KAWAKAMI et Al.
11 of 12
|
2
reflections, R=0.0651, Rw=0.1661 for data with |Fo |>2σ
Me3SiCl and ClCH2Me2SiCl and the Colcoat Co. Ltd for pro-
viding Si(OEt)4.
2
|Fo | (R=0.0929, Rw=0.2019 for all data), GOF=1.077. All
reflections [3.03≤θ≤27.52°] were measured on a RIGAKU
MERCURY diffractometer using CCD camera. The reflec-
tions collected/independent was 48 778/20 335, in which
REFERENCES
2
2
14 054 reflections [|Fo |>2σ |Fo |] were used for calcula-
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(SHELXS-97[16] and SIR 2004[17]) using WinGX v1.70.01
as interface.[18] The non-hydrogen atoms were refined
anisotropically by the full-matrix least-square method
(SHELXL-97).[16] Hydrogen atoms were placed at calculated
positions and kept fixed. In the subsequent refinement, the
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function Σω (F2 −F2 )2 was minimized, where |Fo| and |Fc|
are the observed andccalculated structure factor amplitudes,
o
respectively. The agreement indices are defined as R1=Σ
(||Fo|−|Fc||)/Σ|Fo| and wR2=[Σω(F2 −F2 )2/Σ(ωF4 )]1/2
.
o
c
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4.16
X-ray structure determination of
|
(PhSiO3/2)10 4a
Suitable crystals were obtained by recrystallization from
CH2Cl2. PhT10: C60H50O15Si10, M=1291.90, triclinic with
a=14.509 (3), b=14.619 (3), c=17.642 (4) Å, α=72.901
(14), β=78.655 (14), γ=62.559 (9)°, V=3165.9 (11) Å3
space group P−1, Z=2, Dcalc=1.355 g cm−3, 14 374 reflec-
tions, R=0.0455, Rw=0.1356 for data with |Fo |>2σ |Fo |
(R=0.0540, Rw=0.1475 for all data), GOF=1.084. All
reflections [3.17≤θ≤27.50°] were measured on a RIGAKU
MERCURY diffractometer using CCD camera. The reflec-
tions collected/independent was 38 200/14 374, in which
2
2
2
2
11 890 reflections [|Fo |>2σ|Fo |] were used for calcula-
tion of R. The structure was solved by the direct method
(SHELXS-97[16] and SIR 2004[17]) using WinGX v1.70.01
as interface.[18] The non-hydrogen atoms were refined
anisotropically by the full-matrix least-square method
(SHELXL-97).[16] Hydrogen atoms were placed at calculated
positions and kept fixed. In the subsequent refinement, the
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function Σω (F2 −F2 )2 was minimized, where |Fo| and |Fc|
are the observed andccalculated structure factor amplitudes,
o
respectively. The agreement indices are defined as R1=Σ
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(||Fo|−|Fc||)/Σ|Fo| and wR2=[Σω(F2 −F2 )2/Σ(ωF4 )]1/2
.
Crystallographic data reportedoin this manuscript have
been deposited with Cambridge Crystallographic Data
Centre as supplementary publication no. CCDC-1539759 for
10a and 1539760 for 4a. Copies of the data can be obtained
free of charge via CCDC Website.
c
o
ACKNOWLEDGMENTS
This work was supported by a Grant-in Aid for a High-Tech
Research Center Project from the Ministry of Education,
Culture, Sports, Science and Technology, Japan. The authors
are grateful to the Shin-Etsu Chemical Co. Ltd. for gift of