Tribology of MEMS
18 (2000) p. 2433.
Proc. SPIE Materials and Device Characterization
in Micromachining, Vol. 3875, edited by Y.
Vladimirsky and C.R. Friedrich (SPIE—The
International Society for Optical Engineering,
Bellingham, WA, 1999) p. 61.
24. M.P. de Boer and T.A. Michalske, J. Appl.
Phys. 86 (1999) p. 817.
the U.S. Department of Energy under con-
tract No. DE-AC04-94AL85000.
13. B.K. Smith, J.J. Sniegowski, G. LaVigne, and
C. Brown, Sens. Actuators, A 70 (1998) p. 159.
14. W.R. Ashurst, C. Yau, C. Carraro, R.T. Howe,
and R. Maboudian, in Proc. Solid-State Sensor
and Actuator Workshop (Transducers Research
Foundation, Cleveland, 2000) p. 320.
References
1. J.J. Sniegowski and M.P. de Boer, Annu. Rev.
Mater. Sci. 30 (2000) p. 297.
2. C.H. Mastrangelo and C.H. Hsu, IEEE/ASME
J. MEMS 2 (1993) p. 33.
15. X.-Y. Zhu, V. Boiadjiev, J.A. Mulder, R.P.
Hsung, and R.C. Major, Langmuir 16(2000) p. 6766.
16. V. DePalma and N. Tillman, Langmuir 5
(1989) p. 868.
17. J.D. Kiely, J.E. Houston, J.A. Mulder, R.P.
Hsung, and X.-Y. Zhu, Tribol. Lett. 7 (1999) p. 103.
18. R.R. Rye, G.C. Nelson, and M.T. Dugger,
Langmuir 13(1997) p. 2965.
19. U. Srinivasan, J.D. Foster, U. Habib, R.T.
Howe, R. Maboudian, D.C. Senft, and M.T.
Dugger, Proc. Solid-State Sensor and Actuator
Workshop (Transducers Research Foundation,
Cleveland, 2000) p. 156.
20. S.S. Mani, J.G. Fleming, J.J. Sniegowski,
M.P. de Boer, L.W. Irwin, J.A. Walraven, D.M.
Tanner, and D.A. La Van, in Materials Science of
Microelectromechanical Systems (MEMS) Devices II,
edited by M.P. de Boer, A.H. Heuer, S.J. Jacobs,
and E. Peeters (Mater. Res. Soc. Symp. Proc. 605,
Warrendale, PA, 2000) p. 135.
25. M.P. de Boer, P.J. Clews, B.K. Smith, and
T.A. Michalske, in Microelectromechanical Struc-
tures for Materials Research, edited by S. Brown,
J. Gilbert, H. Guckel, R. Howe, G. Johnson, P.
Krulevitch, and C. Muhlstein (Mater. Res. Soc.
Symp. Proc. 518, Warrendale, PA, 1998) p. 131.
26. M.P. de Boer, J.M. Redmond, and T.A.
Michalske, in Proc. SPIE Materials and Device
Characterization in Micromachining, Vol. 3512
(SPIE—The International Society for Optical
Engineering, Bellingham, WA, 1998) p. 241.
27. B.T. Crozier, M.P. de Boer, J.M. Redmond,
D.F. Bahr, and T.A. Michalske, in Materials Science
of Microelectromechanical Systems (MEMS) De-
vices II, edited by M.P. de Boer, A.H. Heuer, S.J.
Jacobs, and E. Peeters (Mater. Res. Soc. Symp.
Proc. 605, Warrendale, PA, 2000) p. 129 .
28. R.W. Carpick and M. Salmeron, Chem. Rev.
97 (1997) p. 1163.
3. G.T. Mulhern, D.S. Soane, and R.T. Howe, in
Proc. 7th Int. Conf. on Solid-State Sensors and Ac-
tuators (Transducers ‘93) (IEEE Electron Devices
Society, Yokohama, Japan, 1993) p. 296.
4. H. Guckel, D.W. Burns, C.C.G. Visser, H.A.C.
Tilmans, and D. Deroo, IEEE Trans. Electron
Devices 35 (1988) p. 800.
5. S.A. Henck, Tribol. Lett. 3 (1997) p. 239.
6. J.R. Martin and Y. Zhao, U.S. Patent
No. 5,694,740 (1997).
7. R. Maboudian, Surf. Sci. Rep. 3 (1998) p. 209.
8. B.C. Bunker, R.W. Carpick, R. Assink, M.L.
Thomas, M.G. Hankins, J.A. Voigt, D.L. Sipola,
M.P. de Boer, and G.L. Gulley, Langmuir 16
(2001) p. 7742.
9. J.G. Kushmerick, M.G. Hankins, M.P. de Boer,
P.J. Clews, R.W. Carpick, and B.C. Bunker, Tribol.
Lett. 10 (1–2) (2000) p.103.
10. U. Srinivasan, M.R. Houston, R.T. Howe, and
R. Maboudian, IEEE/ASME J. MEMS 7 (1998)
p. 252.
11. M.P. de Boer, J.A. Knapp, T.A. Michalske,
U. Srinivasan, and R. Maboudian, Acta Mater.
48 (2000) p. 4531.
29. M. Salmeron, CHEMTECH (September 1998)
p. 17.
