W. Liu et al. / Polymer 51 (2010) 4776e4783
4783
degradation of this series of phosphor-containing epoxides could
be proposed: at the decomposition temperature, the thermally-
labile phosphate groups firstly pyrolyze to yield strong organic
phosphoric acid, and which then catalyze the cleavage of other
adjacent phosphate or ester bonds, leading to the collapse of
network. The synergistic influence of two factors, i.e., the pres-
ence of weak phosphate bond evenly distributed within the
three-dimensional crosslinking network on the molecular level
and the in-situ catalyzing of organic phosphoric acid on the
decomposition of phosphate or carboneester groups, was
responsible for the suitably low cleavage temperature and rapid
degradation rate.
desirable rework temperature range of 200e300 ꢀC. The low
degradation temperature and rapid degradation rate are attributed
to that the weak phosphate bonds evenly distributed in the
network and the auto-accelerated effect on the cleavages of adja-
cent phosphate and ester bonds by the organic phosphoric acids
generated during thermal decomposition, as demonstrated by the
results of computational calculation and the isothermal FTIR
spectra of solid pyrolysis products and volatized components.
The reworkable test showed that, after heat-treatment for only
4 min at 260 ꢀC, the residue of cured trifunctional epoxide on a glass
slide could be easily wiped off using acetone to obtain a very clean
substrate so that additional grinding and polishing processes are
not necessary. Moreover, the introduction of phosphate group into
the epoxy network led to the cured epoxides apparently enhanced
flame retardant property. Therefore, the combination of several
favorable characteristics such as reworkability, halogen-free flame
retardancy, high glass transition temperature and mechanical
modulus endow the epoxides synthesized promising application
potential as environment-friendly electronic packaging materials.
3.4. Removal test
For the practical application of a reworkable epoxy resin, it is
desired that its cured product can provide enough adhesion
strength on the substrate and sufficient reliability up to 220 ꢀC
equivalent to conventional epoxy packaging material, and mean-
while, in the event of necessity, the epoxy crosslinking network can
collapse rapidly within several minutes in the temperature range of
220e280 ꢀC to allow the faulty chip to be removed. Moreover, the
residue attached on the substrate should be cleaned easily with
some common noncorrosive solvents such as acetone, chloroform
and dichloromethane so that the subsequent surface grinding and
polishing processes are unnecessary.
Acknowledgments
The support from the Program for New Century Excellent Talents in
University of China (Grant No. NCET-06-0280) and the Scientific
Research Foundation for the Returned Overseas Chinese Scholars, State
Education Ministry (Grant No. 2005-546), is gratefully acknowledged.
To evaluate the reworkable property of the epoxies synthesized, in
this study, about 1 g of mixture of trifunctional Epoxide II and HMPA
with the molar ratio of 1:0.8 was cured on a glass slide using 2-ethyl-4-
methylimidazole as catalyst under the same curing condition as the
sample for TGA and DMA measurements. The cured film sample was
transparent with area of about 50 ꢂ 50 mm2 (Fig. 10A). The tempera-
ture of a muffle furnace was pre-determined at 260 ꢀC, in which the
cured samplewas heat-treated for 4 min. The black residue on the glass
slide could be wiped off easily with acetone and a very clean glass slide
was obtained (Fig.10BeD). The test above demonstrated that the quick
degradation at the desired temperature and easy cleaning process of
substrate could be realized using the present epoxides.
Appendix. Supporting information
Supplementary data associated with this article can be found, in
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