R. Haberkorn, J. Bauer, G. Kickelbick
ARTICLE
3MCO3 + 2(NH4)2HPO4 Ǟ M3(PO4)2 + 4NH3Ȇ + 3CO2Ȇ + 3H2OȆ
to have only the Lorentian part of crystallite size as microstructural
(1) refinable and constraint to the same value for all peaks.
Further details of the crystal structures investigations may be
obtained from the Fachinformationszentrum Karlsruhe, 76344 Egg-
enstein-Leopoldshafen, Germany (Fax: +49-7247-808-666; E-Mail:
posited data.html) on quoting the depository numbers CSD-427715
(Ba2PO4I), CSD-427716 (Pb2PO4I), and CSD-427717 (Sr2PO4I).
The starting materials were ground in an agate mortar after adding n-
pentane. The dried mixture was calcinated in air, using platinum cruci-
bles and a muffle furnace at temperatures of 1100 °C [Sr3(PO4)2,
Ba3(PO4)2] or 700 °C [Pb3(PO4)2] analogous to syntheses described in
the literature.[12] The product was homogenized and fired repeatedly
at the same temperature until a pure phase was yielded. The iodophos-
phates were prepared according to Equation (2):
Supporting Information (see footnote on the first page of this article):
The Rietveld plots of the samples Ba2PO4I and Sr2PO4I are shown in
Figure S1 and Figure S2.
M3(PO4)2 + MI2 Ǟ 2M2PO4I
(2)
To compensate loss of MI2 by sublimation an excess of 5% was
weighed. Due to the hygroscopic behavior of SrI2 weighing for
Sr2PO4I was done in a glove box. The starting materials were ground
in an agate mortar and filled into a silica tube. To remove H2O in
BaI2·H2O the tube was heated in dynamic vacuum prior to sealing.
The temperature for drying was increased within several hours from
room temperature to a maximum of 400 °C. The sealed tube was posi-
tioned upright in a muffle furnace and heated to 600 °C (Pb2PO4I,
Sr2PO4I) or 750 °C (Ba2PO4I) for 6 h. After allowing to cool down to
room temperature the tubes were opened in air and prepared into a
standard sample holder for X-ray diffraction (Pb2PO4I, Ba2PO4I) or
were opened in a glove box and mounted into a sample holder protect-
ing against contact to air (Sr2PO4I) (Figure 3).
References
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X-ray scans were recorded with a D8 Advance diffractometer (supplier
Bruker AXS, Karlsruhe, Germany) with focusing Bragg-Brentano ge-
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7 to 120°. Usually the scan time was 2 h. Samples in protective sample
holders were measured with 20 min scan time, sometimes repeatedly,
before starting the scan with 2 h scan time and a 2θ range from 8 to
80°. No monochromator was attached, but low energy radiation was
removed by discriminating the detector to 8.0Ϯ1.5 keV and Cu-Kβ
radiation was reduced to 1% relative intensity by a Ni foil. A fast
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The program Topas was used to extract individual peak positions, to
index unknown patterns,[13] for structure solution by simulated anneal-
ing[14] and difference Fourier, and for Rietveld analysis. Modeling
width and shape of the peaks as well as correcting peak positions was
done according to the fundamental parameters approach,[15] as im-
plemented in Topas. The instrumental function was determined by a
scan of LaB6. For Rietveld analysis the following parameters were
refined: lattice parameters, sample height displacement, microstruc-
tural parameters, coordinates of the atomic sites, and individual iso-
tropic temperature parameters for most sites, but constraining the tem-
perature factor of oxygen sites to a single parameter. If a parameter
reached an upper or lower limit then this parameter was fixed for a
subsequent run. For extracting peak positions all peaks were constraint
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Received: May 7, 2014
Published Online: November 17, 2014
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© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Z. Anorg. Allg. Chem. 2014, 3153–3158