30. E. Barrena, S. Kopta, D.F. Ogletree, D.H.
Charych, and M. Salmeron, Phys. Rev. Lett. 82
(1999) p. 2880.
21. M.P. de Boer, N.F. Smith, N.D. Masters,
M.B. Sinclair, and E.J. Pryputniewicz, in ASTM
STP 1413 (2001) in press.
22. B.D. Jensen, M.P. de Boer, N.D. Masters,
F. Bitsie, and D.A. La Van, IEEE/ASME J. MEMS
(2001) in press.
31. H.I. Kim, M. Graupe, O. Oloba, T. Koini, S.
Imaduddin, T.R. Lee, and S.S. Perry, Langmuir
12. T.M. Mayer, M.P. de Boer, N.D. Shinn, P.J.
Clews, and T.A. Michalske, J. Vac. Sci. Technol., B
23. B.D. Jensen, M.P. de Boer, and F. Bitsie, in
15 (1999) p. 3179.
ꢀ
Abstract Deadlines — In fairness to all potential authors, late abstracts will not be accepted.
June 5, 2001: for abstracts sent via fax or mail
ꢁ
June 19, 2001: for abstracts sent via the MRS Web site
ꢀ
Materials Development
Characterization Methods
Process Technology
2001 MRS FALL MEETING
ꢀ
ꢀ
New
MEETING ACTIVITIES
SYMPOSIA
Inorganic Electronic Materials and Devices
T: Statistical Mechanical Modeling in Materials
Research
U: Advanced Fibers, Plastics, Laminates, and
Composites
Symposium Tutorial Program
A: Materials Issues in Novel Si-Based Technology
B: Materials Science of Microelectromechanical
Systems (MEMS) Devices IV
Available only to meeting registrants, the symposium tutorials
will concentrate on new, rapidly breaking areas of research.
C: Ferroelectric Thin Films X
Nanoscale Materials and Processes
Exhibit and Research Tools Seminars
D: Polarization Dynamics in Ferroic Materials
E: Materials for High-Temperature
Superconductor Technologies
V: Nanophase and Nanocomposite Materials IV
W: Nanoparticulate Materials
Y: Nanopatterning—From Ultralarge-Scale Integration
to Biotechnology
Z: Making Functional Materials with Nanotubes
AA: Self-Assembly Processes in Materials
Over 225 international exhibitors will diplay a full spectrum of
equipment, instrumentation, products, software, publications,
and services. Research Tools Seminars, an educational seminar
series that focuses on the scientific basis and practical applica-
tion of commercially available, state-of-the-art tools, will be held
again this fall.
and
Exhibit
F: Spintronics
G: Thermoelectric Materials 2001—
Research and Applications
Photonic/Optoelectronic Materials and Devices
Organic/Biological Materials and Devices
H: Progress in Semiconductor Materials for
Optoelectronic Applications
I: GaN and Related Alloys
J: Materials Engineering for Solid-State Lighting
K: Microphotonics–Materials, Physics, and Applications
For additional meeting information,
visit the MRS Web site at
BB: Organic Optoelectronic Materials, Processing,
and Devices
CC: Advances in Liquid Crystalline Materials and
Technologies
DD: Polymer Interfaces and Thin Films
EE: Electroactive Polymers and Their Applications as
Actuators, Sensors, and Artificial Muscles
FF: Physical Characterization of Biological Materials
and Systems
GG: Polymeric Biomaterials for Tissue Engineering
HH: Bio-Inspired Materials—Moving Towards
Complexity
Publications Desk
A full display of over 700 books, plus videotapes and electronic
databases, will be available at the MRS Publications Desk.
or contact:
Thin Films and Surfaces
Symposium Assistant Opportunities
L: Thin Films–Stresses and Mechanical Properties IX
M: Surface Science and Thin-Film Growth in Electrolytes
N: Current Issues in Heteroepitaxial Growth—Stress
Relaxation and Self Assembly
O: Complex Oxide Heteroepitaxy
P: Advances in Surface Engineering—Fundamentals
and Applications
Graduate students planning to attend the 2001 MRS Fall
Meeting are encouraged to apply for a Symposium Assistant
(audio-visual assistant) position.
Member Services
Materials Research Society
Employment Center
Materials and Society
506 Keystone Drive
Warrendale, PA 15086-7573
Tel 724-779-3003
Materials Science, Processing, and Evaluation
An Employment Center for MRS meeting attendees will be
open Tuesday through Thursday.
II: Materials Issues in Art and Archaeology VI
JJ: Scientific Basis for Nuclear Waste Management XXV
KK: Design, Characteristics, and Properties of
Cementitious Materials
Q: Rapid Prototyping Technologies—Tissue Engineering
to Conformal Electronics
R: Electrically Based Microstructural Characterization III
S: Combinatorial and Artificial Intelligence Methods
in Materials Science
Fax 724-779-8313
E-mail: info@mrs.org
X: Frontiers of Materials Research
01-0024
The 2001 MRS Fall Meeting will serve as a key forum for discussion of interdisciplinary leading-edge materials research from around the world.
Various meeting formats—oral, poster, round-table, forum and workshop sessions—are offered to maximize participation.
304
MRS BULLETIN/APRIL 2001