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compact and richer in zinc atoms proportion due to
parallel zinc oxide deposition during the heterogeneous
stage. These films are better designated as of Zn(Se,O)
composition, indicating that they are formed by a close
mixture of ZnSe and ZnO nanocrystals in variable
proportion (no evidence for solid solution is found and
no intermediate compound is known). On the other
hand, it is known that the growth of films with high
photovoltaic quality requires the addition of hydrazine,
a reducer and complexing agent, which improves com-
pactness and adherence of the films. In spite of its
important effect, the participation of hydrazine in the
deposition mechanism has not been clarified. It is also
found that the proportion of ZnO in the film is very
dependent on the conductivity of the substrate, increas-
ing with the conductivity of the substrates [8]. It will be
shown here that hydrazine and substrate conductivity
are closely related factors, responsible for a transient
electroless mechanism which results in the deposition of
ZnSe and ZnO. This mechanism is more important at
the beginning of the deposition process, and is deter-
mining for the properties of the films.
The technique used for the study of the growth of
Zn(Se,O) in a chemical bath is the quartz crystal mi-
crobalance (QCM). QCM is an in situ technique which
monitors in real time the thickness of the film, giving
access to the velocity of deposition [9]. QCM technique
has been applied to the study of CBD growth of CdS
[10] and CdSe [11] thin films. The experiments are
carried out under different substrate, temperature and
bath composition conditions in order to characterise
the reaction mechanisms that contribute to the growth
of Zn(Se,O) films.
A quartz crystal microbalance system (Maxtek,
INC.) was used, run by a PC computer and a program
(quickbasic) for real time acquisition of the resonance
frequency and mathematical conversion to film thick-
ness. The corrected expression for loaded crystal was
used for the conversion of frequency to film thickness
[13], using for the acoustic impedance and density of
ZnSe the values v=12.23×1010 kg m−2 s−1 and
z=5.26 g cm−3, respectively. This expression gives for
low loads (DfB0.05f0) a quasi-constant conversion fac-
tor of 30 Hz nm−1. The derivative of the film-thickness
vs. time gives the growth velocity vs. time plots, which
have the meaningful chemical information [11]. The
commercial quartz crystal sensors used have f0=5
MHz fundamental frequency, 3.14 cm2 area, with a
central disk of 1.37 cm2 coated with Au or Pt. Polished
and unpolished crystals were used as purchased, with 5
and 250 nm RMS roughness, respectively. The sensor
head was immersed vertically in the chemical bath. Due
to the sensitiveness of the QCM to small changes of
temperature, viscosity and/or hydrodynamic conditions,
special care was taken before the start of the measure-
ments. After all the reactants were added to the chemi-
cal bath, except selenourea, a settle time of some
minutes was allowed until attaining a constant reso-
nance frequency within 10–20 Hz, which indicated
stabilised conditions inside the bath (viscosity, tempera-
ture, agitation). Then addition of solid selenourea was
carried out and at the same time the count of reaction
time was initiated. Resonance frequency measurements
(film thickness) were taken each 30 s during the first
10–15 min, and at longer intervals afterwards. XPS
measurements for determination of the composition of
films were carried out as described elsewhere [7].
2. Experimental
3. Results
The chemical bath composition included selenourea
(SU) (NH2ꢀCSeꢀNH2) and zinc sulphate (ZnSO4) as
selenium and zinc sources, respectively, aqueous ammo-
nia (NH3) as the complexing agent of Zn2+, sodium
sulphite (Na2SO3) and hydrazine hydrate (N2H4·H2O)
[12]. The base composition in the experiments was 30
mM ZnSO4, 7.5 mM NH2CSeNH2, 1.4 M NH3, 30 mM
Na2SO3, and 1.6 M N2H4. Changes from this composi-
tion are indicated in each case. Reagent grade chemicals
and Millipore-Q water were used for the preparation of
solutions. The pH of the departing chemical bath solu-
tion was 11.5 (25 °C), and was found to diminish at a
rate of 0.3 units per hour. This diminution must be
attributed almost entirely to ammonia evaporation, as
pure ammonia solutions showed the same drift, which
means that the chemical deposition reaction does not
cause an important change of pH. The bath was water
thermostatised, stirred with a magnet and left in open
air during the deposition.
The effect of different bath parameters on QCM
growth curves is studied.
3.1. Substrate
Fig. 1 shows the growth rate of Zn(Se,O) thin films
on three different substrates, Au-polished, Au-unpol-
ished and Au covered with isolating SiO2 (Rd=1 kV).
Similar trends can be observed on the three substrates,
consisting in an induction period, an initial peak, a
second broader peak, and a final decay. The induction
time shows little dependence on substrate type, whereas
rate and time of appearance of the peaks are substrate
dependent. It is observed that the peaks are more
intense on the unpolished Au surface, the first one
appearing at the same time on both polished and
unpolished surfaces, whereas the second one is some-
what delayed on the polished surface. On Au/SiO2