Vertically Aligned N-Doped Carbon Nanotubes
J. Phys. Chem. B, Vol. 107, No. 47, 2003 12963
thickness and less frequent formation of the thicker compart-
ment layers.
(4) Biercuk, M. J.; Llaguno, M. C.; Radosavljevic, M.; Hyun, J. K.;
Johnson, A. T.; Fischer, J. E. Appl. Phys. Lett. 2002, 80, 2767.
(5) Glatkowski, P.; Mack, P.; Conroy, J. L.; Piche, J. W.; Winsor, P.
The compartment layers of the highly doped CNTs exhibit
more N content than the wall. Han et al. also reported the higher
N concentration of the compartment layers compared to the
wall.20 The EELS data reveal that the degree of crystalline
perfection is always lower for the compartment layers compared
to that of the wall, even if the N concentration is the same for
both parts. It must be related to the fact that the graphitic sheets
of the compartment layers intrinsically contain more defects due
to the curved feature. In the case of the CNTs doped with the
higher N atoms, the N doping occurs preferentially in the defect
sites at the curved graphitic sheets of compartment layers. The
N-doped graphitic sheets of the compartment layers are thus
released from the strain when connecting with the wall. The
shape of compartment layers can be notably changed due to
the more significant doping of N atoms. We conclude that the
doping of N atoms plays a significant role in modifying the
structure of bamboo-like CNTs.
U.S. Patent 6,265,466, 2001.
(6) Liang, W.; Bockrath, M.; Bozovic, D.; Hafner, J. H.; Tinkham,
M.; Park, H. Nature 2001, 411, 665.
(7) Tans, S. J.; Verschueren, A. R. M.; Dekker, C. Nature 1998, 393,
49.
(8) Bachtold, A.; Hadley, P.; Nakanishi, T.; Dekker, C. Science 2001,
294, 1317.
(9) An, K. H.; Kim. W. S.; Park, Y. S.; Moon, J.-M.; Bae, D. J.; Lim,
S. C.; Lee, Y. S.; Lee, Y. H. AdV. Funct. Mater. 2001, 11, 387.
(10) Liu, C.; Fan, Y. Y.; Liu, M.; Cong, H. T.; Cheng, H. M.;
Dresselhaus, M. S. Science 1999, 286, 1127.
11) Bethune, D. S.; Kiang, C. H.; deVries, M. S.; Gorman, G.; Savoy,
R.; Vazquez, J.; Beyers, R. Nature 1993, 363, 605.
12) Journet, C.; Maser, W. K.; Bernier, P.; Loiseau, A.; Lamy de la
(
(
Chapelle, M.; Lefrant, S.; Deniard, P.; Lee, R.; Fischer, J. E. Nature 1997,
388, 756.
(13) Thess, A.; Lee, R.; Nikolaev, P.; Dai, H.; Petit, P.; Robert, J.; Xu,
C.; Lee, Y. H.; Kim, S. G.; Rinzler, A. G.; Colbert, D. T.; Scuseria, G. E.;
Tomanek, D.; Fisher, J. E.; Smalley, R. E. Science 1996, 273, 483.
(14) Terrones, M.; Grobert, N.; Olivares, J.; Zhang, J. P.; Terrones, H.;
Kordatos, K.; Hsu, W. K.; Hare, J. P.; Townsend, P. D.; Prassides, K.;
Cheetham, A. K.; Kroto, H. W.; Walton, D. R. M. Nature 1997, 388, 52.
(
15) Ren, Z. F.; Huang, Z. P.; Xu, J. W.; Wang, J. H.; Bush, P.; Siegal,
M. P.; Provencio, P. N. Science 1998, 282, 1105.
16) Fan, S.; Chapline, M. G.; Franklin, N. R.; Tombler, T. W.; Cassell,
5
. Conclusion
(
The vertically well-aligned N-doped CNTs were grown on
the Fe nanoparticles deposited Si substrates using thermal CVD
of CH4/NH3 and C2H2/NH3 mixtures in the temperature range
A. M.; Dai, H. Science 1999, 283, 512.
(17) Terrones, M.; Ajayan, P. M.; Banhart, F.; Blase, X.; Carroll, D.
L.; Charlier, J. C.; Crzerw, R.; Foley, B.; Grobert, N.; Kamalakaran, R.;
Kohler-Redlich, P.; R u¨ hle, M.; Seeger, T.; Terrones, H. Appl. Phys. A 2002,
9
00-1100 °C. The N content in the range 2-6% has been
74, 355.
controlled by the flow rate of NH3. The growth rate is almost
independent of the N content. However, the N doping modifies
remarkably the structure and the degree of crystallinity of CNTs.
The bamboo-like structured CNTs are exclusively produced. As
the N content increases, the more curved and thicker compart-
ment layers appear more regularly at the longer distance. The
HRTEM images and Raman spectra reveal consistently that as
the N content increases the degree of crystalline perfection
decreases. The EELS data indicate the higher N % in the less
crystalline compartment layers compared to the wall.
(
18) Terrones, M.; Redlich, P.; Grobert, N.; Trasobares, S.; Hsu, W.
