C O M M U N I C A T I O N S
close van der Waals contact between the fluorene rings is readily
seen in a space-filling representation of F3 (Figure 2).
showed linear correlations with quantity 1/n, where n is the number
of fluorene moieties, as shown in Figure 3B. Extrapolation of the
plots in Figure 3B to 1/n ) 0 gave the vertical ionization potential
of 7.10 eV and the oxidation potential of 0.97 V versus SCE for
the multiply stacked polyfluorene donor with an infinite number
of fluorene moieties. Interestingly, the observed linear relationship
of electron-detachment energies and 1/n in F1-F4 is highly
reminiscent of the ionization energies predicted for varying lengths
of fully conjugated polyacenes by recent theoretical studies by Houk
et al.12
In summary, we have successfully synthesized multiply π-stacked
polyfluorenes which retain their cofacial conformations both in
solution and in the solid state as was judged by NMR spectroscopy
and X-ray crystallography. The availability of the experimental
electron-detachment energies of F1-F4 should spur theoretical
interest which will provide a fundamental understanding that may
prove to be highly relevant to the electron-transport phenomenon
observed in DNA through π-stacked bases.2
We are presently exploring these π-stacked polyfluorene spacers
for the construction of a variety of wirelike materials to examine
the electron-transport phenomenon through these systems using a
variety of spectral methods13 including time-resolved spectroscopy
and X-ray crystallography.
Figure 2. An X-ray structure of F3 (left, ORTEP, and right, space-filling
representation) showing cofacial juxtaposition of the three fluorene moieties.
The consequence of electronic coupling among the stacked
fluorene moieties of F2-F4 in comparison to the model electron-
donor F1 was evaluated by cyclic voltammetry in solution and
photoelectron spectroscopy in the gas phase as follows. Polyfluorene
donors F2-F4 in dichloromethane solution (in the presence of tetra-
n-butylammonium hexafluorophosphate as a supporting electrolyte)
at a scan rate of 200 mV s-1 showed reversible cyclic voltammo-
grams with oxidation potentials (Eox) that progressively decreased
with an increasing number of fluorene moieties.8 Moreover, the
Eox values for F2 (1.42 V), F3 (1.25 V), and F4 (1.14 V) are
significantly lower than that of the parent 9,9-dimethylfluorene9
F1 (1.74 V vs SCE), which only showed an irreversible oxidation
wave.
The measurement of (gas-phase) helium(I) photoelectron spectra
(PES) of F1-F4 (see Figure S1, Supporting Information)10 provided
the vertical ionization energies for various polyfluorene electron
donors, and the values of experimental ionization potentials (IP)
for F1 (7.85 eV), F2 (7.52 eV), F3 (7.33 eV), and F4 (7.28 eV)
decreased in a manner similar to that of the electrochemical
potentials with an increasing number of fluorene moieties. More-
over, the linear relationship between the vertical ionization potentials
(IP, in gas phase) and the oxidation potentials (Eox, in solution) for
F1-F4, illustrated in Figure 3A, suggests that the polyfluorene
donors F1-F4 do not undergo significant structural changes during
(or soon after) electron detachment.11
Acknowledgment. We thank the Petroleum Research Fund
(AC12345) for financial support and Dr. Nadine E. Gruhn
(University of Arizona) for photoelectron spectroscopy.
Supporting Information Available: Various spectral data for F1-
F4 and the X-ray crystallographic data for F2 and F3 (PDF and CIF).
This material is available free of charge via the Internet at http://
pubs.acs.org.
References
(1) (a) Adams, H.; Hunter, C. A.; Lawson, K. R.; Perkins, J.; Spey, S. E.;
Urch, C. J.; Sanderson, J. M. Chem.-Eur. J. 2001, 7, 4863-4877 and
references therein. (b) Maruta, G.; Takeda, S.; Yamaguchi, K.; Ueda, K.;
Sugimoto, T. Synth. Met. 1999, 103, 2333-2334.
(2) (a) Maiya, B. G.; Ramasarma, T. Curr. Sci. 2001, 80, 1523-1530. (b)
Lewis, F. D.; Letsinger, R. L.; Wasielewski, M. R. Acc. Chem. Res. 2001,
34, 159-170. (c) Schuster, G. B. Acc. Chem. Res. 2000, 33, 253-260
and references therein.
(3) Wartini, A. R.; Valenzuela, J.; Staab, H. A.; Neugebauer, F. A. Eur. J.
Org. Chem. 1998, 139-148 and references therein.
(4) Grimme, W.; Kaemmerling, H. T.; Lex, J.; Gleiter, R.; Heinze, J.; Dietrich,
M. Angew. Chem., Int. Ed. Engl. 1991, 30, 205-207.
(5) Introduction to Molecular Electronics; Petty, M. C., Bryce, M. R., Bloor,
D., Eds.; Oxford University Press: New York, 1995. Also see: Tour, J.
M. Acc. Chem. Res. 2000, 33, 791-804 and references therein.
(6) Full details of the syntheses of F1-F4 will be published separately.
(7) X-ray crystallography data for F2 and F3 have been deposited with the
Cambridge Crystallographic Data Center as supplementary publication
nos. CCDC207410 and CCDC207411, respectively. Also see Supporting
Information.
(8) Note that the lowering of redox potentials as a result of cofacial
juxtaposition in arene moieties has ample precedents, for example, see:
Rathore, R.; Kochi, J. K. Can. J. Chem. 1999, 121, 913-921 and
references therein.
(9) Greenhow, E. J.; McNeil, D. J. Chem. Soc. 1956, 3204-3209.
(10) Rathore, R.; Kochi, J. K. AdV. Phys. Org. Chem. 2000, 35, 193-318 and
references therein.
(11) Full analysis of the photoelectron spectra of F1-F4, including molecular
orbital calculations, will be presented separately: Rathore, R.; Gruhn, N.
E.; Abdelwahed, S. H.
(12) Houk, K. N.; Lee, P. S.; Nendel, M. J. Org. Chem. 2001, 66, 5517-
5521. Also see: (a) Klaerner, G.; Miller, R. D. Macromolecules 1998,
31, 2007-2009. (b) Ane´mian, R.; Mulatier, J.-C.; Andraud, C.; Ste´phan,
O.; Vial, J.-C. Chem. Commun. 2002, 1608-1609.
(13) Preliminary spectral studies show strong through-space interactions in F2-
F4 cation radicals as evidenced by the appearance of new broad bands in
the near-IR region. Full details will be disclosed in a separate manuscript.
Figure 3. (A) Correlation of the IP values of F1-F4 in the gas phase and
E
ox values in solution. (B) A plot of the IP (blue axis) values and Eox (red
axis) values versus 1/nF.
Interestingly, a closer inspection of the values of electron-
detachment energies from F1-F4, both in solution and in the gas
phase, indicated that the changes in IP and Eox values are not linear
with an increasing number of fluorene moieties in various stacked
polyfluorene donors. However, both IP and Eox values of F1-F4
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