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ChemComm
DOI: 10.1039/C3CC44177F
To date our most efficient organolead trihalide perovskite
devices, incorporating an alumina scaffold, have been
manufactured in the way described above can match the
performance of devices described in 15, especially when the dual
manufactured using the low temperature manufacturing method 45 phase nature of the coꢀdeposited layer is considered. If it is
described here. For comparison, a statistical analysis of the 8
most efficient devices made with a sintered (550 °C) Al2O3
scaffold has been conducted and the results are summarised in
Table S1† where it can be seen that the average PCE = 3.17 % (±
possible to encourage the perovskite to wet the surface of the
nanoparticles more effectively upon crystallization then it may be
possible to achieve large improvements in device light harvesting
efficiency, which may improve photocurrents. If fill factors can
5
0.88 %). The average device efficiency for the 8 most efficient 50 also be improved by HTM optimisation then it is conceivable that
low T, coꢀdeposited devices is PCE = 3.98 % (± 0.33 %). The
high efficiency devices can be manufactured using this low
temperature coꢀdeposition technique.
10 improvement in device PCE and improvement in device
consistency is in accordance with the recent report by Ball et al.
in which they have achieved their best device performances with
Conclusions
a low temperature Al2O3 deposition technique 15
.
55
Following the work presented so far to determine the optimum
15 nanoparticle wt. %, steps have been taken to improve device
efficiencies. We have observed that the performance of these
devices is sensitive to the relative humidity (RH) in the laboratory
We have shown that it is possible to obtain efficient lead halide
based perovskite devices by coꢀdepositing
a
single
Al2O3/perovskite layer at low temperatures. We believe this will
be of great interest to those working on the development and
at the point of manufacture. When devices are manufactured in an 60 scaleꢀup manufacture of these devices. Furthermore, we believe
atmosphere of RH < 35 %, improvements in PCE are significant.
20 Indeed, we have recently manufactured our highest efficiency
devices, using the low temperature method which is described in
the ESI† and by controlling the humidity during manufacture. The
average PCE of our ten most recent devices is 7.2 % (± 0.6 %).
Fig. 3 shows the IV curve of one such device with PCE = 7.2 %.
25
that with further optimisation, devices manufactured using this
low temperature method can be improved upon and leads to the
distinct realisation of highly efficient, low temperature, solidꢀ
state devices.
65 Notes and references
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30
It can be seen that the fill factor of this device and indeed, of all
devices presented in this work, is low. The IV curve above shows
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35 of our HTM layer not being optimised (in terms of layer
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