V. Venkatasamy et al. / Electrochimica Acta 51 (2006) 4347–4351
4351
Ellipsometric measurements of the resulting deposit indi-
cated that the film was 19 nm thick. EPMA of the deposit
indicated a Se/Hg atomic ratio of 1.08. Fig. 8 shows the X-
ray diffraction pattern for the deposit. Peaks corresponding to
(1 1 1), (2 2 0) and (3 1 1) planes of HgSe (JCPDS 8-469) were
evident, and no elemental peaks for Hg and Se were observed.
The deposit showed a predominant (1 1 1) orientation as the ratio
of the intensity between the (1 1 1) and (2 2 0) peak came out to
be 10.2, which is considerably higher than the literature value
of 2.
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VB
CB
found at −0.60 eV. This value corresponds to the Γ 6 → Γ 8
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4. Conclusion
The influence of the deposition potentials for Hg and Se, as
well as that for a reductive Se stripping step, has been reported.
The optimal deposition cycle devised includes deposition of Se
at −0.15 V, stripping of excess Se at −0.63 V, and deposition
of Hg at 0.48 V. The resulting deposit was a little over half of
that expected from the ideal model of one compound monolayer
for each cycle, but the deposit was stoichometric, and showed
strong preferential (1 1 1) deposition. The absorption spectrum
for this deposit appears consistent with the literature: an inverted
band structure and a negative gap of 0.6 eV.
Acknowledgements
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The authors would like to acknowledge the support of NSF
divisions of Chemistry and Material science.
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