DOI: 10.1039/C9DT00795D
Dalton Transactions
ARTICLE
Journal Name
reduction were performed using the Agilent Technologies
5
0
CrysAlisPro. The structure of
3 was solved by direct methods
Notes and references
Department of Chemistry, The University of Texas at Austin, Austin, TX
5
1
using the SIR2014 program and refined by full-matrix least-
a
2
squares on F with anisotropic displacement parameters for all
non-H atoms using SHELXL-2013.5 The structural analyses
2
78712, USA.
b
were performed using the PLATON9853 and WinGX
54
Intel Corporation, Portland, OR 97124, USA.
c
programs. The hydrogen atoms were placed in fixed, calculated
positions with isotropic displacement parameters set to 1.2 x Ueq Campbell Rd, Richardson, TX 75080, USA. E-mail: slinker@utdallas.edu
*
with respect to the attached atom. Crystallographic images were
d
Department of Physics, Oklahoma State University, Stillwater, Oklahoma,
created using the Mercury55 and rendered using POV-ray.
56
USA, 74078
e
Qorvo, Inc., 500 W. Renner Rd., Richardson, TX 75080, USA.
Device preparation and characterization
f
BJH Chemical Consulting, Austin, TX 78735.
The overall LEEC device composition is as follows:
†
Electronic Supplementary Information (ESI) available: X-ray crystal data
ITO/PEDOT:PSS/Active Layer/LiF/Al. Active layers of
3
were
was
and structure refinement of
electrochemical CVs.
3, UV-Vis absorption spectra, and
tested with and without the 0.3% LiPF salt additive. LiPF
6
6
purchased from Sigma Aldrich in the highest available purity and
used as received. Prepatterned ITO-coated glass substrates were
purchased from Thin Film Devices, Anaheim, CA. These
substrates were cleaned in a non-ionic detergent and water bath,
followed by UV ozone treatment. Aqueous PEDOT:PSS
solutions (1.3 – 1.7%, Clevios AI 4083) were filtered through a
1
2
3
4
C. S Peyratout, T. K. Aldridge, D. K.Crites and D. R. McMillin, Inorg.
Chem. 1995, 34, 4484.
S. W. Thomas III, K. Venkatesan, P.Müller and T. M. Swager, J. Am.
Chem. Soc. 2006, 128, 16641.
0.45 μm GHP filter and then spin coated (~20 nm thick) onto the
D. Zhang, L.-Z. Wu, L.Zhou, X. Han, Q.-Z. Yang, L.-P. Zhang and C.-
H. Tung, J. Am. Chem. Soc. 2004, 126, 3440.
ITO-coated glass substrates. The substrates were subsequently
transferred into a dry nitrogen glovebox for further processing
H. Ozawa, M.-A. Haga and K. Sakai J. Am. Chem. Soc. 2006, 128
4926.
,
and characterization. Separate solutions of
6
3 and LiPF were
each prepared at a concentration of 24 mg/mL in degassed
acetonitrile inside the glovebox. For the devices with the 0.3%
LiPF additives, these LiPF salt and iTMC solutions were
6 6
subsequently mixed at a volume ratio of 3 to 997, respectively.
The final solutions were then heated on a hotplate at 85 °C while
stirring for 10 minutes and allowed to cool down to room
temperature before being passed through a 0.1 μm nylon filter.
5
6
7
K. Sakai, H. Ozawa, Coord. Chem. Rev. 2007, 251, 2753.
H. Ozawa and K. Sakai Chem. Commun. (Camb). 2011, 47, 2227.
X. Wang, S. Goeb, Z. Ji, N. A. Pogulaichenko and F. N. Castellano
Inorg. Chem. 2011, 50, 705.
8
9
1
1
M. Kobayashi, S. Masaoka and K. Sakai, Angew. Chemie - Int. Ed.
2012, 51, 7431.
6
The iTMC films, with and without LiPF , were spin cast at 900
rpm and thermally annealed at 120 °C for 1 hour. The active
layers were generally ~100 nm thick. Then the samples were
transferred to a vacuum chamber, where 10 Å of LiF and 800 Å
of Al were deposited through a shadow mask that defined 12
B. W. D’Andrade, J. Brooks, V. Adamovich, M. E. Thompson and S.
R. Forrest, Adv. Mater. 2002, 14, 1032.
0 W. Lu, B.-X. Mi, M. C. W. Chan, Z. Hui, C.-M. Che, N. Zhu and S.-
T. Lee, J. Am. Chem. Soc. 2004, 126, 4958.
2
devices per substrate, each with a 3 mm active area.
1 W.-Y. Wong, Z. He, S.-K. So, K.-L. Tong and Z. Lin,
Organometallics 2005, 24, 4079.
The electrical and radiant flux characteristics were obtained
with a custom LEEC multiplexer testing station capable of
measuring 16 device slides simultaneously. In brief, this 12 J. E. McGarrah and R. Eisenberg, Inorg. Chem. 2003, 42, 4355.
instrument served as a current or voltage source and measuring 13 Y. Shao and Y. Yang, Adv. Mater. 2005, 17, 2841.
unit and captured radiant flux with a calibrated Hamamatsu
1
4 W.-Y. Wong, X.-Z. Wang, Z. He, A. B. Djurisić, C.-T. Yip, K.-Y.
Cheung, H. Wang, C. S. K. Mak and W. K. Chan, Nat. Mater. 2007,
photodiode (S2387-1010R) for each device. The device slides
were driven at a constant current of 1.5 mA (10 V compliance).
These results were verified against measurements obtained with
a 760D electrochemical analyzer from CH Instruments (Austin,
TX) and a calibrated Labsphere integrating sphere, equipped
6
, 521.
1
5 S.-W. Lai, M. C.-W. Chan, T. C. Cheung, S.-M. Peng and C.-M. Che,
Inorg. Chem. 1999, 38, 4046.
with a thermoelectric cooled silicon photodetector and Keithley 16 B. Ma, J. Li, P. I. Djurovich, M. Yousufuddin, R. Bau and M. E.
6
485 Picoammeter. Electroluminescence spectra were measured
Thompson, J. Am. Chem. Soc. 2005, 127, 28.
from thin film single layer devices with an Ocean Optics Jazz
fiber spectrometer.
1
1
1
2
7 S. Cho, M. W. Mara, X. Wang, J. V. Lockard, A. A. Rachford, F. N.
Castellano and L. X. Chen, J. Phys. Chem. A 2011, 115, 3990.
8 A. Chakraborty, J. C. Deaton, A. Haefele and F. N. Castellano,
Organometallics 2013, 32, 3819.
Conflicts of Interest
There are no conflicts of interest to declare.
9 M. Han, Y. Tian, Z. Yuan, L. Zhu and B. Ma, Angew. Chemie Int. Ed.
2
014, 53, 10908.
Acknowledgements
0 Katagiri, S.; Sakamoto, R.; Maeda, H.; Nishimori, Y.; Kurita, T.;
JDS acknowledges support from a gift from Qorvo, Inc. BJH
gratefully acknowledges the Welch Foundation (F-1631) and
the National Science Foundation (CHE-0847763) for financial
support of this research.
Nishihara, H. Chemistry 2013, 19, 5088–5096.
21 D. J. Cárdenas and A. M. Echavarren, Organometallics 1999, 18
337.
,
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