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Chemistry Letters Vol.36, No.3 (2007)
Efficient Conversion of NO2 into N2 and O2 in N2 or into N2O5 in Air
by 172-nm Xe2 Excimer Lamp at Atmospheric Pressure
Masaharu Tsuji,ꢀ1;2;3 Masashi Kawahara,1;2;3 Makoto Senda,1;2;3 and Kenji Noda3
1Institute for Materials Chemistry and Engineering, Kyushu University, Kasuga, Fukuoka 816-8580
2CREST, JST, Kawaguchi 332-0012
3Department of Applied Science for Electronics and Materials, Graduate School of Engineering Sciences,
Kyushu University, Kasuga, Fukuoka 816-8580
(Received December 19, 2006; CL-061482; E-mail: tsuji@cm.kyushu-u.ac.jp)
Decomposition of NO2 (200 ppm) in N2 or air by 172-nm
After 0.1–30 min photoirradiation, products were analyzed
by using HORIBA gas analysis system (FG-100) equipped with
an FTIR spectrometer and ANELVA gas analysis system (M-
200GA-DTS) equipped with a quadrupole mass spectrometer.
We determined the residual amount of NO2, [NO2]/[NO2]0,
and the formation ratios of N2, O2, and NOx, defined as [N2]/
[NO2]0, [O2]/[NO2]0, and [NOx]/[NO2]0, respectively, from
gas analyses. Here, [NO2]0 is an initial concentration of NO2.
N2 and O2 cannot be detected by FTIR, because these diatomic
molecules are inactive for IR light. If other NOx and O3 are
produced in the photolysis, all of them can be detected. Thus,
the formation ratios of N2 and O2 in N2 were determined from
N and O balance before and after photolysis.
When NO2 was decomposed by a 172-nm excimer lamp for
20 min, the main absorption band of NO2 at 1600 cmꢂ1 reduced
its intensity, as shown in Figure S1 (Supporting Information).8
Figure 1 shows the dependence of NO2 conversion and the for-
mation ratios of N2, O2, NO, and N2O on the irradiation time of
lamp. After 30 min photoirradiation, the residual amount of NO2
decreases to 1%, while the formation ratios of N2 and O2 in-
crease to 47 and 98%, respectively. The formation ratio of NO
initially increases to 9% until 2 min then gradually decreases
to 0% in the 9–30 min range. The formation ratio of N2O can
be kept as low as 3% in the all time range. On the basis of these
results, NO2 can be efficiently decomposed to N2 and O2 keep-
ing NO and N2O emissions at low levels under 172 nm irradia-
Xe2 excimer lamp was studied at 1 atm. The NO2 conversion
in N2 was 99%, and the formation ratios of N2, O2, NO, and
N2O were 47, 98, 0, and 2%, respectively, after 30 min irradia-
tion. The NO2 in air (5–20% O2) could be completely converted
to N2O5 and HNO3 due to reactions by O3 and H2O after only
1.0–1.5 min irradiation. The present results give a new simple
photochemical aftertreatment technique of NO2 in air without
using any catalysts.
We have recently initiated development of a photochemical
method as a new promising removal method of NOx at atmo-
spheric pressure without using expensive catalysts.1–4 An ad-
vantage of photochemical method is that more selective decom-
position is possible than electric discharge method, where ener-
getic electrons are main energy carrier. We have recently studied
decomposition of NO2 into N2 by using 193-nm ArF excimer
laser in N2 at atmospheric pressure.2 Although more than 80%
of NO2 (200 ppm) could be converted into N2, O2, and NO in
N2 at atmospheric pressure, it was difficult to decompose NO2 in
air because after photolysis of NO2 into NO + O (1a), such
backward reaction (1b) occurs significantly.
NO2 þ hꢀ (193 nm) ! NO þ O
NO þ O þ M ! NO2 þ M (M = N2, O2)
ð1aÞ
ð1bÞ
100
When ArF excimer laser photolysis was applied to practical
NOx removal process, there are a lot of severe problems. They
are that excimer laser apparatus is expensive, running cost is
high, and the apparatus is big and heavy including high power
sources. In order to overcome these problems, we used here a
low cost and compact (ꢁ ¼ 128 mm, length = 330 mm) Xe2
lamp as a new VUV right source. The absorption cross section
of NO2 (1:4 ꢁ 10ꢂ17 cm2 moleculeꢂ1) at 172 nm is 20 times
larger than that (7:1 ꢁ 10ꢂ19 cm2 moleculeꢂ1) at 193 nm.5
Therefore, more efficient photolysis of NO2 is expected at
172 nm. We have found for the first time that NO2 could be
efficiently removed not only in N2 atmosphere but also in air
(5–20% O2) at a low NO2 concentration of 200 ppm.
NO2 photolysis chamber used in this study was similar to
that used for ArF laser photolysis1 except for the VUV light
source. Light from an unfocused 172-nm Xe2 lamp (USHIO,
UER20H172:50 mW/cm2, 155–200 nm range) was used to
decompose NO2 at a room temperature. All experiments were
carried out in a closed batch system. The total pressure was kept
at atmospheric pressure, and the NO2 concentration diluted in N2
or N2/O2 mixtures was 200 ppm (v/v).
NO2
80
N2
O2
NO
N2O
60
40
20
0
0
5
10
15
20
25
30
Irradiation time / min
Figure 1. Dependence of residual amount of NO2 and the
formation ratios of products on the irradiation time of 172-nm
excimer lamp at a NO2 concentration of 200 ppm in N2 at a total
pressure of 1 atm.
Copyright Ó 2007 The Chemical Society of Japan