Mendeleev Commun., 2002, 12(1), 9–11
Thermal-lens spectrometry for studying molecular layers covalently bonded to a
flat glass surface
Mikhail Yu. Kononets, Svetlana N. Bendrysheva, Mikhail A. Proskurnin,* Elena V. Proskurnina,
Evgenii M. Min’kovskii, Aleksei R. Tarasov and Georgii V. Lisichkin
Department of Chemistry, M. V. Lomonosov Moscow State University, 119992 Moscow, Russian Federation.
Fax: +7 095 939 4675; e-mail: michael@analyt.chem.msu.ru
10.1070/MC2002v012n01ABEH001522
The molecular layers of the Reactivrot B5A dye covalently bonded to flat quartz glass surfaces was studied by thermal lensing in
combination with electron-probe microanalysis.
Table 1 Parameters of the dual-beam thermal lens spectrometer.
Studies of the structure of chemically bonded molecular layers
are of importance in the chemistry of surface compounds.1 A
small contribution from the layer mass to the total sample
mass does not allow methods traditionally used for solving the
problems of three-dimensional chemistry to be applied. There-
fore, the composition and structure of bonded molecular layers
on porous substrates with high specific surface areas are usually
studied. In the case of developed surfaces, the mass fraction of
a bonded layer can reach 10%, which is sufficient for elemental
microanalysis, IR, UV, and EPR spectroscopy etc.2 However,
in the case of a chemical modification of the surface of flat
substrates, the study of the bonded layer becomes a compli-
cated problem. We applied thermal lens spectrometry (TLS) to
study chemically modified flat surfaces of quartz glasses.
Thermal lensing is a thermooptical method commonly used
in analytical practice.3 This method is based on detecting heat
effects due to the non-radiative relaxation of molecules that ab-
sorbed electromagnetic radiation.3,4 In thermal lensing, an equi-
librium redistribution of temperature in the irradiated sample
results in a Gaussian profile of refractive index determined by
the spatially Gaussian form of the excitation laser beam. This
profile can be treated as an optical element similar to a lens
with the focal distance being a function of the absorbance of the
test sample.3
Thermal lensing has such features as (i) high instrumental
sensitivity, which makes it possible to detect absorbances in
liquid samples down to 10–7–10–8, to determine concentrations
down to 10–12 mol dm–3, to analyse volumes down to 10–15 dm3
and to detect hundreds of molecules in such volumes; (ii) the
possibility to use all the variety of methods and approaches
of conventional spectrophotometry; and (iii) non-destructivity,
which makes it possible to apply TLS to a wide range of test
substances.3–5 Usually, thermal lensing is applied to determine
substances like dyes or metal chelates absorbing the radiation
of an excitation laser in liquids.3–5
Excitation laser
Wavelength le (nm)
514.5
300
19.5
180
Focussing lens focal length (nm)
Confocal distance (mm)
Laser power at cell (mW)
Spot size at the waist (µm)
60 1
Probe laser
Wavelength lp (nm)
632.8
185
3.1
Focussing lens focal length (nm)
Confocal distance (mm)
Laser power at cell (mW)
Spot size at the waist (µm)
4
25 1
Other parameters
Cell length (mm)
2
Sample-to-detector distance (cm)
m in equation (2)
V in equation (2)
200
2.0 0.1
3.1 0.1
cathode. Due to the very low conductivity of the samples,
measurements were made at low acceleration voltages at the
equilibrium point (2 kV or lower). At this potential, the total
secondary current is equal to the primary electron current. For
each sample, the equilibrium points were selected to eliminate
charging effects on the images. At this potential, photographs
were made every 2 min during 20 min (the images did not
change). Focussing was performed at low magnifications (×25)
to prevent charging. Secondary-electron images were obtained
with a magnification of 200 to 1500.
The thermal lens signal qj for a single j-th measurement of a
sample was calculated as the average of i = 50–100 signals of
on-off thermal-lens excitation cycles resulting in a series of the
relative change in intensity in the central part of the probe beam
for a steady-state thermal lens [qj1, qj2, … qji]. The values of qji
were calculated from the equation:3,4
Ioff – Ion
Ion
qji =
,
(1)
where Ioff is the time-averaged probe beam intensity without
a thermal lens (excitation beam is off) and Ion is the time-
averaged probe beam intensity for a steady-state thermal lens
(excitation beam is on) for a single cycle. Recalculation of the
signal q to absorbance A was made using the equation:3,5
2
However, the sensitivity of the method is sufficient to meas-
ure the concentration of a dye on a nonporous glass surface.
Shimosaka et al.6 studied the Acridine Orange dye adsorbed on
glass using total-internal-reflection thermal lensing. The aim of
this study was to examine the uniformity and surface concen-
tration of a bonded layer.
J
2
2mV
1 + 2mV + V2
qj = 1 – arctan
– 1
(2)
A dual-laser parallel-beam (collinear) thermal lens spectrometer
was used.7 The thermal lens was excited with an INNOVA 90-6
argon-ion laser (Coherent, USA) with le = 514.5 nm (TEM00
mode); the maximum power at the sample was 180 mW. The
probe was a SP-106-1 helium–neon laser (Spectra Physics, USA)
with lp = 632.8 nm (TEM00 mode). The signal (the intensity at
the centre of the probe beam) was measured with an FD-7K
photodiode. Next, the signal was amplified, and it entered an
ADC–DAC board of an IBM PC/AT computer. The measure-
ment was synchronised using the special software.7 The optical
parameters of the spectrometer are summarised in Table 1.8 The
beam waist location and waist spot sizes of laser beams were
measured using an 818-SL digital power meter (Newport Corp.,
Fountain Valley, CA, USA) according to Snook and Lowe.5
Electron-microscopic images were taken on a CamScan 44
scanning electron microscope with a thermal-emission tungsten
where J = 2.303E0PeA, Pe is the power of the excitation laser at
the sample, m is the mode-mismatching factor and V is the dis-
tance from the probe waist to the sample normalised to the cor-
responding confocal length.5 The parameter E0 = (dn/dT)(lpk)–1
is the reduced enhancement factor for thermal-lens measurements,
dn/dT is the temperature gradient of the refractive index, lp is
the wavelength of the probe laser, and k is the thermal con-
ductivity. In thermal-lens measurements, the following parameters
were measured: an averaged signal of the sample for j sub-
sequent cycles qj and the measurement precision (deviation of
the signal from cycle to cycle). For each test sample with the
concentration of the test component c, the average signal qn(c)
was calculated for n replicate measurements. The repeatability
of measurements was characterised by the relative standard
deviation.
– 9 –