A/U Base Pairing at the Water-Solid-Interface
J. Am. Chem. Soc., Vol. 122, No. 1, 2000 89
dc
gold-coated substrates were allowed to cool under vacuum for ap-
proximately 30 min and were then immediately placed in solution of
the appropriate self-assembling adenine disulfide/alkylthiol binary
mixture or stored under argon. All adsorption processes were performed
in ethanol (Chromasolve, Riedel-de-Haen) with a concentration of 0.5
mM. The mole fraction of the adenine in the OH- or CH3-terminated
thiol was varied from 0 to 1 by mixing corresponding volumina taking
the side product of the thioester into account. The uridine as the binding
base to adenine and cytidine for testing of unspecific binding were
solved in milli-Q water (Millipore) as 0.5 mM solutions.
c ) ∆nd
dn
(1)
(D) Contact Angle Measurement. Advancing and receding contact
angles of water on the films were measured using a contact angle
microscope (Kru¨ss G-1) under ambient conditions, while the volume
of the drop is increased or decreased at the minimum rate required for
movement of the water/air/solid triple point.
(E) Spontaneous Desorption Time-of-Flight Mass Spectrometry
(SDMS). The measurements were performed using a linear time-of-
flight (TOF) mass spectrometer in high vacuum at a pressure of about
1 × 10-6 mbar. The self-assembled monolayers were deposited on 50
nm thick gold films evaporated on glass slides that were covered first
with a 2 nm chromium film to increase the mechanical stability. Atomar
and molecular ions from the sample were released by spontaneous
desorption, a secondary ion process in which the sample is not
bombarded by particles from an external source.27 Primary ions of
adsorbates are field-desorbed from the edges of an acceleration grid
located in front of the sample. These ions are accelerated toward the
sample gaining keV energies. They finally sputter secondary ions from
the sample, and these are analyzed with the TOF mass spectrometer.
Spectra of negative secondary ions are recorded using the simulta-
neously emitted secondary electrons from the sample surface as trigger
particles. An acceleration voltage of 9.5 kV was applied to the sample.
The recording time of a spectrum was 20-40 min. Within one spectrum
mass peaks of interest were integrated and normalized with the number
of start events with one or more corresponding stop events. This leads
to a relative ion yield that allows the comparison of the intensities of
equivalent peaks in different spectra.
(F) Multimode waveguide-PSP-coupling. To determine the thick-
ness and the refractive index of the SAM independently from each
other the recently published method of multimode waveguide-PSP-
coupling was used.23,28-36 An ion-exchanged buried multimode glass
channel waveguide was coated with a 40 nm thick gold film to enable
the coupling of the waveguide modes into the surface plasmon. Due to
the resonant PSP coupling the dispersion of the effective refractive
index of the waveguide mode and therefore the imaginary part of the
effective refractive index is altered, which leads to a change in the
transmitted light intensity of the waveguide modes. This intensity
change can be back-calculated via Fresnel theory to an average thickness
and an average refractive index of the SAM.23,37
The preparation of the waveguide surface plasmon (PSP, plasmon
surface polariton)-coupling device is described elsewhere.23
(B) Electrochemical Measurements. Electrochemistry was per-
formed on a NIKKO KEISOKU NPGFZ-2501-A potentio-galvanostat.
Working electrodes were typically 1 cm2 evaporated gold (2000 Å) on
tin-indium-oxide (ITO) glass. Monolayers of OHT and adenine
thiolate20 were prepared on the electrodes in the same manner as that
described above. A platinum wire was used as a counter electrode. A
saturated calomel electrode (SCE) was used as reference in all
electrochemical experiments. The potential was initiated at 0.00 V and
cycled at 50 mV/s between -1.45 and 0.00 V in 0.5 M aqueous KOH
solution. Deionized water, which was purified by passage through a
milli-Q filtration system, was used for all solution preparation. Solutions
were degassed with N2 for 15 min prior to the measurements.
(C) Surface Plasmon Spectroscopy (PSP, Plasmon Surface
Polariton). PSP measurements were performed to study the optical
film thickness of the SAM with respect to the concentration of the
adenine in the binary mixture of the self-assembly solution. Here the
Kretschmann configuration24 was used with a 50 nm gold film
evaporated onto a substrate, which is then optically matched to the
base of a 90° LaSFN9 glass prism (n )1.85 at λ ) 632.8 nm). Thus,
the plasmon surface polaritons are excited at the metal/dielectric
interface, upon total internal reflection of the laser beam (HeNe, λ )
632.8 nm, power 5 mW) at the prism base. By varying the angles of
incidence of the laser beam, a plot of reflected intensity as a function
of the angle of incidence is obtained. The reflected intensity shows a
sharp minimum at the PSP resonance angle which depends on the
precise architecture of the metal/dielectric interface and is defined by
the matching condition for energy and momentum between the
evanescent photons and the plasmon surface polariton. Adsorption
processes occurring at the gold interface were followed in real time by
selecting an appropriate angle of incidence and monitoring the reflected
intensity as a function of time. Knowledge of the form of the resonance
curve allows this intensity to be interpreted as a shift in the angle of
resonance.
