Journal of The Electrochemical Society, 149 ͑5͒ A607-A614 ͑2002͒
A613
Table III. Diffusion coefficient data for chromium in different sealants determined from the diffusion across the interface of selected sealants
with the ODS alloy under different conditions of annealing.
Diffusion coefficient (cm2 sϪ1
)
Sealant
Kind of glass
Heat-treatment
900°C/380 h
780°C/3 h ϩ 900°C/500 h
780°C/3 h ϩ 900°C/500 h
780°C/3 h ϩ 900°C/500 h
900°C/12 h
900°C/50 h
900°C/100 h
1000°C/24 h
1000°C/50 h
MAS
5% Al2O3
10% Al2O3
2.0ϫ10Ϫ14
1.56ϫ10Ϫ14
1.56ϫ10Ϫ14
3.1ϫ10Ϫ13
1.56ϫ10Ϫ14
3.5ϫ10Ϫ14
2.4ϫ10Ϫ14
1.1ϫ10Ϫ12
1.2ϫ10Ϫ12
MAS10
MAST10
MAST5
MAST5
MAST5
MAST5
MAST5
MAST5
10% Al2O3 ,2% TiO2
5% Al2O3 ,2% TiO2
5% Al2O3 ,2% TiO2
5% Al2O3 ,2% TiO2
5% Al2O3 ,2% TiO2
5% Al2O3 ,2% TiO2
5% Al2O3 ,2% TiO2
energy loss spectroscopy ͑EELS͒ at the interfaces of chromium/
alkaline earth boroaluminosilicate glasses. An important observation
of their EELS studies is that the initial oxidized layer consists of
Cr2ϩ ions, which possess high oxygen affinity, and is therefore con-
sidered to be chemically very active. If such a preoxidized layer is
joined with the magnesium aluminosilicate glass, there is a strong
tendency of the Cr2ϩ ion to go to higher valence states than 2ϩ. The
magnesium ion being a modifier ion has relatively high mobility.
Driven by the difference in the heats of oxide formation, ion ex-
change between Cr2ϩ and Mg2ϩ could occur, giving rise to metallic
magnesium and higher oxidation states of chromium. The close af-
finity between magnesium and chromium ions has already been
demonstrated by our SEM/EDX and TEM/EDX studies ͑cf. previous
section͒. Therefore, it is expected that magnesium will segregate at
the interface, having two effects: (i) the magnesium-rich layer will
form a barrier layer for the diffusion of chromium and (ii) the
SiO 4ϩ tetrahedral network will be severely distorted, thereby fur-
2. If the time of heat-treatment at a fixed temperature for a par-
ticular sample is varied, it was observed that the diffusion coefficient
decreases with increasing time for the heat-treatment ͑cf. results for
sealant MAST5͒. This can be explained by the crystallization of the
glass which restricts the movement of ions.
3. If the temperature of heat-treatment is varied but the duration
was kept fixed ͑cf. results of sealant MAST5 at 900°C over 50 h and
at 1000°C over 50 h͒, the diffusion coefficient is high for high
temperatures as expected.
4. For the interface of MAST5 ϩ ODS, with a preoxidized sur-
face of ODS, the diffusion coefficient amounts to
8
ϫ 10Ϫ14 cm2 sϪ1 ͑not shown in Table III͒, which is much less com-
pared to the value without preoxidation, which amounts to 1.2
ϫ 10Ϫ12 cm2 sϪ1. Both the samples were given the same heat-
treatment ͑1000°C for 50 h͒. This aspect is also reflected by Fig. 8
as discussed previously. Thus, the diffusion of chromium can be
reduced substantially by preoxidizing the surface of ODS before
making the interface.
͓
͔
4
ther reducing the open structure and increasing the viscosity of the
sealant inhibiting diffusion of chromium.
Conclusion
Figure 9 shows typical diffusion profiles of different cations at
the interface of ͑a͒ MAS ϩ ODS, and ͑b͒ MAST5 ϩ ODS an-
nealed at 900°C for 380 and 12 h, respectively. The two diffusion
profiles exhibit essentially similar features. The main diffusing ions
are chromium from ODS as well as Mg from the sealant. These
elements are present in significant amounts within the reaction layer.
This is in agreement with the formation of spinel phase in the reac-
tion layer containing magnesium and chromium ions, subsequently
suppressing the formation of cordierite. However, cristobalite, an-
other detrimental phase, is formed instead ͑see Table II͒.
From the diffusion profile of chromium across the interface of
ODS with different sealants, the diffusion coefficient was estimated.
The results are presented as relative atomic fraction vs. distance into
the reaction layer from the ODS to the glass side. The concentration
of Cr decreases from the ODS surface into the diffusion layer with
respect to time. The concentration of Mg decreases from sealant to
the ODS side. From the diffusion profile of the diffusing cations the
diffusion coefficient is evaluated by using the following relation
The chemical interactions between different aluminosilicate base
glass sealants and components on the anode side of SOFCs have
been investigated. The sealants with BaO and CaO as network modi-
fiers are not found suitable due to extensive crystallization and re-
action at the interfaces. MgO base glasses, which have been studied
in more detail with varying alumina content or with TiO2 as nucle-
ating agent, offer better possibilities. The formation of detrimental
phases such as cordierite and cristobalite was observed in different
powder mixtures and diffusion couples. We have made an attempt to
get insight into the conditions under which these phases are formed.
The implication of these investigations is that the formation of these
phases can be avoided by suitably choosing the composition and the
nucleating agent. The interdiffusion investigations reveal that the
diffusion of chromium is maximum across the interfaces of sealant/
interconnect. A rough estimate suggests that chromium may diffuse
up to 0.9 mm in a time period of 50,000 h if operated at 1000°C,
which is considered the lifetime of SOFCs.
The Institute for Materials and Processing in Energy Systems,
Forschungszentrum Julich GmbH, assisted in meeting the publication costs
of this article.
c x,t͒
x
͑
¨
ϭ 1 Ϫ erf
͓1͔
ͫ
ͬ
c0
2ͱDt
References
where c(x,t) is the concentration of ions at the distance, x, from the
surface of Cr5Fe1Y2O3 for a given diffusion time period, t. The
term c0 is the initial concentration of ions and D the diffusion co-
efficient. The term erf stands for error function and its values vary
from 0 to 1 for varying values of x2/4Dt between 0 and 3. The
diffusion coefficient of Cr in the sealants of the diffusion couples are
summarized in Table III.
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1. Diffusion couples of different sealants given the same heat-
treatment yield essentially similar values for the diffusion coeffi-
cients.
¨
5. C. Gunther, G. Hofer, and W Kleinlein, in Solid Oxide Fuel Cells V, U. Stimming,
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