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S. Balci et al. / Electrochimica Acta 51 (2006) 6251–6257
FWHM values are higher than the ∼3 nm determined from
bright-field TEM images. Most likely this difference is due to
instrumental drift during the EFTEM measurements, and also
due to noise problems especially for the copper nanowires, as
will be discussed further below. In principle, the intensity of ele-
mental maps can be increased by using longer acquisition times
and/or a higher beam current. However, longer acquisition times
resulted in an even more pronounced drift of the samples during
the acquisition of the pre-edge and post-edge images, leading to
artefacts in the calculated elemental map. Measurements with
higher beam currents have the disadvantage that the nanowires
are damaged, again causing artefacts.
As mentioned above, the line profile intensity of the copper
nanowires shows lower counts than the nickel and cobalt line
larger than in the bright-field image, it is also larger than for
at the edge onset due to the excitation of 2p electrons into unoc-
cupied 3d states [31,32] (see Fig. 3). In contrast, no pronounced
features occur at the Cu L2,3 edge since the 3d shell is fully
occupied [32] (Fig. 3). In addition, the Cu L2,3 edges lies at
the highest energy-loss (931 eV) in the investigated materials,
and thus the intensity of this edge is lowest [31,32] (see Fig. 3).
Due to these reasons, the intensity in the elemental maps for
copper is lower than for nickel and cobalt, if all other param-
eters (acquisition time and beam current) are the same. The
diminished signal/noise ratio increases the FWHM, thus making
EFTEM analysis of copper nanostructures comparatively diffi-
cult. Accordingly, the FWHM value determines the resolution
of the chemical information, while the structural resolution from
the TEM image is considerably better (FWHM ∼4 nm). We also
performed measurements using a scanning transmission elec-
tron microscope (VG HB 501 UX operated at 100 kV), which is
capable to form an electron probe with a size of less than 1 nm. It
has a higher spatial resolution for analytical measurements com-
pared to the TEM used for the EFTEM investigations, however,
due to the high electron beam current density radiation damage
occurred at the nanowires. The results are thus omitted here.
4. Conclusion
In this work it is shown that copper electroless deposition
can be used to synthesize nanosized copper wires specifically
within the central channel of TMV particles, 3 nm in diame-
ter and up to 150 nm in length. Therefore, electroless deposition
methods can also be useful for nanotechnology applications. We
employed electroless copper deposition solution at physiologi-
cal conditions (pH ∼7.5) that is compatible with biomolecules.
The fabrication process of the nanowires is based on treatment
of TMV with Pd(II), followed by electroless deposition of cop-
per. Energy-filtering transmission electron microscopy proves
that the copper nanowires synthesized with the method of ELD
within the 4 nm central channel of TMV particles are indeed
composed of copper. In addition, a similar proof was obtained
also for nickel and cobalt nanowires. Length and diameter of the
elemental maps of all three metal wires reproduce the respec-
tive bright field TEM images. A closer analysis of the widths of
the EFTEM features shows a dependence on the metal: copper,
nickel, and cobalt have FWHM values of 13.5, 7.8, and 7.1 nm,
respectively. The sensitivities for cobalt and nickel are higher
than for copper in elemental maps since copper spectra do not
possess sharp “white lines” in the energy-loss spectra, and the Cu
L
2,3 edge lies at the highest energy of the materials investigated
as well.
Appendix A. Supplementary data
Supplementary data associated with this article can be found,
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Fig. 3. Comparison of the L2,3 white lines of cobalt with nickel and copper
electron energy-loss spectra. The nickel and copper signals are enlarged by the
indicated factors.