From a Fresnel simulations to the resonance curve for bare gold
surfaces, it is possible to obtain the dielectric constant and the thickness
of the gold layer. Addition of a thin layer to the surface of the gold
typically shifts the position of the resonance to a higher angle, and a
simulation of this second resonance curve determines the optical
thickness, (nd), of the layer. Although plasmon surface polariton
measurements allow the determination of an average optical thickness
of an adsorbed film, accurate conversion of this optical thickness to a
geometrical thickness requires knowledge of the refractive index of
the film, a parameter which depends on both the molecular composition
of the film and the packing density. In practice, it is not possible to
distinguish between a thin film with a high refractive index and a film
twice as thick but with half the refractive index contrast in the medium.
For the data analysis here a refractive index of n ) 1.5 was chosen for
both the adenine thiolate and the diluting thiols, OHT and CH3T. The
data for the pure adenine thiolate and the pure OHT and CH3T
monolayers were evaluated using a concentration-dependent refractive
index measurement (dn/dc) of the materials in ethanol25 and calculate
the surface concentration c in [mol/cm2].26
Monolayer Characterization
Measurements. To find the optimum binding conditions at
the solid-water interface of the uridine the adenine thiolate is
laterally diluted by the OHT or CH3T.6,7 Due to the bulky
headgroup of the adenine disulfide, monolayers of the pure
adenine thiolate might not be very ordered and the structure of
the film not very well understood.38 Therefore, the mole fraction
x of the adenine within the self-assembly solutions was
systematically varied from pure OHT or CH3T solutions (x )
0) to pure adenine disulfide solutions (x ) 1).
The length of the anchor groups of the adenine disulfide and
the diluting thiols was chosen to achieve via van der Waals
(27) Voit, H.; Schoppmann, C.; Brandl, D. Phys. ReV. B 1993, 48, 17517.
(28) Lavers, C. R.; Wilkinson, J. S. Sens. Actuators, B 1994, 22, 75.
(29) Harris, R. D.; Wilkinson, J. S. Sens. Actuators, B 1995, 29, 261.
(30) Weiss, M. N.; Srivastava, R.; Groger, H.; Lo, P.; Luo, S.-F. Sens.
Actuators, A 1996, 51, 211.
(31) Ctyroky, J.; Homola, J.; Skalsky, M. Opt. Quantum Electron. 1997,
29, 301.
(32) Mouvet, C.; Harris, R. D.; Maciag, C.; Luff, B. J.; Wilkinson, J.
S.; Piehler, J.; Brecht, A.; Gauglitz, G.; Abuknesha, R.; Ismail, G. Anal.
Chim. Acta 1997, 338, 109.
(33) Brecht, A.; Gauglitz, G. Anal. Chim. Acta 1997, 347, 219.
(34) Homola, J.; Ctyroky, J.; Skalky, M.; Hradilova, J.; Kolarova, P.
Sens. Actuators, B 1997, 38-39, 286.
(35) Ctyroky, J.; Homola, J.; Skalsky, M. Electron. Lett. 1997, 33, 1246.
(36) Weisser, M.; Menges, B.; Mittler-Neher, S. SPIE 1998, 3414, 250.
(37) TRAMAX, University of Jena, Institut of Theoretical Optics, Max
Wien Platz 1, 07743 Jena, Germany.
(23) Weisser, M.; Menges, B.; Mittler-Neher, S. Sens. Actuators, B, in
press.
(24) Kretschmann, E. Opt. Commun. 1972, 6, 185.
(25) Becker, A.; Ko¨hler, W.; Mu¨ller, B. Ber. Bunsen-Ges. Phys. Chem.
1995, 99, 600.
(26) Miller, C. E.; Meyer, W. H.; Knoll, W.; Wegner, G. Ber. Bunsen-
Ges. Phys. Chem. 1992, 96, 869.
(38) Qian, J.; Hentschke, R.; Knoll, W. Langmuir 1997, 13, 7092.