Electronic Supplementary Material (ESI) for Energy & Environmental Science
Evaluation Only. Created with Aspose.PDF. Copyright 2002-2021 Aspose Pty Ltd.
This journal is © The Royal Society of Chemistry 2014
COMMUNICATION
Journal Name
sources. Shutters are present at the evaporation sources and below the substrate holder. Three quartz microbalance
sensors are present in the chamber, two monitoring the rate of each evaporation source and a third one at the height
of the substrate holder. After the ceramic crucibles were loaded with the CH3NH3I and the PbI2 the chamber was
evacuated to a base pressure of 1*10-6 mbar. Fresh CH3NH3I was used for each evaporation. After the base pressure
was reached, the CH3NH3I crucible was heated to 70 C. At this temperature, all three quartz sensors gave a signal.
We were, however, unable to calibrate the sensor by measuring the thickness of a deposited CH3NH3I film.
Therefore, an alternative process was used. Upon stabilization of the sensor reading the crucible containing the PbI2
was heated. Only at PbI2 evaporation temperatures in excess of 200 C were dark brown films obtained. The film
thickness of the perovskite film was monitored using quartz sensor nr 3 (at the height of the substrate holder).
Perovskite films were prepared at different PbI2 evaporation temperatures, increasing with 10 degrees from the
predetermined 200 C. In this way the optimum films were obtained at an evaporation temperature of the PbI2
crucible of 250 C. The PCBM layer was deposited using a chlorobenzene solution of 10 mg ml−1 in ambient
conditions using a meniscus coater and a coating speed of 10 mm/ second. The device was completed by the
thermal evaporation of the top metal electrode under a base pressure of 2 × 10−6 mbar to a thickness of 100nm. The
solar cells (active area of 0.12 cm2) were characterized inside the inert glovebox.
Characterization
GIXRD data were collected at room temperature in the 2θ range 5–50 º on an Empyrean PANalytical powder
diffractometer, using Cu Kα1 radiation. Typically four repeated measurements were collected and merged into a
single diffractogram. Pawley refinements2, were performed using the TOPAS computer program3 and revealed an
excellent fit to a one-phase model with a tetragonal cell (a = 8.80(2), c = 12.57(2) Å) and space group I4/mcm.
Additional peaks corresponding to the ITO substrate were also observed.
Scanning Electron Microscopy
Film thickness was investigated using a high-resolution scanning electron microscope (MERLIN, Zeiss) and
micrographs were acquired using an in-lens secondary electron detector. Prior to analysis, the sample was coated
with 12 nm carbon to minimize the charging effect.
Device characterization
Solar cells were illuminated by a white light halogen lamp in combination with interference filters for the EQE and
J-V measurements (MiniSun simulator by ECN the Netherlands). A black mask was used to limit the active area of
the device. Before each measurement, the exact light intensity was determined using a calibrated Si reference
diode. An estimation of the short-circuit current density (Jsc) under standard test conditions was calculated by
convolving the EQE spectrum with the AM1.5G reference spectrum, using the premise of a linear dependence of Jsc
on light intensity. Current-voltage (J-V) characteristics were measured using a Keithley 2400 source measure unit.
All characterization was done in a nitrogen filled glove box (<0.1 ppm O2 and <0.1 ppm H2O) without exposure to
ambient atmosphere.
2 | J. Name., 2012, 00, 1‐3
This journal is © The Royal Society of Chemistry 2012