Published on Web 12/22/2004
Direct Observation of Growth Defects in Zeolite Beta
Paul A. Wright,*,† Wuzong Zhou,*,† Joaquin Pe´rez-Pariente,‡ and Mar Arranz‡
School of Chemistry, UniVersity of St. Andrews, Purdie Building, North Haugh, St. Andrews, Fife KY16 9ST, U.K.,
and Instituto de Catalisis y Petroleoquimica, CSIC, 28049 Cantoblanco, Madrid, Spain
Received October 5, 2004; E-mail: paw2@st-andrews.ac.uk (P.A.W.); wzhou@st-andrews.ac.uk (W.Z.)
Zeolite beta is one of the most useful high silica zeolites, its
interconnected large pore network and strong acidity giving it
special catalytic properties. The elucidation of its structure solved
a longstanding problem in zeolite crystallography.1-3 Beta is highly
disordered, made up of a random intergrowth of two end-member
structures, polytypes A and B of Figure 1, defined by the mode of
stacking of complex silicate chain units. Each chain unit is stacked
at right angles to chains in the layer below and parallel to other
Figure 1. Beta polytypes A (tetragonal, P4122, left) and B (monoclinic
C2/c, right). Selected units in consecutively stacked layers are shown in
blue.
chain units in the same layer. Large pore channels, delimited by
12-MR pores, run parallel to and between adjacent chain units. If
two different stacking directions were to occur within the same
layer, the frameworks of the two stacking variants would be unable
A and B. Figure 2a shows regions in which the stacking vector
to connect at the boundary. This was taken to explain the observed
(equal to 1/3 of the in-layer repeat) is in the same direction for seven,
crystal morphology and also the anomalously large number of defect
eight and nine successive layers, at least in projection. There are
silanols reported for zeolite beta samples.2 No direct observation
also smaller regions involving five layers where the projection of
of intracrystalline defects of this sort has been reported, however.
the stacking vector alternates regularly (as it does in polytype A).
Electron microscopy is the most powerful technique for elucidating
Closer inspection also reveals defects that result from adjacent parts
defect structures;4 here, we show HRTEM evidence for such defects,
of the same layer being related by opposite stacking vectors to a
shedding light on the crystallization mechanism of zeolite beta and
common layer below. This is most easily seen from the different
its physical properties.
stacking of the large pores (the large white areas in the image).
For the case where the displacements are in opposite directions,
A sample of pure silica beta was prepared via the fluoride route,
according to published procedures,5 using dimethyldibenzylammo-
the layers are observed to come back into registry after three added
nium as template. XRD confirmed the bulk material as beta; SEM
layers (Figure 2c). The structure of such defects can be modeled
showed truncated tetragonal bipyramidal crystals 30 µm long with
in more detail by starting from a layer typical of the beta structure
and then adding building units with the two different stacking
some amorphous silica. HRTEM was performed using a JEOL
JEM-2011 electron microscope operating at 200 kV, with a point
orientations next to each other. The stacking direction perpendicular
resolution of 0.19 nm. The sample is electron beam sensitive, so
to the plane of the paper for this defect is assumed to be in the
the microscopic conditions were pretuned and orientation of the
same direction for the two domains over this region. This is likely
crystal was adjusted at low magnification until a principal zone
since short range order is common. The next layer cannot be
axis was found. Images were recorded at 600 000× using a Gatan
completed, but continued growth of the two regions with the same
two vectors does enable the subsequent layer to overgrow (Figures
2d and 3). Growth onto this layer can then take place with either
794 CCD camera at very low beam brightness.
HRTEM (Figure 2) reveals the disordered stacking sequence of
layers (and 12-membered ring pores) characteristic of zeolite beta.
stacking direction.
Beta is made up of layers of chain units stacked perpendicular to
The interrupted structure results in Q3 silicons (Si(-OSi-)3OH)
lining the defect as shown in the model, which were made using a
kit with atomic centers of appropriate geometry (Figure 3). Silanol
hydroxyls are known to be a marked feature of beta materials.2
The model shows remarkable agreement with the image. The
predicted arrangement of two pores, double and one-and-a-half
those of the layer below, a regular distance (a) apart, so that each
one is translated by (a/3 relative to the unit below. There is
therefore a family of possible end-members with different stacking
sequences,6 including polytypes A (chain stacking vectors +a/3;
-a/3; +a/3, etc.) and B (stacking +a/3; +a/3, ... along the related
direction). The projections (along a common direction relative to
times as large as the usual large 12-MR pore, is mirrored.
the layers of the two polytypes, i.e., [100] for polytype A) are shown
Furthermore, careful inspection of the secondary detail is also in
in Figure 1. Projections do not distinguish between polytypes which
agreement. Fourier averaging of a “perfect” region of the structure
have different stacking vectors for the chain units running parallel
gives the image in Figure 2b. At this resolution, it is possible to
to the plane of the paper. It is similarly not possible from TEM
resolve, in addition to the large pores, the areas of low projected
images to determine the direction of stacking perpendicular to the
electron density that result from six-, five-, and even four-membered
page. However, the image (Figure 2) does reveal nanodomains
rings. Building units made up from four 5-MRs and one 6-MR in
ordered in two dimensions. The microstructure observed here is
projection (outlined in Figure 1) are observed to stack in the same
similar to that of typical samples of beta1,2 or its natural counterpart,
orientation. Although the image of the defects (Figure 2c) is noisier
disordered tschernichite,7 with a structure related to end-members
(their irregular distribution prevents Fourier averaging), it is possible
to make out the orientation of building units of this type. Going
through each defect along a layer, we observe that the orientation
† University of St. Andrews.
‡ Instituto de Catalisis y Petroleoquimica.
9
494
J. AM. CHEM. SOC. 2005, 127, 494-495
10.1021/ja043948s CCC: $30.25 © 2005 American Chemical Society