Journal of Chemical Physics p. 2213 - 2224 (1989)
Update date:2022-08-10
Topics:
Weber, M. E.
Armentrout, P. B.
Guided ion-beam techniques are used to measure the cross sections for reaction of SiF4 with Ar+, Ne+, and He+ from thermal to 50 eV.Charge transfer followed by loss of F atoms are the sole processes observed.All SiFx+
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