212
M. Matsui et al. / Journal of Fluorine Chemistry 97 (1999) 207±212
3.5. Synthesis of 1-[4-[4-[N-ethyl-N-(2-
hydroxyethyl)amino]phenylazo]phenylthio]-2-[4-(4-
nitrophenylazo)phenylthio]perfluorocyclopentene
(5b)
3.8. X-ray crystallographic analysis
Single crystals of suitable quality for X-ray diffraction
were obtained from a mixed solution of chloroform and
hexane at room temperature. Intensity data were collected
on a MAC SCIENCE diffractometer by use of Mo Kꢄ
To an acetone±water mixed solution (1:1, 20 ml) of conc.
hydrochloric acid (0.34 ml, 4.1 mmol) was added 1-(4-
aminophenylthio)-2-[4-(nitrophenylazo)phenylthio]per-
¯uorocyclopentene 4b (0.50 g, 0.9 mmol). The mixture was
stirred for 1 h at room temperature and then cooled to 08C.
To the solution was added an aqueous solution (10 ml) of
sodium nitrite (0.077 g, 1.1 mmol) and the mixture was
stirred for 30 min at 08C. After the reaction, to the mixture
was added an acetone solution (15 ml) of N-ethylanilino-
ethanol (0.165 g, 1.0 mmol) and the mixture was stirred
for 1 h. The pH value of the mixture was adjusted at 7.0 with
an aqueous sodium hydroxide solution. The resulting pre-
cipitate was ®ltered, puri®ed by column chromatography
(SiO2, CH3COOC2H5), and recrystallized from a chloro-
form±hexane mixed solution. Yield 47%; mp 136±1388C;
1H NMR (CDCl3) ꢇ1.25 (t, J7.1 Hz, 3H), 1.60 (t,
J5.8 Hz, 1H), 3.55 (q, J7.1 Hz, 2H), 3.61 (t, J5.8 Hz,
2H), 3.89 (q, J5.8 Hz, 2H), 6.80 (d, J9.1 Hz, 2H), 7.56
(d, J8.5 Hz, 2H), 7.59 (d, J8.5 Hz, 2H), 7.81 (d,
J8.5 Hz, 2H), 7.86 (d, J9.1 Hz, 2H), 7.96 (d, J8.5 Hz,
2H), 8.05 (d, J9.1 Hz, 2H), 8.40 (d, J9.1 Hz, 2H); EIMS
Ê
radiation (ꢃ0.71073 A) in the range of 2ꢈ less than 538.
Altogether 6785 independent re¯ections were measured.
3498 Re¯ections of these intensities were exceeded their
standard deviations three times and considered as observed
to use in the structure determination. Throughout the
structure determination the program package CRYSTAN
GM (MAC SCIENCE) was used. Anisotropic thermal
vibrations were assumed for the non-hydrogen atoms. All
the hydrogen atoms, except the hydroxy hydrogen atoms,
were found from a difference Fourier map and re®ned
isotropically. The ®nal residual index R and weighted index
Rw were 0.072 and 0.064, respectively. The goodness-of-®t
was 1.246.
Table of the atomic coordinates and the temperature
factors will be obtained from the author with asterisk on
request.
References
[1] J.L. Oudar, J. Chem. Phys. 67 (1977) 446.
(70 eV) m/z (rel. intensity) 732 (M ; 13), 701 (60), 133
[2] T.-A. Chen, A.K.-Y. Jen, Y. Cai, Macromolecules 29 (1996) 535.
[3] D.H. Choi, H.M. Kim, W.M.K.P. Eijekoon, P.N. Prasad, Chem.
Mater. 4 (1992) 1253.
(100). Found: C, 54.13; H, 3.42; N, 11.44. Calcd. for
C33H26F6N6O2S3: C, 54.09; H, 3.58; N, 11.67.
[4] M. Amano, T. Kaino, Chem. Phys. Lett. 170 (1990) 515.
[5] K. Hirota, M. Hosoda, B. Joglekar, M. Matsui, H. Muramatsu, Jpn. J.
Appl. Phys. 32 (1993) L1811.
3.6. Film preparation
[6] B. Joglekar, K. Shibata, H. Muramatsu, M. Matsui, K. Hirota, M.
Hosoda, K. Tai, Polym. J. 29 (1997) 184.
The NLOphores (1.5 mol% in PMMA, 3.0 mol% in PC)
were dissolved in a dichloromethane solution of the polymer
matrix. The mixture was put on an ITO glass and spin-
coated (600 rpm, 20 s). After drying the ®lm under reduced
pressure overnight, the ®lms were poled (6 kV cm 1, 2 min)
at 110 (PMMA) and 1508C (PC). The thickness of the ®lms
were about 2000 (PMMA) and 1500 (PC) A, respectively.
After cooling the ®lm, the applied high voltage was
removed.
[7] K. Hirota, M. Hosoda, K. Tai, B. Joglekar, M. Matsui, H.
Muramatsu, Mol. Cryst. Liq. Cryst. 267 (1995) 83.
[8] T. Verbiest, D.M. Burland, M.C. Jurich, V.Y. Lee, R.D. Miller, W.
Volksen, Science 268 (1995) 1604.
[9] T. Yoshimura, J. Appl. Phys. 62 (1987) 2028.
[10] F. Pan, M.S. Wong, V. Gramlich, C. Bosshard, P. GuÈnter, J. Am.
Chem. Soc. 118 (1996) 6315.
Ê
[11] S.R. Morder, L.-T. Cheng, B.G. Tiemann, A.C. Friedli, M.B. Desce,
J.W. Perry, J. Skindhùj, Science 263 (1994) 511.
[12] H. Nakayama, R. Matsushima, N. Okamoto, A. Mizuno, O.
Sugihara, C. Egami, Appl. Phys. Lett. 69 (1996) 2813.
[13] Y. Kubo, S. Aramaki, Y. Okamoto, T. Murayama, J. Chem. Soc.,
Chem. Commun. (1995) 969.
3.7. Second harmonic generation (SHG) measurement
The SHG of the ®lm was measured by the Maker fringe
method using a Q-switched Nd:YAG laser (ꢃ1064 nm). A
1 mm thick y-cut quartz (d110.33 pm V 1) was used as the
reference. The second-order NLO coef®cient (d33) was
determined by the mean square methods using the relation-
ship of the second harmonic light intensity and the incident
angle of the poled ®lm as described in our previous papers
[14±16].
[14] M. Matsui, Y. Marui, M. Kushida, K. Funabiki, K. Shibata, H.
Muramatsu, K. Hirota, M. Hosoda, K. Tai, Dyes Pigm. 38 (1998)
57.
[15] M. Matsui, M. Kushida, K. Funabiki, K. Shibata, H. Muramatsu, K.
Hirota, M. Hosoda, K. Tai, Dyes Pigm. 37 (1998) 283.
[16] M. Matsui, R. Kawase, K. Funabiki, H. Muramatsu, K. Shibata, Y.
Ishigure, K. Hirota, M. Hosoda, K. Tai, Bull. Chem. Soc., Jpn. 70
(1997) 3153.