Fig. 4 demonstrates the characteristics of the Pc-FET: mFET
=
6.0 Â 10À2 cm2 VÀ1
s
À1; Ion/Ioff = 1.8 Â 104. Thus, the
solution-processed Pc-based FET showed a higher perfor-
mance than was reported for vacuum deposited or LB films
of Pcs.7–10
In conclusion, we have prepared stable soluble precursors of
Nc and Pc, which were converted into Nc or Pc by heating at
350 or 250 1C, respectively. Nc and Pc films were prepared by
spin-coating their corresponding precursors followed by ther-
mal annealing. The yield of the retro Diels–Alder reaction was
nearly quantitative and the Nc film was stable up to ca. 400 1C.
OFET devices were made using these precursors; this was the
first successful fabrication of thin film devices of Nc using a
solution process. We also succeeded in the first preparation of
pure Pc without a vacuum technique and the first application
of this compound in an FET by a solution process.
This work was partially supported by Grants-in-Aid from
the Ministry of Education, Culture, Sports, Science and
Technology, Japan (No. 18550036 to NO and No. 18550037
to HY) and JGC-S Scholarship Foundation (TO). The authors
thank Venture Business Laboratory, Ehime University, for
assistance in obtaining the MALDI-TOF mass spectra.
Fig. 3 Electronic properties of an FET with Nc. (a) Id–Vd plots as a
1/2
function of Vg. (b) Id and Id versus Vg plots at Vd À60 V.
OFET devices in the same manner as for TBP.15 Nc and Pc
were readily obtained as good thin films on heavily doped
n-type Si substrates coated with 300-nm thermally grown
SiO2, respectively. The source and drain electrodes were
formed by photolithography of Au (90 nm)/Cr (10 nm), with
a channel length and width of 10 and 500 mm, respectively. Nc
precursor 3 in a 0.7 wt% CHCl3 solution was spin-coated onto
the channel region, and the obtained films were converted into
the Nc form by heating at 350 1C for 5 min. FET properties
were measured with an Agilent 4155C semiconductor analy-
zer. Electronic properties of an FET with Nc are shown in
Fig. 3. The field-effect mobility (mFET) was determined using
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Fig. 4 Electronic properties of an FET with Pc. (a) Id–Vd plots as a
1/2
function of Vg. (b) Id and Id versus Vg plots at Vd À60 V.
ꢀc
This journal is The Royal Society of Chemistry 2008
4716 | Chem. Commun., 2008, 4714–4716