Bis(r-diimine)nickel Complexes
Scheme 2. New Complexes of Nickel and Zinc Complexes from
References 7 and 8
stirred for 1 h. A light green precipitate formed which was washed
with n-hexane (2 × 5 mL) and dried in vacuo. Yield: 0.20 g (80%).
X-ray quality crystals were obtained by slow diffusion of n-pentane
into a concentrated solution of 3 in CH2Cl2. Anal. Calcd for
C28H40N4F12NiP2: C, 43.04; H, 5.12; N, 7.17; Ni, 7.51; P, 7.84.
Found: C, 43.01; H, 5.46; N, 6.95; Ni, 7.25; P, 7.54.
[NiII(LOx)2(THF)(FPF5)](PF6)‚THF (4). To a solution of 1 (200
mg, 0.4 mmol) in THF (10 mL) was added ferrocenium hexafluo-
rophosphate (260 mg, 0.8 mmol) with stirring for 1.5 h at 20 °C.
The dark red color of the solution immediately turned to light green.
The resulting solution was filtered, and the filtrate was concentrated
to ∼1 mL by evaporation of the solvent under reduced pressure.
n-Hexane (10 mL) was added, and the resulting suspension was
stirred for 1 h. A slightly green precipitate was formed, washed
with n-hexane, and dried in vacuo. Yield: 0.15 g (80%). X-ray
quality crystals were obtained by slow diffusion of n-pentane
into a concentrated solution of 4 in THF. Anal. Calcd for
C36H56N4F12NiO2P2: C, 47.72; H, 6.10; N, 6.05. Found: C, 47.55;
H, 6.08; N, 5.82.
X-ray Crystallographic Data Collection and Refinement of
the Structures. A dark red single crystal of 1, a dark blue crystal
of 2, and greenish yellow crystals of 3 and 4‚THF were coated
with perfluoropolyether, picked up with nylon loops, and mounted
in the nitrogen cold stream of the diffractometer. A Bruker-Nonius
Kappa-CCD diffractometer equipped with a Mo-target rotating-
anode X-ray source and a graphite monochromator (Mo KR, λ )
0.71073 Å) was used. Final cell constants were obtained from least-
squares fits of all measured reflections. Intensity data of 2, 3, and
4 were corrected for absorption using intensities of redundant
reflections.
The structures were readily solved by direct methods and
subsequent difference Fourier techniques. The Siemens ShelXTL28
software package was used for solution and artwork of the structure;
ShelXL9729 was used for the refinement. All non-hydrogen atoms
were refined anisotropically, except for a disordered tetrahydrofuran
solvent molecule in 4 which was split on three positions and
isotropically refined. Hydrogen atoms were placed at calculated
positions and refined as riding atoms with isotropic displacement
parameters. Crystallographic data of the compounds are listed in
Table 1.
The ligand 2-phenyl-1,4-bis(isopropyl)-1,4-diazabutadiene was
synthesized according to published procedures.27
[NiII(L•)2] (1). To a solution of Ni(COD)2 (1 g, 3.63 mmol) (COD
) cyclooctadiene) in diethyl ether (20 mL) under an argon
blanketing atmosphere was added a solution of 2-phenyl-1,4-bis-
(isopropyl)-1,4-diazabutadiene (1.58 g, 7.27 mmol) in diethyl ether
(10 mL). The reaction mixture was stirred overnight at room
temperature. The color of the solution changed from yellow to deep
red. The solvent was removed by evaporation under reduced
pressure to give a dark red precipitate which was washed with
acetonitrile and dried in vacuo. Yield: 1.40 g (78%). X-ray quality
crystals were obtained by slow evaporation of the solvent from a
concentrated solution of 1 in acetonitrile. Anal. Calcd for
C28H40N4Ni: C, 68.47; H, 8.15; N, 11.41; Ni, 11.97. Found: C,
68.31; H, 8.21; N, 11.64; Ni, 11.22.