K.; Terrones, H.; Zhu, Y. Q.; Hare, J. P.; Reeves, C. L.; Cheetham, A. K.;
R u¨ hle, M.; Kroto, H. W.; Walton, D. R. M. AdV. Mater. 1999, 11, 655.
(19) Terrones, M.; Terrones, H.; Grobert, N.; Hsu, W. K.; Zhu, Y. Q.;
Hare, J. P.; Kroto, H. W.; Walton, D. R. M.; Redlich, P.; R u¨ hle, M.; Zhang,
J. P.; Cheetham, A. K. Appl. Phys. Lett.1999, 75, 3932.
(20) Han, W. Q.; Redlich, P.; Seeger, T.; Ernst, F.; R u¨ hle, M.; Grobert,
N.; Hsu, W. K.; Chang, B. H.; Zhu, Y. Q.; Kroto, H. W.; Walton, D. R.
M.; Terrones, M.; Terrones, H. Appl. Phys. Lett. 2000, 77, 1807.
(
21) Ma, X.; Wang, E.; Zhou, W.; Jefferson, D. A.; Chen, J.; Deng, S.;
Xu, N.; Yuan. J. Appl. Phys. Lett. 1999, 75, 3105.
22) Zhong, D.; Liu, S.; Zhang, G.; Wang, E. G. J. Appl. Phys. 2001,
9, 5939.
(
8
The dependence of the growth rate, the structure, and the
crystallinity on the N content has been explained by adopting
the base growth mechanism of CNTs. We suggest that the
growth rate would be mainly determined by the bulk diffusion
rate of C atoms. The N doping would enhance the flexibility of
the graphitic sheets. Then the compartment layers are bent and
connect with the wall under less strain. The joint growth of the
wall and compartment layers would also take longer due to the
reduced strain. The present result shows that the N doping is
one of promising ways to control the crystallinity and structure
of nanotubes.
(
23) Ma, X.; Wang, E. G. Appl. Phys. Lett. 2001, 78, 978.
(24) Wang, E. G. J. Am. Ceram. Soc. 2002, 85, 105.
(
25) Nath, M.; Satishkumar, B. C.; Govindaraj, A.; Vinod, C. P.; Rao,
C. N. R. Chem. Phys. Lett. 2000, 322, 333.
26) Sen, R.; Satishkumar, B. C.; Govindaraj, A.; Harikumar, K. R.;
(
Raina, G.; Zhang, J. P.; Cheetham, A. K.; Rao, C. N. R. Chem. Phys. Lett.
1998, 287, 671.
(
27) Yudasaka, M.; Kikuchi, R.; Ohki, Y.; Yoshimura, S. Carbon 1997,
5, 195.
28) Suenaga, K.; Yudasaka, M.; Colliex, C.; Iijima, S. Chem. Phys.
Lett. 2000, 316, 365.
29) Sung, S. L.; Tsai, S. H.; Tseng, C. H.; Chiang, F. K.; Liu, X. W.;
Shin, H. C. Appl. Phys. Lett. 1999, 74, 197.
30) Kurt, R.; Klinke, C.; Bonard, J. M.; Kern, K.; Karimi, A. Carbon
3
(
(
(
2
001, 39, 2163.
Acknowledgment. This work was supported by Direct Basic
Research Program (Korea Science and Engineering foundation
Project No. R04-2002-000-20088-012003). SEM analyses were
partly performed at the Korea Basic Science Institute in Seoul.
(31) Lee, C. J.; Lyu, S. C.; Kim, H. W.; Lee, J. H.; Cho, K. I. Chem.
Phys. Lett. 2002, 359, 115.
32) Wang, X.; Liu, Y.; Zhu, D.; Zhang, L.; Ma, H.; Yao, N.; Zhang,
B. J. Phys. Chem. B 2002, 106, 2186.
(
(33) Tuinstra, F.; Koenig, J. L. J. Chem. Phys. 1970, 53, 1126.
(
34) McCulloch, D. G.; Prawer, S.; Hoffman, A. Phys. ReV. B 1994,
0, 5905.
35) Wilhelm, H.; Lelaurain, M.; McRae, E.; Humbert, B. J. Appl. Phys.
5
References and Notes
(
(1) de Heer, W. A.; Ch aˆ telain, A.; Ugarte, D. Science 1995, 270, 1179.
1998, 84, 6552.
(
2) Rinzler, A. G.; Hafner, J. H.; Nikolaev, P.; Lou, L.; Kim, S. G.;
(36) Lee, Y. T.; Park, J.; Choi, Y. S.; Ryu, H.; Lee, H. J. J. Phys. Chem.
B 2002, 106, 7614.
(37) Kim, N. S.; Lee, Y. T.; Park, J.; Ryu, H.; Lee, H. J.; Choi, S. Y.;
Choo, J. J. Phys. Chem. B 2002, 106, 9286.
(38) Lee, C. J.; Park, J. J. Phys. Chem. B 2001, 105, 2365.
Tomanek, D.; Nordlander, P.; Colbert, D. T.; Smalley, R. E. Science 1995,
69, 1550.
3) Rosen, R.; Simendinger, W.; Debbault, C.; Shimoda, H.; Fleming,
L.; Stoner, B.; Zhou, O. Appl. Phys. Lett. 2000, 76, 1668.
2
(