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incorporation of trace Cu atoms in Pd matrix can form the
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ASSOCIATED CONTENT
Supporting Information. Detailed experimental section,
characterization methods, and additional material
characterizations. This material is available free of charge via
AUTHOR INFORMATION
Corresponding Author
*yjxiong@ustc.edu.cn
Author Contributions
These authors contributed equally.
Notes
The authors declare no competing financial interest.
ACKNOWLEDGMENT
This work was financially supported in part by 973 Program
(No. 2014CB848900), NSFC (No. 21471141, U1532135,
21601173), CAS Key Research Program of Frontier Sciences
(QYZDB-SSW-SLH018), Recruitment Program of Global
Experts, CAS Hundred Talent Program, Anhui Provincial
Natural Science Foundation (1608085QB24), and China
Postdoctoral Science Foundation (2015T80660). XAFS
measurements were performed at the beamline BL14W1 in
the Shanghai Synchrotron Radiation Facility (SSRF), China.
DRIFTS and XPS measurements were performed at the
Infrared Spectroscopy and Microspectroscopy Endstation
(BL01B) and the Photoemission Endstation (BL10B) in the
National Synchrotron Radiation Laboratory (NSRL) in
Hefei, China, respectively.
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