, 3409. (b) Huang, C. H.;
McClenaghan, N. D.; Kuhn, A.; Bravic, G.; Bassani, D. M. Tetrahe-
dron 2006, 62, 2050.
(10) McClenaghan, N. D.; Grote, Z.; Darriet, K.; Zimine, M.; Williams,
R. M.; De Cola, L.; Bassani, D. M. Org. Lett. 2005, 7, 807.
(11) Korobov, M. V.; Smith, A. L. In Fullerenes: Chemistry, Physics, and
Technology; Kadish, K. M., Ruoff, R. S., Eds.; Wiley: London, 2000.
(12) Tsunashima, R.; Noro, S. I.; Akutagawa, T.; Nakamura, T.; Kawakami,
H.; Toma, K. Chem.sEur. J. 2008, 14, 8169.
(13) Sheldrick, G. M. Acta Crystallogr. 2008, A64, 112.
(14) Kabsch, W. J. Appl. Crystallogr. 1993, 26, 795.
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