1H NMR (400 MHz, toluene-d8): δ (ppm) ) 1.75 (d, 3J ) 6.31,
6H, iPr-CH3), 1.91 (d, 3J ) 6.49, 6H, iPr-CH3), 1.89 (d, 3J ) 6.31,
3
3
6H, iPr-CH3), 1.90 (d, J ) 6.49, 6H, iPr-CH3), 2.65 (sept, J )
6.49, 2H, iPr-CH), 3.66 (sept, 3J ) 6.31, 2H, iPr-CH), 6.9 (m, 4H,
C6H5), 7.05 (m, 4H, C6H5), 7.16 (m, 2H, C6H5), 8.75 (s, 2H, NCH).
[NiI(LOx)2] PF6 (2). To a solution of 1 (200 mg, 0.40 mmol) in
CH2Cl2 (10 mL) was added ferrocenium hexafluorophosphate (130
mg, 0.40 mmol) with stirring for 1.5 h at 20 °C. The dark red color
of the solution immediately turned to dark violet. The resulting
solution was filtered, and the filtrate was concentrated to ∼1 mL
by evaporation of the solvent under reduced pressure. n-Hexane
(10 mL) was added, and the resulting suspension was stirred for 1
h. A dark violet precipitate was formed, washed with n-hexane (2
× 5 mL), and dried in vacuo. Yield: 0.20 g (80%). X-ray quality
crystals were obtained by slow diffusion of n-pentane into a
concentrated solution of 2 in THF. MS (ESI, pos ion, CH2Cl2),
m/z ) 490 {2 - PF6}+. Anal. Calcd for C28H40N4F6NiP: C, 52.5;
H, 6.29; N, 8.8; F, 17.93; Ni, 9.23; P, 4.87. Found: C, 52.76; H,
6.24; N, 8.89; F, 17.83; Ni, 9.37; P, 4.76.
Disorder was found in all four structures. The asymmetric unit
in 1 contains two crystallographically independent molecules of
which the one containing Ni(1) had disordered isopropyl groups
which were split on two positions in a 56:44 and 73:27 ratio,
respectively. Corresponding atoms were restrained to have the same
distances and thermal displacement parameters. The structure of 2
was fully refined in the enantiomorphic space groups P3121 (No.
152) and P3221 (No. 154). The R-factor and Flack30 parameters
were slightly lower for the solution in P3121, and therefore, this
space group was chosen. The PF6- anion lying on a crystallographic
2-fold axis was found to be disordered and was split on two
positions in a 69:31 ratio. The P-F and F-F distances were
restrained to be equal within errors, and equivalent thermal
displacement parameters were used for neighboring split atoms.
Similar problems occurred in the structure of 3 in which the
[NiII(LOx)2(FPF5)](PF6) (3). To a solution of 1 (300 mg, 0.61
mmol) in CH2Cl2 (10 mL) was added ferrocenium hexafluorophos-
phate (400 mg, 1.22 mmol) with stirring for 1.5 h at 20 °C. The
dark red color of the solution immediately turned to light green.
The resulting solution was filtered, and the filtrate was concentrated
to ∼1 mL by evaporation of the solvent under reduced pressure.
n-Hexane (10 mL) was added, and the resulting suspension was
-
isopropyl group attached to N(24), and the uncoordinated PF6
anion was split in a 91:9 ratio. A total of 25 restraints was used to
equal distances and displacement parameters using EADP, SADI,
(28) ShelXTL V.5; Siemens Analytical X-Ray Inst. Inc.: Madison, WI, 1994.
(29) Sheldrick, G. M. ShelXL97; University of Go¨ttingen: Go¨ttingen,
Germany, 1997.
(27) Armesto, D.; Bosch, P.; Gallego, M. G.; Martin, J. F.; Ortiz, M. J.;
(30) (a) Flack, H. D. Acta Crystallogr. 1983, A39, 876-881. (b) Bernadelli,
Perez-Ossorio, R.; Ramos, A. Org. Prep. Proced. Int. 1987, 19, 181.
G.; Glack, H. D. Acta Crystallogr. 1985, A41, 500-511.
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